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Author: william wallace iii
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1. Resonant Soft X-Ray Photofragmentation of Propane
Published: 7/1/2003
Authors: William E Wallace III, Daniel A Fischer
Abstract: A comparison was made between the mass spectra of propane (CH6d3^CH^d2^CH^d3^) for resonant soft X-ray photofragmentation and electron-impact ionization. The soft X-ray photon energy was tuned to 287.7 eV to promote Auger relaxations from the C-H bo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852055

2. 2,5-Dihydroxybenzoic Acid: Laser Desorption/Ionisation as a Function of Elevated Temperature
Published: 3/1/2005
Authors: William E Wallace III, Mark Arnould, R Knochenmuss
Abstract: The temperature dependence of laser desorption/ionization (LDI) ion yields has been measured for 2,5-dihydroxybenzoic acid (2,5-DHB) single crystals from room temperature to 160 C using time-of-flight mass spectrometry. A steep rise in ion producti ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852380

3. 2,5-Dihydroxybenzoic Acid: Laser Desorption/Ionization as a Function of Elevated Temperature
Published: 9/11/2008
Authors: William E Wallace III, Mark Arnould, R Knochenmuss
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854007

4. A Direct Comparison of Surface and Bulk Chain-Relaxation in Polystyrene
Published: 9/1/2003
Authors: Wen-Li Wu, S Sambasivan, C M Wang, William E Wallace III, Jan Genzer, Daniel A Fischer
Abstract: Near-edge x-ray absorption fine structure (NEXAFS) spectroscopy was used to meausre simultaneously the relaxation rates of polystyrene (PS) molecules at the free surface and in the bulk. The samples were uniaxially stretched and annealed at temperatu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852179

5. A General Method for the Quantitative Measurement of Molecular Mass Distribution by Mass Spectrometry
Published: 9/1/2009
Authors: Eun S. Park, William E Wallace III, Charles Martin Guttman, Kathleen M. Flynn, Mickey Richardson, Gale Antrus Holmes
Abstract: A method is presented to test whether the conversion of the mass spectrum of a polydisperse analyte to its molecular mass distribution is quantitative. Mixtures of samples with different average molecular masses, coupled with a Taylor's expansio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902189

6. A Numerical Method for Mass Spectral Data Analysis
Published: 1/31/2005
Authors: Anthony J Kearsley, William E Wallace III, Charles Martin Guttman, Javier Bernal
Abstract: The new generation of mass spectrometers produces an astonishing amount of high-quality data in a brief period of time leading to inevitable data analysis bottlenecks. Automated data analysis algorithms are required for rapid and repeatable processin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=150869

7. A Report on the Certification of an Absolute Molecular Mass Distribution Polymer Standard: Standard Reference Material 2881
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7512
Published: 9/11/2008
Authors: Charles Martin Guttman, Kathleen M. Flynn, William E Wallace III, Anthony J Kearsley
Abstract: The certification of an absolute molecular mass distribution polymer Standard Reference Material, SRM 2881, is described. SRM 2881 is an n octyl initiated, proton terminated, narrow polydispersity, low mass, atactic polystyrene. The absolute molecul ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854031

8. Absolute Molecular Orientational Distribution of the Polystyrene Surface
Published: 4/1/2001
Authors: Kimberly A Briggman, John C. Stephenson, William E Wallace III, Lee J Richter
Abstract: Vibrationally-resonant sum frequency generation (VR-SFG) has been used to study the absolute molecular orientational distribution of the pendant phenyl groups at the free surface of polystyrene (PS) thin films on oxidized Si substrates. Characteriza ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841486

9. Abstracts for the MSEL Assessment Panel, March 2001
Published: 1/26/2001
Authors: Leslie E Smith, Alamgir Karim, Leonid A Bendersky, C Lu, J J Scott, Ichiro Takeuchi, Kathleen M. Flynn, Vinod K Tewary, Davor Balzar, G A Alers, Stephen E Russek, Charles C. Dr. Han, Haonan Wang, William E Wallace III, Daniel A Fischer, K Efimenko, Wen-Li Wu, Jan Genzer, Joseph C Woicik, Thomas H. Gnaeupel-Herold, Henry Joseph Prask, Charles F Majkrzak, Norman Frederic Berk, John G Barker, Charles J. Glinka, Eric K Lin, Ward L Johnson, Paul R Heyliger, David Thomas Read, R R Keller, J Blendell, Grady S White, Lin-Sien H Lum, Eric J Cockayne, Igor Levin, C E Johnson, Maureen E Williams, Gery R Stafford, William J Boettinger, Kil Won Moon, Daniel Josell, Daniel Wheeler, Thomas P Moffat, W H Huber, Lee J Richter, Clayton S. Yang, Robert D Shull, R A. Fry, Robert D McMichael, William F. Egelhoff Jr., Ursula R Kattner, James A Warren, Jonathan E Guyer, Steven P Mates, Stephen D Ridder, Frank S. Biancaniello, D Basak, Jon C Geist, Kalman D Migler
Abstract: Abstracts relating to research and development in the NIST Materials Science and Engineering Laboratory (MSEL) are presented for a poster session to be presented to the 2001 MSEL Assessment Panel.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850052

10. Advanced Numerical Methods for Polymer Mass Spectral Data Analysis
Published: 7/1/2002
Authors: William E Wallace III, Charles Martin Guttman, Anthony J Kearsley, Javier Bernal
Abstract: A mathematical algorithm is presented that accurately locates and calculates the area beneath peaks using only reproducible mathematical operations and a single user-selected sensitivity parameter.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852045



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