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Author: theodore vorburger

Displaying records 31 to 40 of 196 records.
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31. OPTIMIZING GAUSSIAN FILTER LONG WAVELENGTH CUTOFF »c FOR IMPROVING 3D BALLISTICS SIGNATURE CORRELATIONS
Published: 10/19/2008
Authors: Jun-Feng Song, Li Ma, Theodore Vincent Vorburger, Susan M Ballou
Abstract: In the ballistics measurements and correlations, optimum selection of c has particular importance for an unambiguous extraction of Individual Characteristics from the Class Characteristics . Poorly selected c might result in the Class Character ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824686

32. Characterization of Probe Dynamic Behaviors in Critical Dimension Atomic Force Microscopy
Published: 10/15/2008
Authors: Shaw C Feng, Che B. Joung, Theodore Vincent Vorburger
Abstract: Critical Dimension Atomic Force Microscopy (CD-AFM) is a primary means to measure the geometric shapes of walls and trenches on the nanometer scale in laboratories supporting the electronic industry. As the widths of commercially available CD-AFM pro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824690

33. Topography Measurements for Determining the Decay Factors in Surface Replication
Published: 7/4/2008
Authors: Jun-Feng Song, P Rubert, Xiaoyu A Zheng, Theodore Vincent Vorburger
Abstract: The electro-forming technique is used at National Institute of Standards and Technology (NIST) for the production of standard reference material (SRM) 2461 standard casings to support nationwide ballistics measurement traceability and measurement q ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823226

34. A Characterization of Probe Dynamic Behaviors in Critical Dimension Atomic Force Microscopy
Published: 3/17/2008
Authors: Shaw C Feng, Che B. Joung, Theodore Vincent Vorburger
Abstract: Critical Dimension (CD) Atomic Force Microscopy (AFM) is a primary means to measure the geometric shapes of walls and trenches on the nanometer scale in laboratories supporting the electronic industry. However, with CD-AFM, it is difficult to predict ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824625

35. Nano- and Atomic-Scale Length Metrology
Published: 12/14/2007
Authors: Theodore Vincent Vorburger, Ronald G Dixson, Joseph Fu, Ndubuisi George Orji, Shaw C Feng, Michael W Cresswell, Richard A Allen, William F Guthrie, Wei Chu
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824603

36. A Novel Parameter Proposed for 2D and 3D Topography Measurements and Comparisons
Published: 9/1/2007
Authors: Jun-Feng Song, Theodore Vincent Vorburger
Abstract: Based on the cross-correlation function (CCF), a new parameter called profile difference, Ds (or topography difference for 3D), is developed for measurement and comparison of 2D profiles and 3D topographies.  When Ds = 0, the two compared profil ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823236

37. Verifying Measurement Uncertainty Using a Control Chart With Dynamic Control Limits
Published: 9/1/2007
Authors: Jun-Feng Song, Theodore Vincent Vorburger
Abstract: A control chart with dynamic control limit is proposed for promoting the developing process of an uncertainty budget, and verifying the developed measurement uncertainty. The up and low dynamic control limit, 2 sd, is calculated from the updated ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823223

38. Computational Models of the Nano Probe Tip for Static Behaviors
Published: 6/1/2007
Authors: Shaw C Feng, Theodore Vincent Vorburger, Che B. Joung, Li Ma
Abstract: As integrated circuits become smaller and faster, the measurement of line width must have less uncertainty and more versatility. The common requirement for uncertainty is less than 10 nanometers. The industrial need for versatility is three dimension ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822327

39. Surface Topography Analysis for a Feasibility Assessment of a National Ballistics Imaging Database
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7362
Published: 5/1/2007
Authors: Theodore Vincent Vorburger, James H Yen, B Bachrach, Thomas B Renegar, Li Ma, Hyug-Gyo Rhee, Xiaoyu A Zheng, Jun-Feng Song, Charles Dewey Foreman
Abstract: This document reports on a study to determine the feasibility and utility of a national ballistics database of casing and bullet images. The purpose of such a proposed database would be to provide a reference collection of ballistic images against ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822733

40. Progress on Implementation of a Reference Measurement System based on a Critical-dimension Atomic Force Microscope
Published: 4/1/2007
Authors: Ndubuisi George Orji, Angela Martinez, B Bunday, J Allgair, Theodore Vincent Vorburger
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824604