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You searched on: Author: weston tew

Displaying records 41 to 50 of 59 records.
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41. Standard Reference Material 1750: Standard Platinum Resistance Thermometers, 13.8033 K to 429.7485 K
Series: Special Publication (NIST SP)
Report Number: 260-139
Published: 11/1/2001
Authors: Weston Leo Tew, Gregory F Strouse
Abstract: The Standard Platinum Resistance Thermometer (SPRT) is defined by the International Temperature Scale of 1990 (ITS-90) as the interpolating instrument for temperatures between 13.8033 K and 1234.93 K. This SRM concerns the calibration properties of a ...

42. The Role of High-purity Noble Metals in Precision Thermometry
Published: 11/1/2001
Authors: Dean C Ripple, Gregory F Strouse, Weston Leo Tew
Abstract: A variety of alternate calibration schemes which approximate the ITS-90 are possible when using high-purity noble metals. The high purity of the sensor materials allows the use of correlations that exist between the measured properties at fixed point ...

43. Archival and Theoretical Considerations for Isotopic Dependence in the e-H^d2^ Fixed Points
Published: 6/1/2001
Authors: F Pavese, Weston Leo Tew, A G Steele
Abstract: We examine these isotopic dependence for the case of the e-H2 triple point (TP), and the two vapor pressure (VP) points of the ITS-90 defined near 33 kPa and 101 kPa. The archival experimental data allows predictions to be made for the shift in the T ...

44. Special Problems When Realising the Triple Point of Hydrogen as a Defining Fixed Point of the ITS-90
Published: 6/1/2001
Authors: B Fellmuth, D I Head, F Pavese, A Szmyrka-Grzebyk, Weston Leo Tew
Abstract: The two special problems, which appear when realising the triple point of hydrogen as a temperature fixed point due to the influences of the deuterium content and the catalyst, have been investigated by filling a large number of sealed triple-point c ...

45. The Kelvin and Temperature Measurements
Series: Journal of Research (NIST JRES)
Published: 1/1/2001
Authors: Billy Wilson Mangum, G T. Furukawa, Kenneth Gruber Kreider, Christopher W Meyer, Dean C Ripple, Gregory F Strouse, Weston Leo Tew, Robert D. Saunders, Bettye C Johnson, Howard W Yoon, Michael R Moldover, Charles E Gibson
Abstract: The International Temperature Scale of 1990 (ITS90) is defined from 0.65 K upwards to the highest temperature measurable by spectral radiation thermometry, the radiation thermometry being based on the Planck radiation law. Part I of this paper descr ...

46. Non-Uniquenes of the ITS-90 From 13.8033 K to 24.5561 K
Published: 6/1/1999
Authors: Christopher W Meyer, Gregory F Strouse, Weston Leo Tew
Abstract: The International Temperature Scale of 1990 (ITS-90) is defined in the region 3.0 K to 24.5561 K by an interpolating constant volume gas thermometer (ICVGT) that is calibrated at three specified fixed points. From 13.8033 K to 1234.93 K the ITS-90 i ...

47. A Revised Assessment of Calibration Uncertainties for Capsule Type Standard Platinum and Rhodium-Iron Resistance Thermometers
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6138
Published: 3/1/1998
Authors: Weston Leo Tew, Gregory F Strouse, Christopher W Meyer
Abstract: Calibration uncertainties for capsule type standard platinum and rhodium-iron resistance thermometers are reviewed and updated. Calibration procedures, thermometer characteristics, scale realization methods, and measurement techniques are described ...

48. Recent Advances in the Realization and Dissemination of the ITS-90 below 83.8K at NIST
Published: 2/13/1998
Authors: Weston Leo Tew, Christopher W Meyer, Gregory F Strouse, G T. Furukawa

49. The Capsule-Type Standard Platinum Resistance Thermometer as a Standard Reference Material: SRM 1750
Published: 2/12/1998
Authors: Weston Leo Tew, Gregory F Strouse

50. A Flux Locked Current Source Reference
Published: 4/1/1993
Authors: Weston Leo Tew, Edwin Ross Williams

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Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series