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Author: mark vaudin
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1. A Model System for Interfacial Reactions in LTCC Materials
Published: 4/1/2003
Authors: Lawrence P. Cook, Winnie K Wong-Ng, Peter K. Schenck, Mark D Vaudin, J Suh
Abstract: Over the past decade, ceramic packaging materials have continued to increase in both chemical and structural complexity. At processing temperatures of 800 C to 900 C, the possibilities for interactions at interfaces between dissimilar materials ar ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850712

2. Accuracy and Reproducibility of X-Ray Texture Measurements on Thin Films
Published: 5/1/2002
Authors: Mark D Vaudin, G R Fox, G - Kowach
Abstract: Rocking curve texture measurements were made on thin films of zinc oxide (ZnO) and platinum (Pt) using a powder x-ray diffractometer, and also, in the case of ZnO, an area detector. The intensity corrections for defocussing and other geometric factor ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851129

3. Accuracy and Resolution of Nanoscale Strain Measurement Techniques
Published: 3/26/2013
Authors: William A Osborn, Lawrence H Friedman, Mark D Vaudin, Stephan J Stranick, Michael S. Gaither, Justin M Gorham, Victor Vartanian, Robert Francis Cook
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913178

4. Accurate Texture Measurements on Thin Films Using a Powder X-Ray Diffractometer
Published: 6/1/1999
Author: Mark D Vaudin
Abstract: A fast and accurate method that uses a conventional powder x-ray diffractometer has been developed for measuring crystalline texture. A {Theta} - 2{Theta}scan of a Bragg peak from the textured planes is collected and also a {Theta} scan, or rocking c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850296

5. Coated Conductors: Phase Relations in the Ba-Y-Cu-F-O-H System
Published: 1/1/2004
Authors: Winnie K Wong-Ng, Lawrence P. Cook, Igor Levin, Mark D Vaudin, J Suh, Ron Feenstra
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850785

6. Combinatorial Investigation of Structural Quality of Au/Ni Contacts on GaN
Published: 6/1/2004
Authors: Albert Davydov, Leonid A Bendersky, William J Boettinger, Daniel Josell, Mark D Vaudin, C S Chang, Ichiro Takeuchi
Abstract: A combinatorial library of Au/Ni metalizations on GaN were microstructurally characterized by x-ray diffraction (XRD), electron back-scattered diffraction (EBSD) and transmission electron microscopy (TEM). The array of single- and bi-layered metal e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853247

7. Comparative of Texture Analysis Techniques for Highly Oriented {alpha}-Al^d2^O^d3^
Published: 8/1/2000
Authors: M M Seabugh, Mark D Vaudin, James P Cline, G L Messing
Abstract: Texture measurements were performed on liquid phase sintered alumina textured by a templated grain growth process. Texture distributions were measured using four techniques (x-ray pole figure, rocking curve, and Rietveld refinement and stereological ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850287

8. Comparison of Nanoscale Measurements of Strain and Stress using Electron Back Scattered Diffraction and Confocal Raman Microscopy
Published: 12/12/2008
Authors: Mark D Vaudin, Yvonne Beatrice Gerbig, Stephan J Stranick, Robert Francis Cook
Abstract: Strains in Si as small as 104 (corresponding to stresses of 10 MPa) have been measured using electron back scatter diffraction (EBSD), with spatial resolution close to 10 nm, and confocal Raman microscopy (CRM) with spatial resolution app ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854129

9. Composition and Carrier Concentration Dependence of the Electronic Structure of InyGa1-yAs1-xNx Films With Nitrogen Mole Fraction Less Than 0.012
Published: 11/1/2005
Authors: Youn Seon Kang, Lawrence H Robins, Anthony Birdwell, Alexander J. Shapiro, W. Robert Thurber, Mark D Vaudin, M M Fahmi, D Bryson, S N Mohammad
Abstract: The electronic structure of Si-doped InyGa1-yAs1-xNx films on GaAs substrates, grown bynitrogen-plasma-assisted molecular-beam epitaxy, was examined by photoreflectance PR spectroscopy at temperatures between 20 and 300 K. The films were approximate ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850826

10. Correlation of the optical gap of (Ba,Sr)yTiO^d2+y^ thin films with film composition
Published: 6/1/2000
Authors: L D. Rotter, Mark D Vaudin, John E Bonevich, Debra L Kaiser, S 0. Park
Abstract: A series of (Ba^d1-x^,Sr^dx^)yTiO^d2+y^ films with a wide range of y and x < 0.07 was grown by metalorganic chemical vapor deposition. The composition of the films was determined by wavelength dispersive x-ray spectrometry. Transmission spectra ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850224



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