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You searched on: Author: mark vaudin

Displaying records 81 to 85.
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81. Phase Relations in Ba-(Nd,Eu,Gd)-Cu-O Coated Conductor Films
Published: Date unknown
Authors: Winnie K Wong-Ng, Igor Levin, Joseph J. Ritter, Lawrence P. Cook, Guangyao Liu, Makoto Otani, Christopher E Lucas, Shailee P Diwanji, Ron Feenstra, P Goyal, Mark D Vaudin
Abstract: Knowledge of phase relations in thin films of Ba2RCu3O6+x (where R=lanthanides or mixed lanthanides) is needed to guide the processing of coated conductors. High-temperature X-ray diffraction studies of Ba2RCu3O6+x films deposited using the trifluor ...

82. Rapid Detection of Thin-Film Interfacial Reactions by MEMS-DSC
Published: Date unknown
Authors: Lawrence P. Cook, Richard E Cavicchi, Yanbao Zhang, Mark D Vaudin, Christopher B Montgomery, William F. Egelhoff Jr., Martin L Green, Leslie Allen
Abstract: A MEMS-based differential scanning calorimeter (DSC) has been used to characterize the Ni/Si interfacial reaction in thin films at ramp rates of 940 C/s and 3760 C/s. The DSC devices were fabricated using CMOS semiconductor processing technology, ...

83. Stoichiometry and Phase Composition of MOCVD Barium Titanate Films
Published: Date unknown
Authors: Charles E. Bouldin, Joseph C Woicik, Bruce D Ravel, Debra L Kaiser, Mark D Vaudin
Abstract: X-ray absorption fine structure (XAFS), x-ray diffraction (XRD) and x-ray fluorescence (XRF) have been used to study the stoichiometry and phase composition of thin ({approximately equal to} 1 micron) films deposited on MgO substrates. Deposition tem ...

84. The Influence of Additives on the Room-Temperature Recrystallization of Electrodeposited Copper
Published: Date unknown
Authors: Gery R Stafford, Mark D Vaudin, Thomas P Moffat, N G Armstrong, David R Kelley
Abstract: The recrystallization behavior of copper, electrodeposited from a copper sulfate-sulfuric acid plating bath into which various combinations of NaCl, sodium 3-mercapto-1propanesulfonate (MPSA), the polyethylene glycol (PEG) has been added, was examine ...

85. X-Ray Diffraction Study of the Optimization of MgO Growth Conditions for Magnetic Tunnel Junctions
Published: Date unknown
Authors: O Se Young, C G Lee, Alexander J. Shapiro, William F. Egelhoff Jr., Mark D Vaudin, Jennifer L Klamo, J Mallett, Philip Pong
Abstract: MgO based magnetic tunnel junctions (MTJs) show large tunneling magnetoresistance (TMR) effects and are currently the most promising technology for the applications in magnetoelectronics devices. Conventional MTJs with amorphous AlOx barriers yield T ...

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