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1. Total Scattering Cross Section Measurements Using a Dual Faraday Cup with a 5 Micron Aperture
Published: 4/25/2012
Authors: Scott A Wight, Andrew Robert Konicek
Abstract: Scattering in the variable pressure scanning electron microscope (VPSEM) affects image resolution and the ability to perform quantitative chemical measurements. However, the manner in which the total scattering cross section varies as a function of g ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909004

2. The Effects of Folding on High Strength Fibers Used in Soft Body Armor
Published: 1/23/2012
Authors: Haruki Kobayashi, Walter G McDonough, Joy P Dunkers, Jae Hyun Kim, Hae-Jeong Lee, Scott A Wight, Amanda Lattam Forster, Kirk D Rice, Gale Antrus Holmes
Abstract: Poly (p-phenylene benzobisoxazole) (PBO) fibers have been used in soft body armor (SBA) because of their high mechanical strength. However, there was an unexpected failure of a first responder’s SBA which was composed of PBO fiber that was in service ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910065

3. Evaluation of the Shapes of Auger- and Secondary-Electron Linescans Across Interfaces With the Logistic Function
Published: 7/1/2006
Authors: Scott A Wight, Cedric John Powell
Abstract: We report on the use of the extended logistic function for fitting Auger-electron (AE) and secondary-electron (SE) linescans. Such fits provide convenient and objective measures of parameters describing the interface width and possible asymmetry of a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831408

4. Characterization of High Explosive Particles Using Cluster Secondary Ion Mass Spectrometry
Published: 1/1/2006
Authors: John G Gillen, Scott A Wight, Christine M. Mahoney, Richard T. Lareau
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901035

5. Direct Preparation of Particles From Liquid Suspension for ESEM or SEM Analysis
Published: 10/1/2005
Authors: Scott A Wight, Richard D Holbrook
Abstract: A simplified method for the preparation of particles from liquid suspensions has been developed. Particles are deposited directly on carbon planchets for rapid analysis by environmental scanning electron microscopy or by conventional scanning electr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831362

6. High Spatial Resolution Quantitative Electron Beam Microanalysis for Nanoscale Materials
Published: 3/21/2005
Authors: Dale E Newbury, J H J Scott, Scott A Wight, J T. Armstrong, John A Small
Abstract: Transmission (TEM) and scanning electron microscopes (SEM) provide ideal platforms for electron and x-ray spectrometry to characterize nanoscale particles and nanostructured bulk materials. Electron spectrometry includes electron energy loss spectro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831323

7. Characterization of Colloidal Material Fom Natural and Engineered Waters Investigating Structure-Function Relationships Through Microanalysis
Published: 2/1/2004
Authors: Richard D Holbrook, Scott A Wight, Dale E Newbury
Abstract: The fate, transport and ultimate impact of toxic compounds in aquatic systems is governed by their distribution between the particulate, colloidal and dissolved phases. Colloids, conventionally defined as solid material between 1 nm and 1 m in size, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831341

8. Bevel Depth Profiling SIMS for Analysis of Layer Structures
Published: 9/1/2003
Authors: John G Gillen, Scott A Wight, P Chi, Albert J. Fahey, Jennifer R Verkouteren, Eric S Windsor, D. B. Fenner
Abstract: We are evaluating the use of bevel depth profiling Secondary Ion Mass Spectrometry (SIMS) for the characterization of layered semiconductor materials. In this procedure, a sub-degree angle bevel is cut into the analytical sample with an oxygen or ce ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831302

9. Optimizing Thermal-Optical Methods for Measuring Atmospheric Elemental (Black) Carbon: A Response Surface Study
Published: 9/1/2003
Authors: Joseph M Conny, D Klinedinst, Scott A Wight, J L Paulsen
Abstract: The chemical, physical, and morphological complexity of atmospheric aerosol black carbon (BC) presents major problems in measurement accuracy. Methods based on thermal-optical analysis (TOA) are widely used for ambient air samples because no prior kn ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831274

10. Copper Oxide Precipitates in NBS Standard Reference Material 482
Series: Journal of Research (NIST JRES)
Published: 12/1/2002
Authors: Eric S Windsor, R Carlton, John G Gillen, Scott A Wight, David S. Bright
Abstract: Copper oxide has been detected in the copper containing alloys of Standard Reference Material (SRM) 482. This occurrence is significant because it represents heterogeneity within a standard reference material that was certified to be homogeneous on ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831277