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Displaying records 81 to 90 of 100 records.
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81. Calibration Wafer for Temperature Measurement in RTP Tools
Published: 1/1/1998
Authors: K G Kreider, D P DeWitt, Benjamin K Tsai, Francis John Lovas, David W Allen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104583

82. Developments in the New Spectral Irradiance Scale at NIST
Series: Journal of Research (NIST JRES)
Published: 1/1/1998
Author: Benjamin K Tsai
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104232

83. High Heat Flux Sensor Calibration using Blackbody Radiation
Published: 1/1/1998
Authors: A V Murthy, Benjamin K Tsai, Robert D. Saunders
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104051

84. Meeting RTP Temperature Accuracy Requirements: Measurement and Calibrations at NIST, ed. by M.C. Ozturk, F. Roozeboom, P.J. Timans, and S.H. Pas
Published: 1/1/1998
Authors: Francis John Lovas, Benjamin K Tsai, Charles E Gibson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104603

85. NIST Measurement Services: Radiance Temperature Calibrations
Series: Special Publication (NIST SP)
Report Number: 250-43
Published: 1/1/1998
Authors: Charles E Gibson, Benjamin K Tsai, Albert C Parr
Abstract: This document describes the realization and dissemination of the International Temperature Scale of 1990 (ITS-90) above 700 [degrees] C at the National Institute of Standards and Technology (NIST). By using the fundamental principles of blackbody ph ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841231

86. RTP Calibration Wafer Using Thin-Film Thermocouples, ed. by M.C. Ozturk, F. Roozeboom, P.J. Timans, and S.H. Pas
Published: 1/1/1998
Authors: K G Kreider, D P DeWitt, Benjamin K Tsai, Francis John Lovas, David W Allen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104582

87. Radiance Temperature Calibrations
Published: 1/1/1998
Authors: Charles E Gibson, Benjamin K Tsai, Albert C Parr
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104504

88. Radiometric Traceability for Fundamental Measurements: Estimation and Evaluation of Combined Standard Uncertainties
Published: 1/1/1998
Authors: Benjamin K Tsai, Bettye C Johnson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104231

89. Developments for a New Spectral Irradiance Scale at the National Institute of Standards and Technology
Series: Journal of Research (NIST JRES)
Published: 9/1/1997
Author: Benjamin K Tsai
Abstract: Recent developments for a new spectral irradiance scale realization at the National Institute of Standards and Technology have been targeted to reduce the present relative expanded uncertainties of 0.67 % to 4.34 % (coverage factor of k =2and thus a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841256

90. Calibration of High Heat Flux Sensors at NIST
Series: Journal of Research (NIST JRES)
Published: 7/1/1997
Authors: A V Murthy, Benjamin K Tsai, Charles E Gibson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841258



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