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You searched on: Author: jack stone jr

Displaying records 41 to 50 of 57 records.
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41. The Advanced Angle Metrology System at NIST
Published: 11/1/2003
Author: Jack A Stone Jr.
Abstract: At the National Institute of Standards and Technology, our best capability for angle measurement is our Advanced Automated Master Angle Calibration System (AAMACS). This instrument is based on a triple-stack of indexing tables, used in conjunction w ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823171

42. Index of Refraction of Air
Published: 2/16/2001
Authors: Jack A Stone Jr., Jay H Zimmerman
Abstract: These Web pages are intended primarily as a computational tool that can be used to calculate the refractive index of air for a given wavelength of light and given atmospheric conditions (air temperature, pressure, and humidity). The calculations are ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823138

43. Real-Time Displacement Measurements With a Fabry-Perot Cavity and a Diode Laser
Published: 1/1/2000
Authors: Lowell P. Howard, Jack A Stone Jr.
Abstract: We present the basic operating principles of a traceable measurement system for use with scanned probe microscopes and nanometer-resolution displacement sensors. Our method is based upon a tunable external-cavity diode laser system which is Pound-Dre ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820963

44. Absolute Distance Interferometry with a 670-nm External Cavity Diode Laser
Published: 10/1/1999
Authors: Jack A Stone Jr., Alois Stejskal, Lowell P. Howard
Abstract: Diode lasers are becoming increasingly important in length metrology. In particular, the tunability of diode lasers makes them attractive for applications such as absolute distance interferometry (ADI). In this paper we describe the current status of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820952

45. Absolute Interferometry With a 670 nm External Cavity Diode Laser
Published: 10/1/1999
Authors: Jack A Stone Jr., Alois Stejskal, Lowell P. Howard
Abstract: In the last few years there has been much interest in the use of tunable diode lasers for absolute interferometry. Here we report on the use of an external cavity diode laser operating in the visible ({lambda}{approximately} 670 nm) for absolute dis ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823111

46. Diode Lasers in Length Metrology: Application to Absolute Distance Interferometry
Published: 1/1/1999
Authors: Jack A Stone Jr., Lowell P. Howard, Alois Stejskal
Abstract: Diode lasers are becoming increasingly important in length metrology. In particular, the tunability of diode lasers makes them attractive for applications such as absolute distance interferometry (ADI). In this paper we describe the current status of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820953

47. Sources of Error in Absolute Distance Interferometry
Published: 1/1/1999
Authors: Jack A Stone Jr., Alois Stejskal, Lowell P. Howard
Abstract: In this paper we describe the status of our research on the use of diode lasers for absolute distance interferometry, and we discuss the major sources of uncertainty that limit the accuracy of this technique for distance measurement. We have primaril ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820951

48. A Simple Technique for Observing Fringe Interpolation Errors in Michelson Interferometers
Published: 10/1/1998
Authors: Jack A Stone Jr., Lowell P. Howard
Abstract: We describe a simple, convenient method for measuring nonlinearities in displacement-measuring Michelson interferometers. Nonlinearities with a spatial periodicity of one optical fringe are a well-known source of error in precision interferometry. Ou ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820913

49. Testing Displacement-Measuring Interferometer Systems
Published: 1/1/1998
Authors: Jack A Stone Jr., Martin Schroeck, Michael T. Stocker
Abstract: We have made a study of one method for testing displacement-measuring interferometer systems, a modified back-to-back comparison, that automatically compensates for changes in the optical path length between the two interferometers.  Although th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823081

50. A Differential Wavelength Meter for Laser Tuning
Published: 1/1/1997
Authors: Lowell P. Howard, Jack A Stone Jr.
Abstract: A simple interferometer for matching the wavelengths of tunable lasers is described. Our interferometer uses the angular dispersion of a diffraction grating at the Littrow angle to produce a tilted wavefront with respect to a reference mirror in an o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820845



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