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Author: theodore vorburger

Displaying records 171 to 180 of 202 records.
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171. Uncertainty Procedure for NIST Surface Finish and Microform Calibration
Published: 1/1/1996
Authors: Jun-Feng Song, Theodore Vincent Vorburger
Abstract: An uncertainty procedure is used for reporting the NIST surface finish and microform calibration uncertainties. The combined standard uncertainty is a combination of the uncertainty from the geometric non-uniformity of the measured surface, and the u ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820822

172. Stylus Technique for Direct Verification of Rockwell Diamond Indenters
Published: 11/23/1995
Authors: Jun-Feng Song, F Rudder, Theodore Vincent Vorburger, J Smith
Abstract: Based on a stylus technique, a microform calibration system was developed at NIST for the direct verification of Rockwell diamond indenters. The least-squares radius and profile deviations, cone angle and cone flank straightness, and the holder axis ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820771

173. Microform Calibration Uncertainties of Rockwell Diamond Indenters
Published: 9/1/1995
Authors: Jun-Feng Song, F Rudder, Theodore Vincent Vorburger, J Smith
Abstract: National and international comparisons in Rockwell hardness tests show significant differences. Uncertainties in the geometry of the Rockwell diamond indenters are largely responsible for these differences. By using a stylus instrument, with a series ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820770

174. Light Scattered by Sinusoidal Surfaces: Illumination Windows and Harmonics in Standards
Published: 3/1/1995
Authors: Egon Marx, T Lettieri, Theodore Vincent Vorburger
Abstract: Sinusoidal surfaces can be used as material standards to help calibrate instruments that measure the angular distribution of the intensity of light scattered by arbitrary surfaces, because the power in the diffraction peaks varies over several orders ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820747

175. Microform Calibrations in Surface Metrology
Published: 2/1/1995
Authors: Jun-Feng Song, F Rudder, Theodore Vincent Vorburger, A Hartman, Brian R Scace, J Smith
Abstract: Microform calibrations include the measurement of complex profile forms and position errors of micrometer scale in combination with the measurement of deviations from a specified profile and surface texture of profile segments. Tolerances on the prof ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820769

176. A Metrology Approach to Unifying Rockwell C Hardness Scales
Published: 1/1/1995
Authors: Jun-Feng Song, J Smith, Theodore Vincent Vorburger
Abstract: Current Rockwell C hardness scales (HRC) are unified by performance comparisons. Unless a reliable metrology approach is used for the direct verification of standard hardness machines and diamond indenters, the unified hardness scale may exhibit a sy ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820772

177. Development of Rockwell Hardness Standards: From Performance Comparisons to Fundamental Metrology
Published: 1/1/1995
Authors: J Smith, Jun-Feng Song, F Rudder, Theodore Vincent Vorburger
Abstract: Based on the Rockwell diamond indenter's microform calibrations recently developed at NIST, as well as a deadweight standardized Rockwell hardness machine, the NIST Rockwell hardness standard calibration has been established. Our approach makes i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820768

178. Working and Check Standards for NIST Surface and Microform Measurements
Published: 1/1/1995
Authors: Jun-Feng Song, Theodore Vincent Vorburger
Abstract: Different working standards and check standards are used in the NIST surface and microform measurement laboratory for calibrating instruments, establishing measurement traceability and control measurement uncertainty. The basic requirements for these ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820773

179. An Instrument for Calibrating Atomic Force Microscope Standards
Published: 5/1/1994
Authors: J Schneir, T Mcwaid, Theodore Vincent Vorburger
Abstract: To facilitate the use of AFMs for manufacturing we have initiated a project to develop and calibrate artifacts which can in turn be used to calibrate a commercial AFM so that subsequent AFM measurement are accurate and traceable back to the wavelengt ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820711

180. The Measurement and Uncertainty of a Calibration Standard for the SEM
Published: 3/1/1994
Authors: Joseph Fu, M Croarkin, Theodore Vincent Vorburger
Abstract: Standard Reference Material 484 is an artifact for calibration the magnification scale of a Scanning Electron Microscope (SEM) within the range of 1000X to 20000X. Seven issues, SRM-484, and SRM-484a to SRM-484f, have been certified between 1977 and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820682



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