NIST logo

Publications Portal

You searched on:
Author: jolene splett

Displaying records 21 to 30 of 33 records.
Resort by: Date / Title


21. Uncertainty in Reference Values for the Charpy V-notch Verification Program
Published: 5/1/2005
Authors: Jolene D Splett, Chih-Ming Wang
Abstract: We present a method for computing the combined standard uncertainty for reference values used in the Charpy machine verification program administered by the National Institute of Standards and Technology. The technique is compliant with the ISO GUM ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50807

22. Nonlinear Modeling of Tunnel Diode Detectors
Published: 9/24/2004
Authors: David K Walker, Kevin J Coakley, Jolene D Splett
Abstract: We investigate the sensitivity and nonlinear properties of a tunnel diode microwave detector as functions of the input power and the load impedance presented at the detector's output. We compare the two-tone method estimate of nonlinearity with preci ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31739

23. Measuring residual resistivity ratio of high-purity Nb
Published: 7/27/2004
Authors: Loren Frederick Goodrich, Theodore C Stauffer, Jolene D Splett, Dominic F. (Dominic F.) Vecchia
Abstract: We compared methods of measuring the residual resistivity ratio (RRR) of high-purity Nb using transport current. Our experimental study is intended to answer some fundamental questions about the best measurement for RRR and the biases that may exist ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31484

24. Estimation of Q-Factors and Resonant Frequencies
Published: 3/1/2003
Authors: Kevin J Coakley, Jolene D Splett, Michael D Janezic, R F Kaiser
Abstract: We estimate the quality factor Q and resonant frequency f^do^ of a microwave cavity based on resonance curve observations on an equally-spaced frequency grid. The observed resonance curve is the squared magnitude of an observed complex scattering pa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151782

25. Estimation of Q-factors and Resonant Factors
Published: 3/1/2003
Authors: Kevin J Coakley, Jolene D Splett, Michael D Janezic, Raian K. Kaiser
Abstract: We estimate the quality factor Q and resonant frequency f^d0^ of a microwave cavity based on resonance curve observations on an equally-spaced frequency grid. The observed resonance curve is the squared magnitude of an observed complex scattering par ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31477

26. Accuracy of AlGaAs Growth Rates and Composition Determination Using RHEED Oscillations
Published: 1/1/2003
Authors: Todd E Harvey, Kristine A Bertness, Robert K. Hickernell, C. M. Wang, Jolene D Splett
Abstract: We investigate the sources of uncertainty in the measurement of the reflection high-energy electron diffraction (RHEED) intensity oscillations during growth of AlAs, GaAs, and AlGaAs on GaAs substrates, and the resulting effects on predicted growth r ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30844

27. Accuracy of AlGaAs Rates and Composition Determination Using RHEED Oscillations
Published: 9/1/2002
Authors: Todd E Harvey, Kristine A Bertness, Chih-Ming Wang, Jolene D Splett
Abstract: Reflection high-energy electron diffraction (RHEED) oscillations are widely used in molecular beam epitaxy (MBE) as a technique to calibrate material growth rates. The growth rates are used to predict the composition of the following growth run. For ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30092

28. Transfer Standard for the Spectral Density of Relative Intensity Noise of Optical Fiber Sources Near 1550 nm
Published: 6/1/2001
Authors: Gregory E. Obarski, Jolene D Splett
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14730

29. NIST Measurement Services: Measurement Assurance Program for the Spectral Density of Relative Intensity Noise of Optical Fiber Sources Near 1550 nm
Series: Special Publication (NIST SP)
Report Number: 250-57
Published: 9/1/2000
Authors: Gregory E. Obarski, Jolene D Splett
Abstract: This paper provides the documentation to establish a measurement assurance program (MAP) for the spectral density of relative intensity noise (RIN) of optical sources. A standard is made available to industry for high-precision calibration of RIN me ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30285

30. Robust Statistical Analysis of Vector Network Analyzer Intercomparisons
Published: 5/1/1999
Authors: Robert M. Judish, Jolene D Splett
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=28575



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series