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You searched on: Author: mark vaudin

Displaying records 61 to 70 of 85 records.
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61. Electrochemical Properties of Nanocrystalline Cadmium Stannate Films
Published: 8/1/2001
Authors: Gintaras Valincius, Vytautas Reipa, V L. Vilker, John Taylor Woodward IV, Mark D Vaudin
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904228

62. Workshop on Texture in Electronic Applications
Series: Journal of Research (NIST JRES)
Published: 5/1/2001
Authors: Mark D Vaudin, Debra L Kaiser
Abstract: A two day workshop on Texture in Electronic Applications was held on October 10-11,2000 at NIST, Gaithersburg. The workshop presented an excellent forum for discussion of a broad spectrum of texture-related issues of interest to academic,government a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850490

63. Texture Plus
Published: 2/1/2001
Author: Mark D Vaudin
Abstract: TexturePlus is a Win '95 or later software package that analyzes crystallographic texture in bulk and thin film specimens. The software analyzes data obtained on a powder x-ray diffractometer. The required data include an x-ray theta-2theta scan ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850426

64. Cu Electrodeposition for On-Chip Interconnections
Published: 1/1/2001
Authors: Gery R Stafford, Thomas P Moffat, V D Jovic, David R Kelley, John E Bonevich, Daniel Josell, Mark D Vaudin, N G Armstrong, W H Huber, A Stanishevsky
Abstract: The electrochemical behavior of copper in copper sulfate - sulfuric acid, containing various combinations of NaCl, sodium 3 mercapto-1 propanesulfonate (MPSA), and polyethylene glycol (PEG) is examined. The i-E deposition characteristics of the elec ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853000

65. Spontaneous Compositional Modulation in the A1GaN Layers of a Thick A1GaN/GaN Multilayer Structure
Published: 1/1/2001
Authors: Igor Levin, Lawrence H Robins, Mark D Vaudin, J A Tuchman, E Lakin, M J Sherman, J Ramer
Abstract: A periodic modulation with the wavevector parallel to the [0001] direction was observed in the AlGaN layers of a thick AlGaN/GaN multilayer heterostructure grown by metalorganic chemical vapor disposition. The modulation was attributed to a nearly s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850431

66. Optical and Structural Studies of Compositional Inhomogeneity in Strain-Relaxed Indium Gallium Nitride Films
Published: 12/31/2000
Authors: Lawrence H Robins, J T. Armstrong, Ryna B. Marinenko, Mark D Vaudin, Charles E. Bouldin, J C Woicik, Albert J. Paul, W. Robert Thurber
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14553

67. Comparative of Texture Analysis Techniques for Highly Oriented {alpha}-Al^d2^O^d3^
Published: 8/1/2000
Authors: M M Seabugh, Mark D Vaudin, James P Cline, G L Messing
Abstract: Texture measurements were performed on liquid phase sintered alumina textured by a templated grain growth process. Texture distributions were measured using four techniques (x-ray pole figure, rocking curve, and Rietveld refinement and stereological ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850287

68. Correlation of the optical gap of (Ba,Sr)yTiO^d2+y^ thin films with film composition
Published: 6/1/2000
Authors: L D. Rotter, Mark D Vaudin, John E Bonevich, Debra L Kaiser, S 0. Park
Abstract: A series of (Ba^d1-x^,Sr^dx^)yTiO^d2+y^ films with a wide range of y and x < 0.07 was grown by metalorganic chemical vapor deposition. The composition of the films was determined by wavelength dispersive x-ray spectrometry. Transmission spectra ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850224

69. Measuring Bimodal Crystallographic Texture in Ferroelectric PZT Thin Films
Published: 2/1/2000
Authors: Mark D Vaudin, G R Fox
Abstract: A powder x-ray diffraction method has been developed to measure the volume fraction of (111), (100), and randomly oriented PZT in 200 nm thick films used for FRAM applications. The integrated and peak intensities of 100, 110, 200 and 222 Bragg peaks ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850359

70. Determination of Texture From Individual Grain Orientation Measurements
Published: 11/17/1999
Authors: J Blendell, Mark D Vaudin, Lin-Sien H Lum
Abstract: We present a technique for determining the texture of a polycrystalline material based on the measurement of the orientation of a number of individual grains. We assume that the sample has fiber texture and that the texture can be characterized by a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850215



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