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Author: william wallace iii

Displaying records 71 to 80 of 94 records.
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71. Mass Spectrometry of Spin-On-Glass Low-K Dielectric Precursors
Published: 4/1/2001
Authors: William E Wallace III, Kathleen M. Flynn, Joseph M Antonucci
Abstract: The degree-of-intramolecular-condensation, defined as the number of residual silanol (SiOH) groups per oligomer, for a variety of silsesquioxane polymers was measured by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry. R ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851802

72. NIST-Sponsored Interlaboratory Comparison of Polystyrene Molecular Mass Distribution Obtained by Matrix-Assisted Laser Desorption/Ionization Time-of-Flight Mass Spectrometry: Statistical Analysis
Published: 3/1/2001
Authors: Charles Martin Guttman, S Wetzel, William R. Blair, B M Fanconi, Kathleen M. Flynn, R J Goldschmidt, William E Wallace III, David Lloyd VanderHart
Abstract: Matrix-assisted laser desorption/ionization time of flight mass spectrometry (MALDI-TOF-MS) is becoming a new and important technique in synthetic polymer characterization. Yet much is still unknown about the molecular mass distribution (MWD) which ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851614

73. Abstracts for the MSEL Assessment Panel, March 2001
Published: 1/26/2001
Authors: Leslie E Smith, Alamgir Karim, Leonid A Bendersky, C Lu, J J Scott, Ichiro Takeuchi, Kathleen M. Flynn, Vinod K Tewary, Davor Balzar, G A Alers, Stephen E Russek, Charles C. Dr. Han, Haonan Wang, William E Wallace III, Daniel A Fischer, K Efimenko, Wen-Li Wu, Jan Genzer, Joseph C Woicik, Thomas H Gnaeupel-Herold, Henry Joseph Prask, Charles F Majkrzak, Norman Frederic Berk, John G Barker, Charles J. Glinka, Eric K Lin, Ward L Johnson, Paul R Heyliger, David Thomas Read, R R Keller, J Blendell, Grady S White, Lin-Sien H Lum, Eric J Cockayne, Igor Levin, C E Johnson, Maureen E Williams, Gery R Stafford, William J Boettinger, Kil Won Moon, Daniel Josell, Daniel Wheeler, Thomas P Moffat, W H Huber, Lee J Richter, Clayton S. Yang, Robert D Shull, R A. Fry, Robert D McMichael, William F. Egelhoff Jr., Ursula R Kattner, James A Warren, Jonathan E Guyer, Steven P Mates, Stephen D Ridder, Frank S. Biancaniello, D Basak, Jon C Geist, Kalman D Migler
Abstract: Abstracts relating to research and development in the NIST Materials Science and Engineering Laboratory (MSEL) are presented for a poster session to be presented to the 2001 MSEL Assessment Panel.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850052

74. Covalent Cationization Method for the Analysis of Polyethylene by Mass Spectrometry
Published: 1/1/2001
Authors: Barry J. Bauer, William E Wallace III, B M Fanconi, Charles Martin Guttman
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853745

75. Electrospray FTMS and MALDI TOF MS Characterization of [(O3/2SiMe)x(OSi(OH)Me)y(OSiMe2)z] Silsesquioxane Resin
Published: 1/1/2001
Authors: R E Tecklenburg, H Chen, William E Wallace III
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853797

76. Mass Spectroscopy of Spin-on-glass Low-k Dielectric Precursors
Published: 1/1/2001
Authors: William E Wallace III, Charles Martin Guttman, Joseph M Antonucci
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853800

77. Surface Analysis Studies of Yield Enhancements in Secondary Ion Mass Spectrometry by Polyatomic Projectiles
Published: 1/1/2001
Authors: E Fuoco, G Gillen, M B Wijesundara, William E Wallace III, L Hanley
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853757

78. Wafer Level Underfill: Experiments and Modeling.
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6731
Published: 1/1/2001
Authors: Daniel Josell, William E Wallace III, Daniel Wheeler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853766

79. Thermal Expansion Coefficients of Low-K Dielectric Films From Fourier Analysis of X-Ray Reflectivity
Published: 7/1/2000
Authors: Charles E. Bouldin, William E Wallace III, G W Lynn, S C Roth, Wen-Li Wu
Abstract: We determine the thermal expansion coefficient of a fluorinated poly (arylene ether) low-k dielectric film using Fourier analysis of x-ray reflectivity data. The approach is similar to that used in Fourier analysis of x-ray absorption fine structure. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850326

80. Determination of the Molecular Mass Distribution of Narrow Polydispersity Polystyrene by MALDI-TOF-MS: Interlaboratory Comparison
Published: 3/1/2000
Authors: Kathleen M. Flynn, S Wetzel, William E Wallace III, William R. Blair, R J Goldschmidt, David Lloyd VanderHart, B M Fanconi
Abstract: NIST has sponsored a matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF-MS) interlaboratory comparison using a well-characterized polystyrene to determine the reproducibility in determining the molecular mass dis ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851652



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