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You searched on: Author: dylan williams

Displaying records 11 to 20 of 180 records.
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11. Calibrations for Millimeter-Wave Silicon Transistor Characterization
Published: 3/1/2014
Authors: Dylan F Williams, Phillip Corson, Sharma Jahnavi, Krishnaswamy Harish, Wei Tai, George Zacharias, Ricketts David, Watson Paul, Dacquay Eric, Voinigescu Sorin
Abstract: This paper compares on-wafer thru-reflect-line (TRL) and off-wafer short-open-load-thru (SOLT) and line-reflect-reflect-match (LRRM) vector-network-analyzer probe-tip calibrations for amplifier characterization and parasitic-extraction calibrations f ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913926

12. Traveling Waves and Power Waves
Published: 11/15/2013
Author: Dylan F Williams
Abstract: N/A
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914053

13. Baseband Corrections for Precision Millimeter Wave Signal Measurements
Published: 8/12/2013
Authors: Catherine A Remley, Saeed Farsi, Dominique Schreurs, Dylan F Williams, Paul D Hale, Chih-Ming Wang
Abstract: NA
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914309

14. A Prescription for Sub-Millimeter-Wave Transistor Characterization
Published: 7/1/2013
Authors: Dylan F Williams, Adam C. Young, Urteaga Miguel
Abstract: We present an approach for characterizing transistors embedded in microstrip lines formed on a thin bisbenzocyclobutene-based (BCB) monomers film at sub-millimeter-wave frequencies. We demonstrate the approach to 750 GHz and estimate the uncertainty ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912595

15. Calibration-Kit Design for Millimeter-Wave Silicon Integrated Circuits
Published: 7/1/2013
Authors: Dylan F Williams, Phillip Corson, Sharma Jahnavi, Krishnaswamy Harish, Tai Wei, George Zacharias, Ricketts David, Watson Paul, Dacquay Eric, Voinigescu Sorin
Abstract: We study and present design guidelines for thru-reflect-line vector-network-analyzer calibration kits used for characterizing circuits and transistors fabricated on silicon integrated circuits at millimeter-wave frequencies. We compare contact-pad d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912973

16. The Impact of Characteristic Impedance on Waveform Calibrations
Published: 6/7/2013
Authors: Dylan F Williams, Jeffrey A Jargon, Paul D Hale
Abstract: We examine the impact of the characteristic impedance on mismatch corrections for temporal waveform calibrations based on high-speed electro-optic sampling measurements. We show that failing to measure and account for the characteristic impedance of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912864

17. Uncertainties in Complex Permittivity Extraction From Coplanar Waveguide Scattering-parameter Data
Published: 6/7/2013
Authors: Uwe Arz, Dylan F Williams
Abstract: We analyze the uncertainties of a complex permittivity extraction procedure based on uncorrected scatteringparameter measurements of coplanar waveguides of different lengths. The uncertainty calculations are performed with the Monte-Carlo method and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913672

18. A Precision Millimeter-Wave Modulated-Signal Source
Published: 6/6/2013
Authors: Catherine A Remley, Paul D Hale, Dylan F Williams, Chih-Ming Wang
Abstract: We develop and characterize a modulated-signal source for use at millimeter-wave frequencies. Components within the source are phase locked by a 10 GHz reference source to minimize drift and improve synchronization. The complex frequency response of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912855

19. Correction to ,Comparison of Sub-Millimeter-Wave Scattering-Parameter Calibrations with Imperfect Electrical PortsŠ [Jan 12 144-152]
Published: 3/31/2013
Author: Dylan F Williams
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912793

20. Correction to ,Comparison of Sub-Millimeter-Wave Scattering-Parameter Calibrations with Imperfect Electrical PortsŠ
Published: 3/7/2013
Author: Dylan F Williams
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911257



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  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
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