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You searched on: Author: mark vaudin

Displaying records 81 to 83.
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81. Stoichiometry and Phase Composition of MOCVD Barium Titanate Films
Published: Date unknown
Authors: Charles E. Bouldin, Joseph C Woicik, Bruce D Ravel, Debra L Kaiser, Mark D Vaudin
Abstract: X-ray absorption fine structure (XAFS), x-ray diffraction (XRD) and x-ray fluorescence (XRF) have been used to study the stoichiometry and phase composition of thin ({approximately equal to} 1 micron) films deposited on MgO substrates. Deposition tem ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850530

82. The Influence of Additives on the Room-Temperature Recrystallization of Electrodeposited Copper
Published: Date unknown
Authors: Gery R Stafford, Mark D Vaudin, Thomas P Moffat, N G Armstrong, David R Kelley
Abstract: The recrystallization behavior of copper, electrodeposited from a copper sulfate-sulfuric acid plating bath into which various combinations of NaCl, sodium 3-mercapto-1propanesulfonate (MPSA), the polyethylene glycol (PEG) has been added, was examine ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852954

83. X-Ray Diffraction Study of the Optimization of MgO Growth Conditions for Magnetic Tunnel Junctions
Published: Date unknown
Authors: O Se Young, C G Lee, Alexander J. Shapiro, William F. Egelhoff Jr., Mark D Vaudin, Jennifer L Klamo, J Mallett, Philip Pong
Abstract: MgO based magnetic tunnel junctions (MTJs) show large tunneling magnetoresistance (TMR) effects and are currently the most promising technology for the applications in magnetoelectronics devices. Conventional MTJs with amorphous AlOx barriers yield T ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853524



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