Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publications Portal

You searched on: Author: jack stone jr Sorted by: title

Displaying records 1 to 10 of 57 records.
Resort by: Date / Title

1. A Differential Wavelength Meter for Laser Tuning
Published: 1/1/1997
Authors: Lowell P. Howard, Jack A Stone Jr.
Abstract: A simple interferometer for matching the wavelengths of tunable lasers is described. Our interferometer uses the angular dispersion of a diffraction grating at the Littrow angle to produce a tilted wavefront with respect to a reference mirror in an o ...

2. A Fiber Probe for CMM Measurements of Small Features
Published: 8/1/2005
Authors: Jack A Stone Jr., Balasubramanian Muralikrishnan, John Richard Stoup
Abstract: We report on performance of a new form of fiber probe, which can be used in conjunction with a coordinate measuring machine (CMM) for microfeature measurement.  The probe stylus is a glass fiber with a small ball (?75 ?m diameter) glued to the e ...

3. A Simple Technique for Observing Fringe Interpolation Errors in Michelson Interferometers
Published: 10/1/1998
Authors: Jack A Stone Jr., Lowell P. Howard
Abstract: We describe a simple, convenient method for measuring nonlinearities in displacement-measuring Michelson interferometers. Nonlinearities with a spatial periodicity of one optical fringe are a well-known source of error in precision interferometry. Ou ...

4. Absolute Distance Interferometry with a 670-nm External Cavity Diode Laser
Published: 10/1/1999
Authors: Jack A Stone Jr., Alois Stejskal, Lowell P. Howard
Abstract: Diode lasers are becoming increasingly important in length metrology. In particular, the tunability of diode lasers makes them attractive for applications such as absolute distance interferometry (ADI). In this paper we describe the current status of ...

5. Absolute Interferometry With a 670 nm External Cavity Diode Laser
Published: 10/1/1999
Authors: Jack A Stone Jr., Alois Stejskal, Lowell P. Howard
Abstract: In the last few years there has been much interest in the use of tunable diode lasers for absolute interferometry. Here we report on the use of an external cavity diode laser operating in the visible ({lambda}{approximately} 670 nm) for absolute dis ...

6. Absolute refractometry of dry gas to {+ or -}3 parts in 10^u9^
Published: 6/20/2011
Authors: Patrick F Egan, Jack A Stone Jr.
Abstract: We present a method of measuring the refractive index of dry gases absolutely at 632.8 nm wavelength using a Fabry-Perot cavity with an expanded uncertainty of < 3 {multiply} 10^u-9^ (coverage factor {I}k{/I} = 2. The main contribution to this uncer ...

7. Advice from the CCL on the use of unstabilized lasers as standards of wavelength: the helium-neon laser at 633 nm
Published: 1/1/2009
Authors: Jack A Stone Jr., Jennifer Decker, Patrick Gill, Andrew Lewis, Patrick Juncar, Daniele Rovera, Miguel Villiseid
Abstract: The Consultative Committee for Length has recommended that red (633 nm) unstabilized Helium-Neon lasers, operating on the 3s2¿_2p4 transition, should be included in the list of standard frequencies for realization of the meter. This article discusses ...

8. An Optical Frequency Comb Tied to GPS for Laser Frequency/Wavelength Calibration
Published: 11/1/2010
Authors: Jack A Stone Jr., Patrick F Egan
Abstract: Optical frequency combs can be employed over a broad spectral range to calibrate laser frequency or vacuum wavelength. This article describes procedures and techniques utilized in the Precision Engineering Division of NIST (National Institute of Sta ...

9. Angle Metrology Using AAMACS and Two Small-Angle Measurement Systems
Published: 11/28/2003
Authors: Jack A Stone Jr., M Amer, Bryon S. Faust, Jay H Zimmerman
Abstract: The highest accuracy method for angle measurement employed at NIST(National Institute of Standards and Technology) makes use of an automated stack of three indexing tables-- our Advanced Automated Master Angle Calibration System (AAMACS)-- in conjunc ...

10. Area Measurement of Knife Edge and Cylindrical Apertures using Ultra Low Force Contact Fiber Probe on a CMM
Published: 1/1/2008
Authors: Balasubramanian Muralikrishnan, Jack A Stone Jr., John Richard Stoup
Abstract: Several radiometric and photometric measurements depend on high accuracy area measurement of precision apertures. Some apertures have sharp edges and are generally measured optically. At the Precision Engineering Division (PED) of the National Instit ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series