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Author: theodore vorburger
Displaying records 181 to 190 of 196 records.
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181.
Proposed Coating Technology Consortium
Published: 4/1/1993
Author: Theodore Vincent Vorburger
Abstract: Abstract not available.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902032
182.
Regimes of Surface Roughness Measurable with Light Scattering
Published: 1/1/1993
Authors: Theodore Vincent Vorburger, Egon Marx, T Lettieri
Abstract: In this paper we summarize a number of previous experiments on the measurement of the roughness of metallic surfaces by light scattering. We identify several regimes that permit measurement of different surface parameters and functions, and we establ
...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821000
183.
Surface Metrology of Soft X-ray Optics
Published: 1/1/1993
Authors: Theodore Vincent Vorburger, T. McWade, Joseph Fu, Christopher J. Evans, William Tyler Estler, R Parks
Abstract: Abstract not available.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901970
184.
XUV Optics Characterization at the National Institute of Standards and Technology
Published: 1/1/1993
Authors: R N. Watts, Charles S. Tarrio, Thomas B Lucatorto, R P. Madden, R Deslattes, Ariel Caticha, William Tyler Estler, Christopher J. Evans, T. McWade, Joseph Fu, Theodore Vincent Vorburger
Abstract: Abstract not available.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901965
185.
The Effects of Thin Films on Interferometric Step Height Measurements
Published: 12/31/1992
Authors: T. McWaid, Theodore Vincent Vorburger, J. F. Song, Deane Chandler-Horowitz
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=10838
186.
Upgraded Facility for Multilayer Mirror Characterization at NIST, ed. by N.M. Ceglio
Published: 1/1/1991
Authors: R N. Watts, D L Ederer, R Deslattes, Thomas B Lucatorto, W T Estler, C J Evans, Theodore Vincent Vorburger
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100211
187.
Implementation of the Surface Roughness Instrument (SRI) Controller
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 3794
Published: 1/1/1988
Authors: Howard T Moncarz, Theodore Vincent Vorburger
Abstract: This document describes the implementation specifics of the surface roughness instrument (SRI) controller program. The SRI is part of the inspection workstation (IWS) in the Automated Manufacturing Research Facility (AMRF) in the Center for Manufact
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821395
188.
Scanning Tunneling Microscopy (STM) of a Diamond-turned Surface and a Grating Replica
Published: 1/1/1987
Authors: Robert A. Dragoset, Theodore Vincent Vorburger
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620308
189.
Evidence for the Distortion of C^d2^H^d4^ and C^d2^H^d2^ Chemisorbed on W(100)
Published: 2/15/1977
Authors: Theodore Vincent Vorburger, B Waclawski, E. W. Plummer
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620134
190.
The Displacement of Hydrogen by Carbon Monoxide on the (100) Face of Tungsten: A Photoemission and Thermal Desorption Study
Published: 11/1/1976
Authors: Theodore Vincent Vorburger, D Sandstrom, B Waclawski
Abstract: Photoelectron spectra (hv = 21.22 eV) and thermal desorption data were obtained for CO and H coadsorbed on W(100) at 80 K. When the clean surface is exposed to a saturation dose of H2, subsequent exposure to CO results in the formation of a state who
...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620129