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You searched on: Author: jack stone jr

Displaying records 41 to 50 of 55 records.
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41. Real-Time Displacement Measurements With a Fabry-Perot Cavity and a Diode Laser
Published: 1/1/2000
Authors: Lowell P. Howard, Jack A Stone Jr.
Abstract: We present the basic operating principles of a traceable measurement system for use with scanned probe microscopes and nanometer-resolution displacement sensors. Our method is based upon a tunable external-cavity diode laser system which is Pound-Dre ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820963

42. Absolute Distance Interferometry with a 670-nm External Cavity Diode Laser
Published: 10/1/1999
Authors: Jack A Stone Jr., Alois Stejskal, Lowell P. Howard
Abstract: Diode lasers are becoming increasingly important in length metrology. In particular, the tunability of diode lasers makes them attractive for applications such as absolute distance interferometry (ADI). In this paper we describe the current status of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820952

43. Absolute Interferometry With a 670 nm External Cavity Diode Laser
Published: 10/1/1999
Authors: Jack A Stone Jr., Alois Stejskal, Lowell P. Howard
Abstract: In the last few years there has been much interest in the use of tunable diode lasers for absolute interferometry. Here we report on the use of an external cavity diode laser operating in the visible ({lambda}{approximately} 670 nm) for absolute dis ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823111

44. Diode Lasers in Length Metrology: Application to Absolute Distance Interferometry
Published: 1/1/1999
Authors: Jack A Stone Jr., Lowell P. Howard, Alois Stejskal
Abstract: Diode lasers are becoming increasingly important in length metrology. In particular, the tunability of diode lasers makes them attractive for applications such as absolute distance interferometry (ADI). In this paper we describe the current status of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820953

45. Sources of Error in Absolute Distance Interferometry
Published: 1/1/1999
Authors: Jack A Stone Jr., Alois Stejskal, Lowell P. Howard
Abstract: In this paper we describe the status of our research on the use of diode lasers for absolute distance interferometry, and we discuss the major sources of uncertainty that limit the accuracy of this technique for distance measurement. We have primaril ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820951

46. A Simple Technique for Observing Fringe Interpolation Errors in Michelson Interferometers
Published: 10/1/1998
Authors: Jack A Stone Jr., Lowell P. Howard
Abstract: We describe a simple, convenient method for measuring nonlinearities in displacement-measuring Michelson interferometers. Nonlinearities with a spatial periodicity of one optical fringe are a well-known source of error in precision interferometry. Ou ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820913

47. Testing Displacement-Measuring Interferometer Systems
Published: 1/1/1998
Authors: Jack A Stone Jr., Martin Schroeck, Michael T. Stocker
Abstract: We have made a study of one method for testing displacement-measuring interferometer systems, a modified back-to-back comparison, that automatically compensates for changes in the optical path length between the two interferometers.  Although th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823081

48. A Differential Wavelength Meter for Laser Tuning
Published: 1/1/1997
Authors: Lowell P. Howard, Jack A Stone Jr.
Abstract: A simple interferometer for matching the wavelengths of tunable lasers is described. Our interferometer uses the angular dispersion of a diffraction grating at the Littrow angle to produce a tilted wavefront with respect to a reference mirror in an o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820845

49. Benchmarking the Length Measurement Capabilities of the National Institute of Standards and Technology
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6036
Published: 1/1/1997
Authors: Richard M Silver, J Land, Jack A Stone Jr., Ronald G Dixson, Bryon S. Faust, James Edward Potzick, Michael T Postek, et al
Abstract: A cross-section of measurements from the Precision Engineering Division within the National Institute of Standards and Technology is benchmarked against other leading National Measurement Institutes. We present a variety of length-related calibration ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820872

50. Corrections for Wavelength Variations in Precision Interferometric Displacement Measurements
Published: 9/1/1996
Authors: Jack A Stone Jr., Steven David Phillips, G Mandolfo
Abstract: Precision interferometric displacement measurements require deadpath corrections to account for variations in wavelength during the course of the measurement. This paper discusses common errors in applying deadpath corrections and describes the corre ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820824



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