You searched on: Author: dylan williams
Displaying records 11 to 20 of 157 records.
Resort by: Date / Title
11. Verifying Traceability of Electronic Calibration Units Using the NIST Microwave Uncertainty Framework
Jeffrey A Jargon, Dylan F Williams, Thomas M Wallis, Denis X LeGolvan, Paul D Hale
We present a method for providing traceability to a commercial electronic calibration unit for vector network analyzers by characterizing its scattering parameters with repeated multiline thru-reflect-line (TRL) calibrations and utilizing the NIST Mi ...
12. A statistical study of de-embedding applied to eye diagram analysis
Paul D Hale, Jeffrey A Jargon, Chih-Ming Wang, Brett Grossman, Matthew Claudius, Jose Torres, Andrew M Dienstfrey, Dylan F Williams
We describe a stable method for calibrating digital waveforms and eye diagrams using the measurement system response function and its regularized inverse. The function describing the system response includes the response of the oscilloscope and any ...
13. Comparison of Sub-Millimeter-Wave Scattering-Parameter Calibrations with Imperfect Electrical Ports
Dylan F Williams
We develop a metric to quantify the accuracy with which measured scattering parameters can be cascaded. We use the metric to compare four rectangular-waveguide calibration strategies at sub-millimeter wavelengths that correct for electrical-port impe ...
14. On-Chip Security Using Electromagnetic Analysis
Grant/Contract Reports (NISTGCR)
James Schaffner, Dylan F Williams
In this report we describe a test bed designed to assess the vulnerabilities of security microcontrollers to electromagnetic monitoring, and use the test bed to show that it is indeed possible to gather more local information from electromagnetic mon ...
15. Use of Electronic Calibration Units for Vector-Network-Analyzer Verification
Dylan F Williams, Arkadiusz C. (Arkadiusz) Lewandowski, Denis X LeGolvan, Ronald A Ginley, Chih-Ming Wang, Jolene D Splett
We present measurements indicating that electronic calibration units are stable enough to be used in place of mechanical vector-network-analyzer verification artifacts. This enables a new fully automated approach to verifying microwave vector-network ...
16. Identifying RF Identification Cards from Measurements of Resonance and Carrier Harmonics
Henry Romero, Catherine A Remley, Dylan F Williams, Chih-Ming Wang, Timothy X. Brown
We show that careful measurements of the unloaded
resonant frequency and quality factor of radio frequency
identification proximity cards allow identification of different
card models and, for the set of cards we studied, identification
with mini ...
17. Electro-optic sampling for traceable high-speed electrical measurements
Paul D Hale, Dylan F Williams
We will describe how the complex frequency response of a high-speed photodiode is calibrated by use of electro-optic sampling. Our uncertainty analysis includes a unique covariance-matrix based method that allows us to transform uncertainties between ...
18. Measurement Bandwidth Extension Using Multisine Signals: Propagation of Error
Catherine A Remley, Dominique Schreurs, M. Myslinski, Dylan F Williams
We describe a post-processing technique that can extend the effective measurement bandwidth of narrowband vector receivers by phase aligning overlapping measurements. The method requires only knowledge of the desired phases of a periodic, multisine e ...
19. Comparison of Large-Signal-Network-Analyzer Calibrations
Dylan F Williams, Catherine A Remley, Joe Gering, Grand Aivazian
We develop a procedure and metrics for comparing large-signal-network-analyzer calibrations. The metrics we develop provide a bound on differences between measurements obtained from large-signal-network-analyzer calibrations, as well as more specific ...
20. NISTeVerify: A fully electronic vector-network-analyzer verification system
Dylan F Williams, Arkadiusz C. (Arkadiusz) Lewandowski, Denis X LeGolvan, Ronald A Ginley
The National Institute of Standards and Technology (NIST) has just introduced a fully electronic measurement verification system for microwave vector-network-analyzer (VNA) calibrations called NISTeVerify. The system allows you to quickly verify VNA ...