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Author: theodore vorburger
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Displaying records 1 to 10 of 202 records.
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1. 2D and 3D Surface Texture Comparisons Using Autocorrelation Functions
Published: 1/1/2005
Authors: Jun-Feng Song, Li Ma, Eric Paul Whitenton, Theodore Vincent Vorburger
Abstract: Autocorrelation and cross-correlation functions are proposed for 2D and 3D surface texture comparisons. At the maximum correlaton point of the two correlated surface textrues, there is a peak shown at the cross-correaltion curve. It is proposed to ge ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822017

2. 2D and 3D Surface Texture Comparisons Using Autocorrelation Functions
Published: 1/1/2005
Authors: Jun-Feng Song, Li Ma, Eric Paul Whitenton, Theodore Vincent Vorburger
Abstract: Autocorrelation and cross-correlation functions are proposed for 2D and 3D surface texture comparisons. At the maximum correlation point of the two correlated surface textures, there is a peak shown at the cross-correlation curve. It is proposed to g ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901999

3. 2nd Annual Tri-National Workshop on Standards for Nanotechnology - (NIST presentations)
Published: 12/10/2008
Authors: Ronald G Dixson, Jon Robert Pratt, Vincent A Hackley, James Edward Potzick, Richard A Allen, Ndubuisi George Orji, Michael T Postek, Herbert S Bennett, Theodore Vincent Vorburger, Jeffrey A Fagan, Robert L. Watters
Abstract: A new era of cooperation between North American National Measurement Institutes (NMIs) was ushered by the National Research Council of Canada Institute for National Measurement Standards (NRC-INMS) on February 7, 2007 when the first Tri-National wo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824641

4. 3D Image Correction of Tilted Sample Through Coordinate Transformation
Published: 1/1/2007
Authors: Wei Chu, Joseph Fu, Ronald G Dixson, Theodore Vincent Vorburger
Abstract: In scanned probe measurements of micrometer- or nanometer-scale lines, it is nearly impossible to maintain the sample in a perfectly level position, and even a small amount of tilt angle can contribute to the accuracy of the result of measurand such ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823244

5. A Calibrated Atomic Force Microscope
Published: 1/1/1994
Authors: T Mcwaid, J Schneir, Theodore Vincent Vorburger
Abstract: Abstract not available.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901971

6. A Characterization of Probe Dynamic Behaviors in Critical Dimension Atomic Force Microscopy
Published: 3/17/2008
Authors: Shaw C Feng, Che B. Joung, Theodore Vincent Vorburger
Abstract: Critical Dimension (CD) Atomic Force Microscopy (AFM) is a primary means to measure the geometric shapes of walls and trenches on the nanometer scale in laboratories supporting the electronic industry. However, with CD-AFM, it is difficult to predict ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824625

7. A Fast Algorithm for Determining the Gaussian Filter Mean Line in Surface Metrology
Published: 1/1/2000
Authors: Y B Yuan, X F Qiang, Jun-Feng Song, Theodore Vincent Vorburger
Abstract: A fast algorithm for assessing the Gaussian filtered mean line was deduced using the central limit theorem and an approximation method. This algorithm only uses simple computer operations such as addition, subtraction and digit shifting, and avoids ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823110

8. A Fast Algorithm for Determining the Gaussian Filtered Mean Line in Surface Metrology
Published: 1/1/2000
Authors: Y B Yuan, X F Qiang, Jun-Feng Song, Theodore Vincent Vorburger
Abstract: A fast algorithm for assessing the Gaussian filtered mean line was deduced using the central limit theorem and an approximation method. This algorithm only uses simple computer operations such as addition, subtraction and digit shifting, and avoids c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820993

9. A First Step Toward Photorealistic Rendering of Coated Surfaces and Computer-Based Standards of Appearance
Published: 1/1/2001
Authors: Fern Y Hunt, Egon Marx, G Meyer, Theodore Vincent Vorburger, P Walker, H Westlund
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821772

10. A First Step Towards Photorealistic Rendering of Coated Surfaces and Computer Based Standards of Appearance
Published: 1/1/2001
Authors: Fern Y Hunt, Egon Marx, G Meyer, Theodore Vincent Vorburger, P Walker, H Westlund
Abstract: We seek to explore the feasibility of producing computer graphic images to visualize the color and gloss of surfaces using optical and surface topographical data.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822453



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