Publications Portal

You searched on:
Author: john suehle

Displaying records 151 to 160 of 175 records.
Resort by: Date / Title

151. Field and Temperature Acceleration of Time-Dependent Dielectric Breakdown in Intrinsic Thin SiO^d2^
Published: 12/31/1994
Authors: John S Suehle, P Chaparala, C. Messick, W Wyatt Miller, K. C. Boyko
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=16710

152. High Temperature Reliability of Thin Film SiO^d2^
Published: 12/31/1994
Authors: John S Suehle, P Chaparala, C. Messick
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=16462

153. Micro-Hotplate Gas Sensor
Published: 12/31/1994
Authors: Richard E Cavicchi, John S Suehle, P Chaparala, Kenneth Gruber Kreider, Michael Gaitan, Stephen Semancik
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=7417

154. Microhotplate Temperature Control for Sensor Fabrication, Study and Operation
Published: 12/31/1994
Authors: Richard E Cavicchi, John S Suehle, P Chaparala, G. Poirier, Kenneth Gruber Kreider, Michael Gaitan, Stephen Semancik
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27749

155. Reproducibility of JEDEC Standard Current and Voltage Ramp Test Procedures for Thin-Dielectric Breakdown Characterization
Published: 12/31/1994
Author: John S Suehle
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=6304

156. The Interaction of Stoichiometry, Mechanical Stress and Interface Trap Density in LPCVD Si-Rich SiNx-Si Structures
Published: 12/31/1994
Authors: S C Witczak, Michael Gaitan, John S Suehle, M. C. Peckerar, M T Ma
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=13850

157. JEDEC
Published: 12/1/1994
Authors: Harry A. Schafft, John S Suehle, John Albers
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27128

158. Multijunction Thermal Converters by Commercial CMOS Fabrication
Published: 12/31/1993
Authors: Michael Gaitan, John S Suehle, Joseph R Kinard, D. X. Huang
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27847

159. Breakdown Mechanism in Buried Silicon Oxide Films
Published: 9/1/1993
Authors: Santos D Mayo, John S Suehle, Peter Roitman
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=6440

160. Tin Oxide Gas Sensor Fabricated Using CMOS Micro-Hotplates and In-Situ Processing
Published: 1/20/1993
Authors: John S Suehle, Richard E Cavicchi, Michael Gaitan, Stephen Semancik
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=26461