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Author: william wallace iii

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91. Polymeric Materials Interest Group Workshop: Quantitative Determination of Synthetic Polymer Molecular Mass Distribution
Published: 1/1/1999
Author: William E Wallace III
Abstract: Preliminary report on the NIST molecular mass distribution interlaboratory comparison.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851604

92. Polymeric Silsesquioxanes: Measuring the Degree of Intramolecular Condensation
Published: 1/1/1999
Authors: William E Wallace III, Charles Martin Guttman, Joseph M Antonucci
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853724

93. Spin-on-Glass Thin Films Prepared From a Novel Polysilsesquioxane by Thermal and Ultraviolet-Irradiation Methods
Published: 1/1/1999
Authors: Q Pan, G B Gonzalez, R J Composto, William E Wallace III, B Arkles, L K Figge, D H Berry
Abstract: The pyrolytic and photolytic conversion of a new polymer precursor, namely -chloroethyl-silsesquioxane (BCESSQ), to an ormosil film is presented. At 350 C the film thickness rapidly decays to 55% of its original thickness within 60 min. A range of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851493

94. Molecular Structure of Silsesquioxanes Determined by Matrix-Assisted Laser Desorption/Ionization Time-of-Flight Mass Spectrometry
Published: 11/1/1998
Authors: William E Wallace III, Charles Martin Guttman, Joseph M Antonucci
Abstract: Matrix-assisted laser desorption/ionization time-of-flight mass spectrometry was used to deduce the three-dimensional structure of a complex silsesquioxane polymer. Four distinct levels of structure were observed in the mass spectrum. The overall ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851481

95. Characterization of Planarity of Polymer Thin Films on Rough Surfaces
Published: 7/1/1998
Authors: Wen-Li Wu, William E Wallace III
Abstract: Angle-dependent total reflection x-ray fluorescence (TRXF) is used to characterize the surface roughness or the extent of planarization of a thin polymer coating on a stainless steel surface with significant roughness. The objective of this work is ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851479



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