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Author: mark vaudin

Displaying records 61 to 70 of 81 records.
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61. Spontaneous Compositional Modulation in the A1GaN Layers of a Thick A1GaN/GaN Multilayer Structure
Published: 1/1/2001
Authors: Igor Levin, Lawrence H Robins, Mark D Vaudin, J A Tuchman, E Lakin, M J Sherman, J Ramer
Abstract: A periodic modulation with the wavevector parallel to the [0001] direction was observed in the AlGaN layers of a thick AlGaN/GaN multilayer heterostructure grown by metalorganic chemical vapor disposition. The modulation was attributed to a nearly s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850431

62. Optical and Structural Studies of Compositional Inhomogeneity in Strain-Relaxed Indium Gallium Nitride Films
Published: 12/31/2000
Authors: Lawrence H Robins, J T. Armstrong, Ryna B. Marinenko, Mark D Vaudin, Charles E. Bouldin, J C Woicik, Albert J. Paul, W. Robert Thurber
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14553

63. Comparative of Texture Analysis Techniques for Highly Oriented {alpha}-Al^d2^O^d3^
Published: 8/1/2000
Authors: M M Seabugh, Mark D Vaudin, James P Cline, G L Messing
Abstract: Texture measurements were performed on liquid phase sintered alumina textured by a templated grain growth process. Texture distributions were measured using four techniques (x-ray pole figure, rocking curve, and Rietveld refinement and stereological ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850287

64. Correlation of the optical gap of (Ba,Sr)yTiO^d2+y^ thin films with film composition
Published: 6/1/2000
Authors: L D. Rotter, Mark D Vaudin, John E Bonevich, Debra L Kaiser, S 0. Park
Abstract: A series of (Ba^d1-x^,Sr^dx^)yTiO^d2+y^ films with a wide range of y and x < 0.07 was grown by metalorganic chemical vapor deposition. The composition of the films was determined by wavelength dispersive x-ray spectrometry. Transmission spectra ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850224

65. Measuring Bimodal Crystallographic Texture in Ferroelectric PZT Thin Films
Published: 2/1/2000
Authors: Mark D Vaudin, G R Fox
Abstract: A powder x-ray diffraction method has been developed to measure the volume fraction of (111), (100), and randomly oriented PZT in 200 nm thick films used for FRAM applications. The integrated and peak intensities of 100, 110, 200 and 222 Bragg peaks ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850359

66. Determination of Texture From Individual Grain Orientation Measurements
Published: 11/17/1999
Authors: J Blendell, Mark D Vaudin, Lin-Sien H Lum
Abstract: We present a technique for determining the texture of a polycrystalline material based on the measurement of the orientation of a number of individual grains. We assume that the sample has fiber texture and that the texture can be characterized by a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850215

67. Accurate Texture Measurements on Thin Films Using a Powder X-Ray Diffractometer
Published: 6/1/1999
Author: Mark D Vaudin
Abstract: A fast and accurate method that uses a conventional powder x-ray diffractometer has been developed for measuring crystalline texture. A {Theta} - 2{Theta}scan of a Bragg peak from the textured planes is collected and also a {Theta} scan, or rocking c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850296

68. Effect of Electrode Layer on the Polydomain Structure of Epitaxial PbZr^d0.2^Ti^d0.8^O^d3^ Thin Films
Published: 3/15/1999
Authors: S P Alpay, V Nagarajan, Leonid A Bendersky, Mark D Vaudin, S Aggarwal, R Ramesh, Alexander Lazar Roytburd
Abstract: PbZr^d0.2^Ti^d0.8^O^d3^(PZT) thin films with and without La^d0.5^Sr^d0.5^CoO^d3^(LSCO) electrodes were grown epitaxially on (001) SrTiO^d3^ (STO) at 650 C by pulsed laser deposition. The domain structure of the 400 nm thick PZT films with different ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850400

69. Effect of Film Composition on the Orientation of (Ba,Sr)TiO^d3^ Grains in (Ba,Sr)^dy^TiO^d2+y^ Thin Films
Published: 1/12/1999
Authors: Debra L Kaiser, Mark D Vaudin, L D. Rotter, John E Bonevich, J T. Armstrong
Abstract: (Ba,Sr)^dy^TiO^d2+y^ thin films with 0.34 {< or =} y {< or =} 1.64 were deposited by metalorganic chemical vapor deposition (MOCVD) on (100) MgO substrates at various growth conditions. X-ray diffraction and transmission electron microscopy studies ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850213

70. Diameter Dependent Transport Properties of GaN Nanowire Field Effect Transistors
Published: Date unknown
Authors: Abhishek Motayed, Mark D Vaudin, Albert Davydov, John Meingailis, Maoqi He, S N Mohammad
Abstract: We report transport properties measurements of individual GaN nanowire field effect transistors and the correlation of the electron mobilities with the existence of grain boundaries in these nanowires. These nanowires are grown by direct reaction of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853466



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