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You searched on: Author: mark vaudin

Displaying records 61 to 70 of 83 records.
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61. Texture Plus
Published: 2/1/2001
Author: Mark D Vaudin
Abstract: TexturePlus is a Win '95 or later software package that analyzes crystallographic texture in bulk and thin film specimens. The software analyzes data obtained on a powder x-ray diffractometer. The required data include an x-ray theta-2theta scan ...

62. Cu Electrodeposition for On-Chip Interconnections
Published: 1/1/2001
Authors: Gery R Stafford, Thomas P Moffat, V D Jovic, David R Kelley, John E Bonevich, Daniel Josell, Mark D Vaudin, N G Armstrong, W H Huber, A Stanishevsky
Abstract: The electrochemical behavior of copper in copper sulfate - sulfuric acid, containing various combinations of NaCl, sodium 3 mercapto-1 propanesulfonate (MPSA), and polyethylene glycol (PEG) is examined. The i-E deposition characteristics of the elec ...

63. Spontaneous Compositional Modulation in the A1GaN Layers of a Thick A1GaN/GaN Multilayer Structure
Published: 1/1/2001
Authors: Igor Levin, Lawrence H Robins, Mark D Vaudin, J A Tuchman, E Lakin, M J Sherman, J Ramer
Abstract: A periodic modulation with the wavevector parallel to the [0001] direction was observed in the AlGaN layers of a thick AlGaN/GaN multilayer heterostructure grown by metalorganic chemical vapor disposition. The modulation was attributed to a nearly s ...

64. Optical and Structural Studies of Compositional Inhomogeneity in Strain-Relaxed Indium Gallium Nitride Films
Published: 12/31/2000
Authors: Lawrence H Robins, J T. Armstrong, Ryna B. Marinenko, Mark D Vaudin, Charles E. Bouldin, J C Woicik, Albert J. Paul, W. Robert Thurber

65. Comparative of Texture Analysis Techniques for Highly Oriented {alpha}-Al^d2^O^d3^
Published: 8/1/2000
Authors: M M Seabugh, Mark D Vaudin, James P Cline, G L Messing
Abstract: Texture measurements were performed on liquid phase sintered alumina textured by a templated grain growth process. Texture distributions were measured using four techniques (x-ray pole figure, rocking curve, and Rietveld refinement and stereological ...

66. Correlation of the optical gap of (Ba,Sr)yTiO^d2+y^ thin films with film composition
Published: 6/1/2000
Authors: L D. Rotter, Mark D Vaudin, John E Bonevich, Debra L Kaiser, S 0. Park
Abstract: A series of (Ba^d1-x^,Sr^dx^)yTiO^d2+y^ films with a wide range of y and x < 0.07 was grown by metalorganic chemical vapor deposition. The composition of the films was determined by wavelength dispersive x-ray spectrometry. Transmission spectra ...

67. Measuring Bimodal Crystallographic Texture in Ferroelectric PZT Thin Films
Published: 2/1/2000
Authors: Mark D Vaudin, G R Fox
Abstract: A powder x-ray diffraction method has been developed to measure the volume fraction of (111), (100), and randomly oriented PZT in 200 nm thick films used for FRAM applications. The integrated and peak intensities of 100, 110, 200 and 222 Bragg peaks ...

68. Determination of Texture From Individual Grain Orientation Measurements
Published: 11/17/1999
Authors: J Blendell, Mark D Vaudin, Lin-Sien H Lum
Abstract: We present a technique for determining the texture of a polycrystalline material based on the measurement of the orientation of a number of individual grains. We assume that the sample has fiber texture and that the texture can be characterized by a ...

69. Accurate Texture Measurements on Thin Films Using a Powder X-Ray Diffractometer
Published: 6/1/1999
Author: Mark D Vaudin
Abstract: A fast and accurate method that uses a conventional powder x-ray diffractometer has been developed for measuring crystalline texture. A {Theta} - 2{Theta}scan of a Bragg peak from the textured planes is collected and also a {Theta} scan, or rocking c ...

70. Effect of Electrode Layer on the Polydomain Structure of Epitaxial PbZr^d0.2^Ti^d0.8^O^d3^ Thin Films
Published: 3/15/1999
Authors: S P Alpay, V Nagarajan, Leonid A Bendersky, Mark D Vaudin, S Aggarwal, R Ramesh, Alexander Lazar Roytburd
Abstract: PbZr^d0.2^Ti^d0.8^O^d3^(PZT) thin films with and without La^d0.5^Sr^d0.5^CoO^d3^(LSCO) electrodes were grown epitaxially on (001) SrTiO^d3^ (STO) at 650 C by pulsed laser deposition. The domain structure of the 400 nm thick PZT films with different ...

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