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Author: john suehle

Displaying records 141 to 150 of 179 records.
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141. Time-Dependent Dielectric Breakdown of Intrinsic SiO^d2^ Films Under Dynamic Stress
Published: 12/31/1996
Authors: P Chaparala, John S Suehle, C. Messick, M. Roush
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=7153

142. Optimized Temperature Pulse Sequence for the Enhancement of Chemically-Specific Response Patterns from Micro-hotplate Gas Sensors
Published: 12/1/1996
Authors: Richard E Cavicchi, John S Suehle, Kenneth Gruber Kreider, Michael Gaitan, P Chaparala
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100282

143. Selected-Area Deposition of Multiple Active Films for Conductometric Microsensor Arrays
Published: 12/1/1996
Authors: Stephen Semancik, Richard E Cavicchi, Kenneth Gruber Kreider, John S Suehle, P Chaparala
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100321

144. Optimized Temperature Pulse Sequence for the Enhancement of Chemically-Specific Response Patterns from Micro-Hotplate Gas Sensors
Published: 7/1/1996
Authors: Richard E Cavicchi, John S Suehle, K. E. Kreider, Michael Gaitan, P Chaparala
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=8646

145. Accelerated Tests for Simulating Low Dose Rate Gain Degradation of Lateral and Substrate PNP Bipolar Junction Transistors
Published: 1/1/1996
Authors: S C Witczak, R D Schrimpf, K F Galloway, D M Fleetwood, R L Pease, James M Puhl, D M Schmidt, W R Combs, John S Suehle
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103400

146. A New Physics-Based Model for Time-Dependent-Dielectric-Breakdown
Published: 12/31/1995
Authors: B. Schlund, John S Suehle, C. Messick, P Chaparala
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=8356

147. An Electrical Method for Determining the Thickness of Metal Films and the Cross-Sectional Area of Metal Lines
Published: 12/31/1995
Authors: Harry A. Schafft, Santos D Mayo, Samuel N Jones, John S Suehle
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14447

148. Fast Temperature Programmed Sensing for Micro-Hotplate Gas Sensors
Published: 12/31/1995
Authors: Richard E Cavicchi, John S Suehle, Kenneth Gruber Kreider, Michael Gaitan, P Chaparala
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=15372

149. OBIC Analysis of Stressed, Thermally Isolated Polysilicon Resistors
Published: 12/31/1995
Authors: E. I. Cole, John S Suehle, K. A. Peterson, P Chaparala, A. N. Campbell, E. S. Snyder, D T Pierce
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=11237

150. Selected Area Deposition of Multiple Active Films for Conductometric Microsensor Arrays
Published: 12/31/1995
Authors: Stephen Semancik, Richard E Cavicchi, John S Suehle, Kenneth Gruber Kreider, P Chaparala
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14742



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