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Author: john suehle

Displaying records 151 to 160 of 179 records.
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151. TDDB Characterization of Thin SiO^d2^ Films With Bimodal Failure Populations
Published: 12/31/1995
Authors: J. Prendergast, John S Suehle, P Chaparala, E. Murphy, M. Stephenson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=1929

152. Time-Dependent Dielectric Breakdown in Thin Intrinsic SiO^d2^ Films
Published: 12/31/1995
Authors: John S Suehle, P Chaparala
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=899

153. Growth of SnO^d2^ Films on Micromachined Hotplates
Published: 2/13/1995
Authors: Richard E Cavicchi, John S Suehle, Kenneth Gruber Kreider, B. L. Shomaker, John A Small, Michael Gaitan, P Chaparala
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=15497

154. Experimental Investigation of the Validity of TDDB Voltage Acceleration Models
Published: 12/31/1994
Authors: John S Suehle, P Chaparala, C. Messick, W Wyatt Miller, K. C. Boyko
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=18788

155. Field and Temperature Acceleration of Time-Dependent Dielectric Breakdown in Intrinsic Thin SiO^d2^
Published: 12/31/1994
Authors: John S Suehle, P Chaparala, C. Messick, W Wyatt Miller, K. C. Boyko
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=16710

156. High Temperature Reliability of Thin Film SiO^d2^
Published: 12/31/1994
Authors: John S Suehle, P Chaparala, C. Messick
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=16462

157. Micro-Hotplate Gas Sensor
Published: 12/31/1994
Authors: Richard E Cavicchi, John S Suehle, P Chaparala, Kenneth Gruber Kreider, Michael Gaitan, Stephen Semancik
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=7417

158. Microhotplate Temperature Control for Sensor Fabrication, Study and Operation
Published: 12/31/1994
Authors: Richard E Cavicchi, John S Suehle, P Chaparala, G. Poirier, Kenneth Gruber Kreider, Michael Gaitan, Stephen Semancik
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27749

159. Reproducibility of JEDEC Standard Current and Voltage Ramp Test Procedures for Thin-Dielectric Breakdown Characterization
Published: 12/31/1994
Author: John S Suehle
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=6304

160. The Interaction of Stoichiometry, Mechanical Stress and Interface Trap Density in LPCVD Si-Rich SiNx-Si Structures
Published: 12/31/1994
Authors: S C Witczak, Michael Gaitan, John S Suehle, M. C. Peckerar, M T Ma
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=13850



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