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Author: john stoup

Displaying records 11 to 20 of 32 records.
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11. Enhanced Capabilities of the NIST Fiber Probe for Microfeature Metrology
Published: 1/1/2006
Authors: Balasubramanian Muralikrishnan, Jack A Stone Jr, John Richard Stoup
Abstract: We have previously reported work in the area of fiber probe development at NIST for micro feature measurement. This probe, which we refer to as the Fiber Deflection Probe, functions by optically imaging the stem from two orthogonal directions a few m ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823213

12. Fiber Deflection Probe Uncertainty Analysis for Micro Holes
Published: 1/1/2006
Authors: Balasubramanian Muralikrishnan, Jack A Stone Jr, John Richard Stoup
Abstract: We have recently reported on a new probe, the Fiber Deflection Probe (FDP), for diameter and form measurement of large aspect ratio micro-holes (100 um nominal diameter, 5 mm deep). In this paper, we briefly review the measurement principle of the FD ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823200

13. Fiber Deflection Probe for Small Hole Metrology
Published: 1/1/2006
Authors: Balasubramanian Muralikrishnan, Jack A Stone Jr, John Richard Stoup
Abstract: This paper presents the development of a new probing method for Coordinate Measuring Machines (CMM) to inspect diameter and form of small holes. The technique, referred to as fiber deflection probing, can be used for holes of approximately 100 mm nom ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822250

14. Form-Profiling of Optics Using the Geometry Measuring Machine and NIST M-48 CMM
Published: 1/1/2006
Authors: Nadia Machkour-Deshayes, John Richard Stoup, John Lu, Johannes A Soons, Ulf Griesmann, Robert S. Polvani
Abstract: We are developing an instrument, the Geometry Measuring Machine (GEMM), to measure the profile errors of aspheric and free form optical surfaces, which require measurement uncertainties near 1nm. Using GEMM, an optical profile is reconstructed from ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822545

15. A Fiber Probe for CMM Measurements of Small Features
Published: 8/1/2005
Authors: Jack A Stone Jr, Balasubramanian Muralikrishnan, John Richard Stoup
Abstract: We report on performance of a new form of fiber probe, which can be used in conjunction with a coordinate measuring machine (CMM) for microfeature measurement.  The probe stylus is a glass fiber with a small ball (?75 ?m diameter) glued to the e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823194

16. Measuring Internal Geometry of Fiber Ferrules
Published: 5/1/2005
Authors: Balasubramanian Muralikrishnan, Jack A Stone Jr, John Richard Stoup
Abstract: The focus of this paper is on the metrology of microstructures. Traditional Coordinate Measuring Machines (CMM) are limited to measuring holes of 300 m diameter. Smaller features and holes require thinner styli & novel probing technologies th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824599

17. Micro-Feature Metrology
Published: 5/1/2005
Authors: Balasubramanian Muralikrishnan, Jack A Stone Jr, John Richard Stoup
Abstract: This presentation focuses on three aspects of micro-feature metrology novel applications that drive research and commercialization, capabilities and limitations of existing sensors and techniques, and finally a summary of recent research including on ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823208

18. New Capabilities At NIST In Dimensional Metrology
Published: 1/1/2005
Authors: Theodore D Doiron, Eric S Stanfield, Bryon S. Faust, John Richard Stoup, Mary Abbott
Abstract: A number of new or revised services in dimensional metrology are presented.  Included are: a lower cost, high accuracy calibration for sphere diameter; reduced uncertainty in roundness calibration; a new instrument for measurement of the thermal ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823188

19. Fiber Deflection Probe for Small Hole Measurements
Published: 10/1/2004
Authors: Balasubramanian Muralikrishnan, Jack A Stone Jr, John Richard Stoup, S C Vemuri, C Sahay, A Potluri
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823178

20. Measurements of Large Silicon Spheres Using the NIST M48 Coordinate Measuring Machine
Published: 11/1/2003
Authors: John Richard Stoup, Theodore D Doiron
Abstract: The NIST M48 coordinate measuring machine (CMM) was used to measure the average diameter of two precision, silicon spheres of nominal diameter near 93.6 mm. A measurement technique was devised that took advantage of the specific strengths of the mach ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822026



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