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Author: dylan williams

Displaying records 11 to 20 of 155 records.
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11. Comparison of Sub-Millimeter-Wave Scattering-Parameter Calibrations with Imperfect Electrical Ports
Published: 1/1/2012
Author: Dylan F Williams
Abstract: We develop a metric to quantify the accuracy with which measured scattering parameters can be cascaded. We use the metric to compare four rectangular-waveguide calibration strategies at sub-millimeter wavelengths that correct for electrical-port impe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909155

12. On-Chip Security Using Electromagnetic Analysis
Series: Grant/Contract Reports (NISTGCR)
Report Number: 687-12-71
Published: 10/27/2011
Authors: James Schaffner, Dylan F Williams
Abstract: In this report we describe a test bed designed to assess the vulnerabilities of security microcontrollers to electromagnetic monitoring, and use the test bed to show that it is indeed possible to gather more local information from electromagnetic mon ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910062

13. Use of Electronic Calibration Units for Vector-Network-Analyzer Verification
Published: 7/30/2010
Authors: Dylan F Williams, Arkadiusz C. (Arkadiusz) Lewandowski, Denis X LeGolvan, Ronald A Ginley, Chih-Ming Wang, Jolene D Splett
Abstract: We present measurements indicating that electronic calibration units are stable enough to be used in place of mechanical vector-network-analyzer verification artifacts. This enables a new fully automated approach to verifying microwave vector-network ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903470

14. Identifying RF Identification Cards from Measurements of Resonance and Carrier Harmonics
Published: 5/27/2010
Authors: Henry Romero, Catherine A Remley, Dylan F Williams, Chih-Ming Wang, Timothy X. Brown
Abstract: We show that careful measurements of the unloaded resonant frequency and quality factor of radio frequency identification proximity cards allow identification of different card models and, for the set of cards we studied, identification with mini ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904644

15. Electro-optic sampling for traceable high-speed electrical measurements
Published: 5/23/2010
Authors: Paul D Hale, Dylan F Williams
Abstract: We will describe how the complex frequency response of a high-speed photodiode is calibrated by use of electro-optic sampling. Our uncertainty analysis includes a unique covariance-matrix based method that allows us to transform uncertainties between ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905205

16. Measurement Bandwidth Extension Using Multisine Signals: Propagation of Error
Published: 2/6/2010
Authors: Catherine A Remley, Dominique Schreurs, M. Myslinski, Dylan F Williams
Abstract: We describe a post-processing technique that can extend the effective measurement bandwidth of narrowband vector receivers by phase aligning overlapping measurements. The method requires only knowledge of the desired phases of a periodic, multisine e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901524

17. Comparison of Large-Signal-Network-Analyzer Calibrations
Published: 2/5/2010
Authors: Dylan F Williams, Catherine A Remley, Joe Gering, Grand Aivazian
Abstract: We develop a procedure and metrics for comparing large-signal-network-analyzer calibrations. The metrics we develop provide a bound on differences between measurements obtained from large-signal-network-analyzer calibrations, as well as more specific ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900909

18. NISTeVerify: A fully electronic vector-network-analyzer verification system
Published: 10/1/2009
Authors: Dylan F Williams, Arkadiusz C. (Arkadiusz) Lewandowski, Denis X LeGolvan, Ronald A Ginley
Abstract: The National Institute of Standards and Technology (NIST) has just introduced a fully electronic measurement verification system for microwave vector-network-analyzer (VNA) calibrations called NISTeVerify. The system allows you to quickly verify VNA ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902084

19. Traceable waveform calibration with a covariance-based uncertainty analysis
Published: 10/1/2009
Authors: Paul D Hale, Dylan F Williams, Andrew M Dienstfrey, Arkadiusz C. (Arkadiusz) Lewandowski, Tracy S. Clement, Darryl A. Keenan
Abstract: We describe a method for calibrating the voltage that a step-like pulse generator produces at a load at every time point in themeasured waveform. The calibration includes an equivalent-circuit model of the generator that can be used to determine how ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33129

20. Novel nano-structured Metal-Semiconductor-Metal photodetector with high peak voltage
Published: 6/22/2009
Authors: Paul D Hale, Dylan F Williams, Tomoko Borsa, B. J. VanZeghbroeck
Abstract: A novel nano-structured metal-semiconductor-metal photodetector consisting of interdigitated metal fingers and nanodots is successfully fabricated on a semi-insulating GaAs substrate by electron beam lithography, and integrated with an on-chip ground ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901074



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Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
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  • SP 823-XX: Integrated Services Digital Network Series