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Author: chih-ming wang

Displaying records 31 to 40 of 65 records.
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31. Propagation of uncertainties in measurements using generalized influence
Published: 1/1/2005
Authors: Hariharan K. (Hariharan K.) Iyer, Chih-Ming Wang
Abstract: The ISO Guide to the Expression of Uncertainty in Measurement (GUM) recommends the use of a first- order Taylor series expansion for propagating errors and uncertainties. The GUM also permits the use of "other analytical or numerical methods" when th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=130035

32. Models and Confidence Intervals for True Values in Interlaboratory Trials
Published: 12/6/2004
Authors: Hariharan K. (Hariharan K.) Iyer, Chih-Ming Wang, T Mathew
Abstract: We consider the one-way random effects model with unequal sample sizes and heterogeneous variances. Using the method of generalized confidence intervals, we develop a new confidence interval procedure for the mean. Additionally, we investigate two ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=51088

33. Consistency Tests for Key Comparison Data
Published: 5/1/2004
Authors: Dominic F. (Dominic F.) Vecchia, Chih-Ming Wang
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=150569

34. An Optimal Vector-Network-Analyzer Calibration Algorithm
Published: 12/1/2003
Authors: Dylan F Williams, Chih-Ming Wang, Uwe Arz
Abstract: We present an iterative algorithm for calibrating vector network analyzers based on orthogonal distance regression. The algorithm features a robust, yet efficient, search algorithm, a complete error analysis that includes both random and systematic e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31321

35. Adaptive Characterization of Jitter Noise in Sampled High-Speed Signals
Published: 10/1/2003
Authors: Kevin J Coakley, Chih-Ming Wang, Paul D Hale, Tracy S. Clement
Abstract: We estimate the root-mean-square (RMS) value of timing jitter noise in simulated signals similar to measured high-speed sampled signals. The simulated signals are contaminated by additive noise, timing jitter noise, and time shift errors. Before e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=51084

36. The NIST Traceable Reference Material Program for Wavelength Reference Absorption Cells
Series: Special Publication (NIST SP)
Published: 8/1/2003
Authors: Timothy J Drapela, Sarah L. Gilbert, William C Swann, Chih-Ming Wang
Abstract: A program is described by which commercially produced wavelength-calibration gas-absorption cells may be related to primary standards maintained by the National Institute of Standards and Technology (NIST) and Standard Reference Materials produced by ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30769

37. A Statistical Model for Cladding Diameter of Optical Fibers
Published: 4/1/2003
Authors: Chih-Ming Wang, Timothy J Drapela
Abstract: The National Institute of Standards and Technology has developed a contact micrometer for accurate measurement of optical-fiber outer diameter. The contact micrometer is used to measure reference fibers which are artifacts used by the telecommunicat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151779

38. Interlaboratory Comparison of Magnetic Thin Film Measurements
Series: Journal of Research (NIST JRES)
Report Number: of
Published: 4/1/2003
Authors: F C Da silva, Chih-Ming Wang, D P Pappas
Abstract: A potential low magnetic moment standard reference material (SRM) was studied in an interlaboratory comparison. The mean and the standard deviation of the saturation moment m/s, the remanent moment m/^ur^, and the intrinsic coercivity H/c of nine sa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50794

39. Accuracy of AlGaAs Rates and Composition Determination Using RHEED Oscillations
Published: 9/1/2002
Authors: Todd E Harvey, Kristine A Bertness, Chih-Ming Wang, Jolene D Splett
Abstract: Reflection high-energy electron diffraction (RHEED) oscillations are widely used in molecular beam epitaxy (MBE) as a technique to calibrate material growth rates. The growth rates are used to predict the composition of the following growth run. For ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30092

40. Effects of Noise Level in Fitting In-Situ Optical Reflectance Spectroscopy Data
Published: 9/1/2002
Authors: Chih-chiang Fu, Kristine A Bertness, Chih-Ming Wang
Abstract: We discuss the combination of noise level and scaling factor accuracy needed in optical reflectance spectroscopy data in order to obtain accurate parameters by fitting simulated Optical Reflectance Spectroscopy data curves with different noise level.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30077



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