NIST logo

Publications Portal

You searched on:
Author: alan thompson

Displaying records 41 to 50 of 85 records.
Resort by: Date / Title


41. The NIST-Indiana-Hamilton Polarized ^u3^He Spin Filter Program, ed. by C.R. Gould, G.L. Greene, F. Plasil, and W.M. Snow
Published: 1/1/2001
Authors: Thomas R. Gentile, D R Rich, Alan K Thompson, C S Bailey, M T Gericke, Daniel S Hussey, B Neff, W M. Snow, G L Jones, E Wildman
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103509

42. A High Resolution, Low-Background Fast Neutron Spectrometer
Published: 1/1/2000
Authors: Jeffrey S Nico, J M Adams, Alan K Thompson, J N Abdurashitov, V N Gavrin, A V Kalikov, V L Matushko, A A Shikhin, V E Yants, O S Zaborskaia
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103278

43. Demonstration of a Compact Compressor for Application of Metastability-Exchange Optical Pumping of ^u3^He to Human Lung Imaging
Published: 1/1/2000
Authors: Thomas R. Gentile, G L Jones, Alan K Thompson, R R Rizi, I E Dimitrov, D Roberts, W Gefter, M D Schnall, J S Leigh
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103137

44. New Limit on the {I}D{I} Coefficient in Polarized Neutron Decay
Published: 1/1/2000
Authors: L Lising, S R Hwang, J M Adams, T J Bowles, M C Browne, T E Chupp, K A Coulterpark, Maynard S Dewey, S J Freedman, B K Fujikawa, A Garcia, G L Greene, G L Jones, Hans P Mumm, Jeffrey S Nico, J M Richardson, R G Robertson, W A Teasdale, Alan K Thompson, E G Wasserman, Fred E. Wietfeldt, R C Welsh, J F Wilkerson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103223

45. SANS Polarization Analysis with Nuclear-Spin-Polarized ^u3^He
Published: 1/1/2000
Authors: Thomas R. Gentile, G L Jones, Alan K Thompson, J Barker, C. J. Glinka, B Hammouda, J W Lynn
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103136

46. Test of He-3-based Neutron Polarizers at NIST
Published: 1/1/2000
Authors: G L Jones, Thomas R. Gentile, Alan K Thompson, Z Chowdhuri, Maynard S Dewey, W M. Snow, Fred E. Wietfeldt
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103190

47. Time Reversal in Polarized Neutron Decay - The emiT Experiment
Published: 1/1/2000
Authors: G L Jones, J M Adams, J M Anaya, T J Bowles, T E Chupp, K A Coulterpark, Maynard S Dewey, S J Freedman, B K Fujikawa, A Garcia, G L Greene, S -R Hwang, L Lising, Hans P Mumm, Jeffrey S Nico, R G Robertson, T D Steiger, W A Teasdale, Alan K Thompson, E G Wasserman, Fred E. Wietfeldt, J F Wilkerson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103552

48. The Fifth SeaWiFS Intercalibration Round-Robin Experiment (SIRREX-5), ed. by S.B. Hooker and E.R. Firestone
Published: 7/1/1999
Authors: Bettye C Johnson, Howard W Yoon, S S Bruce, Ping-Shine Shaw, Alan K Thompson, S B. Hooker, R A Barnes, E Eplee r, S Maritorena, J L Mueller
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104556

49. Measurements and Predictions of Light Scattering by Coatings
Published: 5/1/1999
Authors: Theodore Vincent Vorburger, Egon Marx, M E. McKnight, Maria E Nadal, P Y. Barnes, Alan K Thompson, Michael A Galler, Fern Y Hunt, Mark R VanLandingham
Abstract: We show comparisons between calculations and measurements of angle-resolved light scattering distributions from clear dielectric, isotropic coatings. The calculated distributions are derived from topography measurements performed with scanning white ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822523

50. Gloss Measurements at NIST
Published: 1/1/1999
Authors: Alan K Thompson, E A. Early, Maria E Nadal
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104782



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series