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Author: william wallace iii
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91. Spin-on-Glass Thin Films Prepared From a Novel Polysilsesquioxane by Thermal and Ultraviolet-Irradiation Methods
Q Pan, G B Gonzalez, R J Composto, William E Wallace III, B Arkles, L K Figge, D H Berry
The pyrolytic and photolytic conversion of a new polymer precursor, namely -chloroethyl-silsesquioxane (BCESSQ), to an ormosil film is presented. At 350 C the film thickness rapidly decays to 55% of its original thickness within 60 min. A range of ...
92. Molecular Structure of Silsesquioxanes Determined by Matrix-Assisted Laser Desorption/Ionization Time-of-Flight Mass Spectrometry
William E Wallace III, Charles Martin Guttman, Joseph M Antonucci
Matrix-assisted laser desorption/ionization time-of-flight mass spectrometry was used to deduce the three-dimensional structure of a complex silsesquioxane polymer. Four distinct levels of structure were observed in the mass spectrum. The overall ...
93. Characterization of Planarity of Polymer Thin Films on Rough Surfaces
Wen-Li Wu, William E Wallace III
Angle-dependent total reflection x-ray fluorescence (TRXF) is used to characterize the surface roughness or the extent of planarization of a thin polymer coating on a stainless steel surface with significant roughness. The objective of this work is ...
94. Stochastic Regression Modeling of Chemical Spectra
Anthony J Kearsley, William E Wallace III, Yutheeka Gadhyan
A stochastic regression method has been developed that decomposes chemical spectra into separate contributions from signal and from noise. The numerical results of regressing in this way on sample spectra are presented. The results suggest that this ...