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Author: scott wight
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1. A Micro-Gas Delivery System in the Environmental Scanning Electron Microscope for In-Situ Microhotplate Chemical Vapor Deposition
Published: Date unknown
Authors: Scott A Wight, Richard E Cavicchi, M J Nystrom
Abstract: A device has been developed for introducing small quantities of gas directly to the specimen in the environmental scanning electron microscope chamber. This micro-gas delivery system is a modification of the micro-injector that delivers gas directly ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830801

2. Analyzing a Co-Polymer Aramid Fiber for Use in Soft Body Armor
Published: 10/25/2013
Authors: Walter G McDonough, Jae Hyun Kim, Nathanael A Heckert, Amanda Lattam Forster, Scott A Wight, Joy P Dunkers, Gale Antrus Holmes
Abstract: Since the well-publicized failure of body armor used by a police officer, it has become imperative that the long-term properties and performance of new fibers being considered for use be understood. The range of interest is from the molecular proper ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914414

3. Beam Size in the Environmental Scanning Electron Microscopy: A Comparison of Model and Experimental Data
Published: 9/1/1998
Author: Scott A Wight
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903911

4. Better Visualization Inside the Environmental Scanning Electron Microscope Through the Infrared Chamberscope Coupled with a Mirror
Published: 12/1/1997
Author: Scott A Wight
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100379

5. Bevel Depth Profiling SIMS for Analysis of Layer Structures
Published: 9/1/2003
Authors: John G Gillen, Scott A Wight, P Chi, Albert J. Fahey, Jennifer R Verkouteren, Eric S Windsor, D. B. Fenner
Abstract: We are evaluating the use of bevel depth profiling Secondary Ion Mass Spectrometry (SIMS) for the characterization of layered semiconductor materials. In this procedure, a sub-degree angle bevel is cut into the analytical sample with an oxygen or ce ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831302

6. Characterization of Biomimetic Surfaces Formed from Cell Membranes
Published: 2/18/1997
Authors: N M. Rao, Anne L Plant, Vitalii Ivanovich Silin, Scott A Wight, S Hui
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901802

7. Characterization of Colloidal Material Fom Natural and Engineered Waters Investigating Structure-Function Relationships Through Microanalysis
Published: 2/1/2004
Authors: Richard D Holbrook, Scott A Wight, Dale E Newbury
Abstract: The fate, transport and ultimate impact of toxic compounds in aquatic systems is governed by their distribution between the particulate, colloidal and dissolved phases. Colloids, conventionally defined as solid material between 1 nm and 1 m in size, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831341

8. Characterization of High Explosive Particles Using Cluster Secondary Ion Mass Spectrometry
Published: 1/1/2006
Authors: John G Gillen, Scott A Wight, Christine M. Mahoney, Richard T. Lareau
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901035

9. Characterization of the Electron Beam Specimen Interaction in the ESEM with SIM Imaging
Published: 7/1/2000
Authors: Scott A Wight, John G Gillen, G B. Saupe
Abstract: A Secondary Ion Mass Spectrometry (SIMS) study has been undertaken to examine surfaces and films modified in the environmental scanning electron microscope (ESEM). Examination of the modifications induced by ESEM electrons and ions lead to a better ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830163

10. Copper Oxide Precipitates in NBS Standard Reference Material 482
Series: Journal of Research (NIST JRES)
Published: 12/1/2002
Authors: Eric S Windsor, R Carlton, John G Gillen, Scott A Wight, David S. Bright
Abstract: Copper oxide has been detected in the copper containing alloys of Standard Reference Material (SRM) 482. This occurrence is significant because it represents heterogeneity within a standard reference material that was certified to be homogeneous on ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831277



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