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Author: theodore vorburger

Displaying records 11 to 20 of 196 records.
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11. Multi-laboratory Comparison of Traceable Atomic Force Microscope Measurements of 70 nm Grating Pitch
Published: 3/8/2011
Authors: Ronald G Dixson, Donald Chernoff, Shihua Wang, Theodore Vincent Vorburger, Siew-Leng Tan, Ndubuisi George Orji, Joseph Fu
Abstract: The National Institute of Standards and Technology (NIST), Advanced Surface Microscopy (ASM), and the National Metrology Centre (NMC) of the Agency for Science, Technology, and Research (A*STAR) in Singapore have completed a three-way interlaboratory ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906777

12. Nano- and Atom-scale Length Metrology
Published: 10/1/2010
Authors: Theodore Vincent Vorburger, Ronald G Dixson, Ndubuisi George Orji, Joseph Fu, Richard A Allen, Michael W Cresswell, Vincent A Hackley
Abstract: Measurements of length at the nano-scale have increasing importance in manufacturing, especially in the electronics and biomedical industries. The properties of linewidth and step height are critical to the function and specification of semiconducto ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906609

13. Striation Density for Predicting the Identifiability of Fired Bullets
Published: 9/1/2010
Authors: Wei Chu, Jun-Feng Song, Theodore Vincent Vorburger, Susan M Ballou
Abstract: Without a selection procedure to exclude the bullets having insufficient individualized ballistics signature, automated ballistics identification systems will correlate an evidence bullet with all reference bullets stored in the database. Correlation ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901713

14. Subpixel Image Stitching for Linewidth Measurement Based on Digital Image Correlation
Published: 8/13/2010
Authors: Wei Chu, Joseph Fu, Theodore Vincent Vorburger
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903899

15. Topography measurements for correlations of standard cartridge cases
Published: 7/1/2010
Authors: Theodore Vincent Vorburger, Jun-Feng Song, Wei Chu, Thomas B Renegar, Xiaoyu A Zheng, James H Yen, Robert Meryln Thompson, Richard M Silver, Benjamin Bachrach, Martin Ols
Abstract: NIST Standard Reference Materials (SRM) 2460 Standard Bullets and 2461 Standard Cartridge Cases are intended for use as check standards for crime laboratories to help verify that their computerized optical imaging equipment for ballistics image acqui ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905846

16. Interlaboratory Comparison of Traceable Atomic Force Microscope Pitch Measurements
Published: 6/14/2010
Authors: Ronald G Dixson, Donald Chernoff, Shihua Wang, Theodore Vincent Vorburger, Ndubuisi George Orji, Siew-Leng Tan, Joseph Fu
Abstract: The National Institute of Standards and Technology (NIST), Advanced Surface Microscopy (ASM), and the National Metrology Centre (NMC) of the Agency for Science, Technology, and Research (A*STAR) in Singapore have undertaken a three-way interlaborator ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905745

17. Introduction to Surface Finish Metrology
Published: 6/14/2010
Author: Theodore Vincent Vorburger
Abstract: We discuss the range of methods available to measure surface finish and emphasize the methods of stylus profiling and various types of optical profiling. Documentary standards for measurement of surface texture and comparisons between methods are al ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905020

18. Optimal Compression and Binarization of Signature Profiles for Automated Bullet Identification Systems
Published: 5/1/2010
Authors: Wei Chu, Jun-Feng Song, Theodore Vincent Vorburger, Robert Meryln Thompson, Thomas B Renegar, Richard M Silver
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905570

19. Applications of Cross-Correlation Functions
Published: 4/14/2010
Authors: Theodore Vincent Vorburger, Jun-Feng Song, Wei Chu, Li Ma, Xiaoyu A Zheng, Thomas B Renegar, Son H Bui
Abstract: We describe several examples where we use cross-correlation functions to quantify the similarity of 2D surface profiles or of 3D surface topography images. The applications have included 1) the manufacture of Standard Reference Material (SRM) bullet ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902481

20. Calibration of 1 nm SiC Step Height Standards
Published: 3/31/2010
Authors: Theodore Vincent Vorburger, Albert M. Hilton, Ronald G Dixson, Ndubuisi George Orji, J. A. Powell, A. J. Trunek, P. G. Neudeck, P. B. Abel
Abstract: We aim to develop and calibrate a set of step height standards to meet the range of steps useful for nanotechnology. Of particular interest to this community is the calibration of atomic force microscopes operating at their highest levels of magnifi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905193