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Author: theodore vorburger
Displaying records 161 to 170 of 196 records.
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161.
Standard Grade Rockwell Diamond Indenters - A Key to a Worldwide Unified Rockwell Hardness Scale
Published: 1/1/1996
Authors: Jun-Feng Song, Samuel Rea Low III, David J Pitchure, Theodore Vincent Vorburger
Abstract: Since the 1980's, the European Community (EC) has established a unified Rockwell C hardness (HRC) scale by averaging several national scales, which come from each country''s national hardness machines and diamond indenters. These indenter
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820820
162.
Standard Grade Rockwell Diamond Indenters - A Key to a Worldwide Unified Rockwell Hardness Scale (in Japanese)
Published: 1/1/1996
Authors: Jun-Feng Song, Theodore Vincent Vorburger
Abstract: Since the 1980''s, the European Community (EC) has established a unified Rockwell C hardness (HRC) scale by averaging several national scales, which come from each country''s national hardness machines and diamond indenters. These ind
...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820997
163.
Stylus Flight in Surface Profiling
Published: 1/1/1996
Authors: Jun-Feng Song, Theodore Vincent Vorburger
Abstract: In this paper, theoretical and experimental work on stylus flight is described. Experiments on the surfaces of different roughness specimens with sinusoidal, rectangular, triangular and random waveforms support the theoretical model, which predicts s
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820821
164.
Toward Accurate Measurements of Pitch, Height, and Width Artifacts with the NIST Calibrated AFM
Published: 1/1/1996
Authors: Ronald G Dixson, Theodore Vincent Vorburger, P Sullivan, V W. Tsai, T Mcwaid
Abstract: Atomic force microscope (AFM) measurements are being used increasingly for metrological applications such as semiconductor process development and control. Common types of measurements are those of feature spacing (pitch), feature height (or depth),
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820790
165.
Uncertainty Procedure for NIST Surface Finish and Microform Calibration
Published: 1/1/1996
Authors: Jun-Feng Song, Theodore Vincent Vorburger
Abstract: An uncertainty procedure is used for reporting the NIST surface finish and microform calibration uncertainties. The combined standard uncertainty is a combination of the uncertainty from the geometric non-uniformity of the measured surface, and the u
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820822
166.
Stylus Technique for Direct Verification of Rockwell Diamond Indenters
Published: 11/23/1995
Authors: Jun-Feng Song, F Rudder, Theodore Vincent Vorburger, J Smith
Abstract: Based on a stylus technique, a microform calibration system was developed at NIST for the direct verification of Rockwell diamond indenters. The least-squares radius and profile deviations, cone angle and cone flank straightness, and the holder axis
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820771
167.
Microform Calibration Uncertainties of Rockwell Diamond Indenters
Published: 9/1/1995
Authors: Jun-Feng Song, F Rudder, Theodore Vincent Vorburger, J Smith
Abstract: National and international comparisons in Rockwell hardness tests show significant differences. Uncertainties in the geometry of the Rockwell diamond indenters are largely responsible for these differences. By using a stylus instrument, with a series
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820770
168.
Light Scattered by Sinusoidal Surfaces: Illumination Windows and Harmonics in Standards
Published: 3/1/1995
Authors: Egon Marx, T Lettieri, Theodore Vincent Vorburger
Abstract: Sinusoidal surfaces can be used as material standards to help calibrate instruments that measure the angular distribution of the intensity of light scattered by arbitrary surfaces, because the power in the diffraction peaks varies over several orders
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820747
169.
Microform Calibrations in Surface Metrology
Published: 2/1/1995
Authors: Jun-Feng Song, F Rudder, Theodore Vincent Vorburger, A Hartman, Brian R Scace, J Smith
Abstract: Microform calibrations include the measurement of complex profile forms and position errors of micrometer scale in combination with the measurement of deviations from a specified profile and surface texture of profile segments. Tolerances on the prof
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820769
170.
A Metrology Approach to Unifying Rockwell C Hardness Scales
Published: 1/1/1995
Authors: Jun-Feng Song, J Smith, Theodore Vincent Vorburger
Abstract: Current Rockwell C hardness scales (HRC) are unified by performance comparisons. Unless a reliable metrology approach is used for the direct verification of standard hardness machines and diamond indenters, the unified hardness scale may exhibit a sy
...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820772