NIST logo

Publications Portal

You searched on: Author: winnie wong-ng

Displaying records 151 to 154.
Resort by: Date / Title

151. The 1998 American Ceramic Society Annual Meeting--A Centennial Celebration
Published: Date unknown
Author: Winnie K Wong-Ng
Abstract: The 1998 annual meeting of the American Ceramics Society (ACerS) and exposition represented a unique milestone. It was the beginning of the centennial celebration and it was a once-in-a-lifetime experience for the ACerS members. This very special mee ...

152. The 1999 Materials Research Society (MRS) Fall Meeting
Published: Date unknown
Author: Winnie K Wong-Ng
Abstract: The 1999 Material Research Society Fall Meeting took place in Boston Copley Plaza from November 26 to December 3. This was the first time that MRS has used the spacious Hynes Convention Center as the primary meeting site, with the Marriott Hotel as ...

153. The 48th Annual Denver X-Ray Conference
Published: Date unknown
Author: Winnie K Wong-Ng
Abstract: The 48th Annual Denver X-ray Conference took place at Sheraton Steamboat Resort, Colorado, from August 2-6, 1999. This meeting was well attended, with a combined number of 650 conference attendees and exhibitors. It was supported by the Internation ...

154. Vapor Pressure and Thermal Stability of MgB^d2^ at 0.1 mPa Total Pressure
Published: Date unknown
Authors: Lawrence P. Cook, R Klein, Winnie K Wong-Ng
Abstract: The vapor pressure of Mg(g) over MgB^d2^(cr) for the reaction 2 MgB^d2^(cr) Mg(g)+MgB^d4^(cr) has been measured thermogravimetrically from 900 degrees celsius to 1100 degrees celsius at 0.1 mPa(1 atm) total pressure using a modified Knudsen effusion ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series