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You searched on: Author: dylan williams

Displaying records 11 to 20 of 171 records.
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11. A Prescription for Sub-Millimeter-Wave Transistor Characterization
Published: 7/1/2013
Authors: Dylan F Williams, Adam C. Young, Urteaga Miguel
Abstract: We present an approach for characterizing transistors embedded in microstrip lines formed on a thin bisbenzocyclobutene-based (BCB) monomers film at sub-millimeter-wave frequencies. We demonstrate the approach to 750 GHz and estimate the uncertainty ...

12. Calibration-Kit Design for Millimeter-Wave Silicon Integrated Circuits
Published: 7/1/2013
Authors: Dylan F Williams, Phillip Corson, Sharma Jahnavi, Krishnaswamy Harish, Tai Wei, George Zacharias, Ricketts David, Watson Paul, Dacquay Eric, Voinigescu Sorin
Abstract: We study and present design guidelines for thru-reflect-line vector-network-analyzer calibration kits used for characterizing circuits and transistors fabricated on silicon integrated circuits at millimeter-wave frequencies. We compare contact-pad d ...

13. The Impact of Characteristic Impedance on Waveform Calibrations
Published: 6/7/2013
Authors: Dylan F Williams, Jeffrey A Jargon, Paul D Hale
Abstract: We examine the impact of the characteristic impedance on mismatch corrections for temporal waveform calibrations based on high-speed electro-optic sampling measurements. We show that failing to measure and account for the characteristic impedance of ...

14. A Precision Millimeter-Wave Modulated-Signal Source
Published: 6/6/2013
Authors: Catherine A Remley, Paul D Hale, Dylan F Williams, Chih-Ming Wang
Abstract: We develop and characterize a modulated-signal source for use at millimeter-wave frequencies. Components within the source are phase locked by a 10 GHz reference source to minimize drift and improve synchronization. The complex frequency response of ...

15. Characterizing WR-8 Waveguide-to-CPW Probes Using Two Methods Implemented within the NIST Uncertainty Framework
Published: 11/30/2012
Authors: Jeffrey A Jargon, Uwe Arz, Dylan F Williams
Abstract: We individually characterize and provide uncertainties for a pair of WR-8 rectangular waveguide-to-coplanar waveguide (CPW) probes over a frequency range of 90 to 140 GHz utilizing two methods implemented within the NIST Microwave Uncertainty Framew ...

16. Sequential Estimation of Timebase Corrections for an Arbitrarily Long Waveform
Published: 10/1/2012
Authors: Chih-Ming Wang, Paul D Hale, Jeffrey A Jargon, Dylan F Williams, Catherine A Remley
Abstract: We present a procedure for correcting the timebase distortion and jitter of temporal waveforms of arbitrary lengths. This is achieved by estimating the timebase distortion and jitter sequentially with overlapping measurements and using the informatio ...

17. Legendre Fit to the Reflection Coefficient of a Radiating Rectangular Waveguide Aperture
Published: 8/1/2012
Authors: Dylan F Williams, Mohammad Tayeb Ghasr, Bradley K Alpert, Zhongxiang Shen, Alexander Arsenovic, Robert M Weikle, Reza Zoughi
Abstract: We accurately calculate the reflection coefficient and normalized admittance of radiating open-ended rectangular waveguides and fit our results with a linear combination of Legendre polynomials. We verify the expression to an accuracy of 0.005 with o ...

18. Traceability of high-speed electrical waveforms at NIST, NPL, and PTB
Published: 7/6/2012
Authors: Paul D Hale, Dylan F Williams, Andrew M Dienstfrey, Chih-Ming Wang, Jeffrey A Jargon, David Humphreys, Matthew Harper, Heiko Fuser, Mark Bieler
Abstract: Instruments for measuring high-speed waveforms typically require calibration to obtain accurate results. The national metrology institutes of the United States of America, the United Kingdom, and Germany offer measurement services based on electro-op ...

19. Verifying Traceability of Electronic Calibration Units Using the NIST Microwave Uncertainty Framework
Published: 6/22/2012
Authors: Jeffrey A Jargon, Dylan F Williams, Thomas M Wallis, Denis X. (Denis Xavier) LeGolvan, Paul D Hale
Abstract: We present a method for providing traceability to a commercial electronic calibration unit for vector network analyzers by characterizing its scattering parameters with repeated multiline thru-reflect-line (TRL) calibrations and utilizing the NIST Mi ...

20. A statistical study of de-embedding applied to eye diagram analysis
Published: 2/1/2012
Authors: Paul D Hale, Jeffrey A Jargon, Chih-Ming Wang, Brett Grossman, Matthew Claudius, Jose Torres, Andrew M Dienstfrey, Dylan F Williams
Abstract: We describe a stable method for calibrating digital waveforms and eye diagrams using the measurement system response function and its regularized inverse. The function describing the system response includes the response of the oscilloscope and any ...

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  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series