NIST logo

Publications Portal

You searched on:
Author: william wallace

Displaying records 91 to 95.
Resort by: Date / Title


91. Polymeric Silsesquioxanes: Measuring the Degree of Intramolecular Condensation
Published: 1/1/1999
Authors: William E Wallace III, Charles Martin Guttman, Joseph M Antonucci
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853724

92. Spin-on-Glass Thin Films Prepared From a Novel Polysilsesquioxane by Thermal and Ultraviolet-Irradiation Methods
Published: 1/1/1999
Authors: Q Pan, G B Gonzalez, R J Composto, William E Wallace III, B Arkles, L K Figge, D H Berry
Abstract: The pyrolytic and photolytic conversion of a new polymer precursor, namely -chloroethyl-silsesquioxane (BCESSQ), to an ormosil film is presented. At 350 C the film thickness rapidly decays to 55% of its original thickness within 60 min. A range of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851493

93. Molecular Structure of Silsesquioxanes Determined by Matrix-Assisted Laser Desorption/Ionization Time-of-Flight Mass Spectrometry
Published: 11/1/1998
Authors: William E Wallace III, Charles Martin Guttman, Joseph M Antonucci
Abstract: Matrix-assisted laser desorption/ionization time-of-flight mass spectrometry was used to deduce the three-dimensional structure of a complex silsesquioxane polymer. Four distinct levels of structure were observed in the mass spectrum. The overall ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851481

94. Characterization of Planarity of Polymer Thin Films on Rough Surfaces
Published: 7/1/1998
Authors: Wen-Li Wu, William E Wallace III
Abstract: Angle-dependent total reflection x-ray fluorescence (TRXF) is used to characterize the surface roughness or the extent of planarization of a thin polymer coating on a stainless steel surface with significant roughness. The objective of this work is ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851479

95. Stochastic Regression Modeling of Chemical Spectra
Published: Date unknown
Authors: Anthony J Kearsley, William E Wallace III, Yutheeka Gadhyan
Abstract: A stochastic regression method has been developed that decomposes chemical spectra into separate contributions from signal and from noise. The numerical results of regressing in this way on sample spectra are presented. The results suggest that this ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915073



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series