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Author: theodore vorburger

Displaying records 181 to 190 of 201 records.
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181. In Situ Tip Characterization for AFM and Application to Linewidth Metrology
Published: 1/1/1994
Authors: Ronald G Dixson, J Schneir, T Mcwaid, Theodore Vincent Vorburger
Abstract: Abstract not available.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901972

182. Methods Divergence Between Measurements of Micrometer and Sub-Micrometer Surface Features
Published: 1/1/1994
Authors: T Mcwaid, Theodore Vincent Vorburger, Joseph Fu, Jun-Feng Song, Eric Paul Whitenton
Abstract: Measurements of micrometer and sub-micrometer surface features have been made using a stylus profiler, an STM, an AFM, and a phase-measuring interferometric microscope. The differences between measurements of the same surface feature as obtained with ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820696

183. Microform Calibrations in Surface Metrology
Published: 1/1/1994
Authors: Jun-Feng Song, F Rudder, Theodore Vincent Vorburger, A Hartman, Brian R Scace, J Smith
Abstract: Microform calibrations include the measurement of complex profile forms and position errors of micrometer scale in combination with the measurement of deviations from a specified profile and surface texture of profile segments. Tolerances on the prof ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902015

184. Strategy for Post-Process Control of a Machine Tool
Published: 1/1/1994
Authors: Theodore Vincent Vorburger, K Yee, Brian R Scace, F Rudder
Abstract: The automated control of machine-tool accuracy is discussed based on a quality architecture containing three control loops: real-time, process-intermittent, and post-process. This paper highlights the post-process loop. The architecture is being impl ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820726

185. The Geometric Characterization of Rockwell Diamond Indenters
Published: 1/1/1994
Authors: Jun-Feng Song, F Rudder, Theodore Vincent Vorburger, A Hartman, Brian R Scace, J Smith
Abstract: By using a stylus instrument, a series of calibration and check standards, and calibration and uncertainty calculation procedures, we have calibrated Rockwell diamond indenters with a traceability to fundamental measurements. The combined measurement ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820714

186. Proposed Coating Technology Consortium
Published: 4/1/1993
Author: Theodore Vincent Vorburger
Abstract: Abstract not available.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902032

187. Regimes of Surface Roughness Measurable with Light Scattering
Published: 1/1/1993
Authors: Theodore Vincent Vorburger, Egon Marx, T Lettieri
Abstract: In this paper we summarize a number of previous experiments on the measurement of the roughness of metallic surfaces by light scattering. We identify several regimes that permit measurement of different surface parameters and functions, and we establ ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821000

188. Surface Metrology of Soft X-ray Optics
Published: 1/1/1993
Authors: Theodore Vincent Vorburger, T. McWade, Joseph Fu, Christopher J. Evans, William Tyler Estler, R Parks
Abstract: Abstract not available.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901970

189. XUV Optics Characterization at the National Institute of Standards and Technology
Published: 1/1/1993
Authors: R N. Watts, Charles S Tarrio, Thomas B Lucatorto, R P. Madden, R Deslattes, Ariel Caticha, William Tyler Estler, Christopher J. Evans, T. McWade, Joseph Fu, Theodore Vincent Vorburger
Abstract: Abstract not available.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901965

190. The Effects of Thin Films on Interferometric Step Height Measurements
Published: 12/31/1992
Authors: T. McWaid, Theodore Vincent Vorburger, J. F. Song, Deane Chandler-Horowitz
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=10838



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