NIST logo

Publications Portal

You searched on:
Author: stephan stranick

Displaying records 31 to 34.
Resort by: Date / Title

31. Enhanced Near-Field Raman Spectroscopy
Published: Date unknown
Authors: C EJ Dentinger, Stephan J Stranick, Lee J Richter, Richard R Cavanagh
Abstract: Near-field Raman spectroscopy can be used to obtain chemical specificity with the subwavelength spatial resolution of near-field scanning optical microscopy (NSOM). We report detailed measurements of near-field Raman spectra from a single crystal di ...

32. Growth of Vertical ZnO Nanowires on c-Plane Sapphire
Published: Date unknown
Authors: Babak Nikoobakht, Albert Davydov, Stephan J Stranick
Abstract: Well oriented vertical ZnO nanowires (NWs) were grown on c-plane sapphire via a vapor-phase transport process using an Au thin film as a catalyst. This new finding is novel and unexpected due to the fact that the lattice mismatch between the zinc oxi ...

33. Nanoscale Chemical Imaging With Scanning Near-Field Infrared Microscopy
Published: Date unknown
Authors: Chris A Michaels, Stephan J Stranick, Lee J Richter, Richard R Cavanagh
Abstract: The development of a near-field microscope that utilizes infrared absorption as the optical contrast mechanism will be described. This instrument couples the nanoscale spatial resolution of a scanning probe microscope with the chemical specificity of ...

34. Selective Growth of Zinc Oxide Nanodots and Nanowires on Silicon
Published: Date unknown
Authors: Babak Nikoobakht, J Batteas, Stephan J Stranick
Abstract: Zinc oxide (ZnO) nanowires and nanodots have been selectively grown on silicon surfaces using a vapor-phase transport process. The ZnO growth process was investigated in the presence of gold in the form of thin films and periodic arrays of islands. ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series