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Author: william wallace iii

Displaying records 61 to 70 of 95 records.
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61. Prediction of Lateral and Normal Force-Displacement Curves for Flipchip Solder Joints
Published: 1/1/2002
Authors: Daniel Wheeler, Daniel Josell, James A Warren, William E Wallace III
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853873

62. Convalent Cationization Method for the Analysis of Polyethylene by Mass Spectrometry
Published: 12/1/2001
Authors: Barry J. Bauer, William E Wallace III, B M Fanconi, Kathleen M. Flynn
Abstract: Polyethylene and other polyolefins have not been amenable to mass spectrometric characterization of molecular mass distribution due to the ineffectiveness of conventional methods of cationization. The lack of polar groups, unsaturation, and aromatic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851911

63. Characterization of a [(O3/2SiMe)(x)(Osi(OH)Me)(y) (OSiMe2)z] silsesquioxane copolymer resin by mass spectrometry
Published: 11/1/2001
Authors: R E Tecklenburg, William E Wallace III, H Chen
Abstract: Silsesquioxanes or three-dimensional organosilicon resins, continue to generate much interest due to their unique structures and physical properties. Methyl silsesquioxanes can be formed at room temperature by simple acid catalyzed hydrolysis and co ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851943

64. Characterization of a [(O^d3/2^SiMe)^dx^(OSi(OH)Me)^dy^(OSiMe^d2^)z] Silsesquioxane Copolymer Resin by Mass Spectrometry
Published: 11/1/2001
Authors: R E Tecklenburg, William E Wallace III, H Chen
Abstract: Electrospray ionization Fourier transform ion cyclotron resonance (ESI FTICR) mass spectrometry and matrix-assisted laser desorption/ionization time-of-flight (MALDI-TOF) mass spectrometry were applied to a complex silsesquioxane-siloxane copolymer r ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851945

65. Laser Desorption Ionization and MALDI Time-of-Flight Mass Spectrometry for Low Molecular Mass Polyethylene Analysis
Published: 11/1/2001
Authors: R Chen, T Yalcin, William E Wallace III, Charles Martin Guttman, L Li
Abstract: Polyethylene's inert nature and difficulty to dissolve in conventional solvents at room temperature present special problems for sample preparation and ionization in mass spectrometric analysis. We present a study of ionization behavior of several p ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851927

66. Prediction of Lateral and Normal Force-Displacement Curves for Flipchip Solder Joints
Published: 9/1/2001
Authors: Daniel Wheeler, Daniel Josell, James A Warren, William E Wallace III
Abstract: We present the results of experiments and modeling of flip-chip geometry solder joint shapes under shear loading. Modeling, using Surface Evolver, included development of techniques that use an applied vector force (normal and shear loading) as inpu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853056

67. Polymer Chain Relaxation: Surface Outpaces Bulk
Published: 7/1/2001
Authors: William E Wallace III, Daniel A Fischer, K Efimenko, Wen-Li Wu, Jan Genzer
Abstract: In this work we show how carbon near-edge X-ray absorption fine structure (NEXAFS) can be applied to detect both surface and bulk segmental relaxation in uniaxially deformed polystyrene samples. We demonstrate that by simultaneously monitoring the p ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851810

68. MALDI MS of Saturated Hydrocarbon Polymers: Polyethylene and Other Polyolefins
Published: 5/1/2001
Authors: William E Wallace III, Charles Martin Guttman, B M Fanconi, Barry J. Bauer
Abstract: Saturated hydrocarbon polymers, polyethylene and polypropylene, are, by production volume, the most widely used of all synthetic polymers. Their molecular mass and molecular mass distribution (MMD) are critical in determining performance properties. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851879

69. Surface Analysis Studies of Yield Enhancements in Secondary Ion Mass Spectrometry by Polyatomic Projectiles
Published: 5/1/2001
Authors: E Fuoco, John G Gillen, M Wijesundara, William E Wallace III, L Hanley
Abstract: In this paper examine the mechanism of secondary ion yield enhancements previously observed for polyatomic projectiles by measuring the weight loss, volume loss, and surface composition of poly(methylmethacrylate) (PMMA) films sputtered by keV SF^d5^ ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831207

70. Molecular Order at Polymer Interfaces Measured by Broad-Bandwidth Vibrationally Resolved Sum Frequency Generation Spectroscopy
Published: 4/23/2001
Authors: P T. Wilson, Kimberly A Briggman, John C. Stephenson, William E Wallace III, Lee J Richter
Abstract: Broad-bandwidth vibrationally-resolved sum frequency generation spectroscopy has been used to measure the molecular orientation distribution at polystyrene/dielectric interfaces. A novel microcavity structure allows isolation of the free or buried i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831222



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