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Author: jolene splett
Displaying records 21 to 30 of 31 records.
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21.
Nonlinear Modeling of Tunnel Diode Detectors
Published: 9/24/2004
Authors: David K Walker, Kevin J Coakley, Jolene D Splett
Abstract: We investigate the sensitivity and nonlinear properties of a tunnel diode microwave detector as functions of the input power and the load impedance presented at the detector's output. We compare the two-tone method estimate of nonlinearity with preci
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31739
22.
Measuring residual resistivity ratio of high-purity Nb
Published: 7/27/2004
Authors: Loren F Goodrich, Theodore C Stauffer, Jolene D Splett, Dominic Frank Vecchia
Abstract: We compared methods of measuring the residual resistivity ratio (RRR) of high-purity Nb using transport current. Our experimental study is intended to answer some fundamental questions about the best measurement for RRR and the biases that may exist
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31484
23.
Estimation of Q-Factors and Resonant Frequencies
Published: 3/1/2003
Authors: Kevin J Coakley, Jolene D Splett, Michael D Janezic, R F Kaiser
Abstract: We estimate the quality factor Q and resonant frequency f^do^ of a microwave cavity based on resonance curve observations on an equally-spaced frequency grid. The observed resonance curve is the squared magnitude of an observed complex scattering pa
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151782
24.
Estimation of Q-factors and Resonant Factors
Published: 3/1/2003
Authors: Kevin J Coakley, Jolene D Splett, Michael D Janezic, Raian K. Kaiser
Abstract: We estimate the quality factor Q and resonant frequency f^d0^ of a microwave cavity based on resonance curve observations on an equally-spaced frequency grid. The observed resonance curve is the squared magnitude of an observed complex scattering par
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31477
25.
Accuracy of AlGaAs Growth Rates and Composition Determination Using RHEED Oscillations
Published: 1/1/2003
Authors: Todd E Harvey, Kristine A Bertness, Robert K. Hickernell, C. M. Wang, Jolene D Splett
Abstract: We investigate the sources of uncertainty in the measurement of the reflection high-energy electron diffraction (RHEED) intensity oscillations during growth of AlAs, GaAs, and AlGaAs on GaAs substrates, and the resulting effects on predicted growth r
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30844
26.
Accuracy of AlGaAs Rates and Composition Determination Using RHEED Oscillations
Published: 9/1/2002
Authors: Todd E Harvey, Kristine A Bertness, Chih-Ming Wang, Jolene D Splett
Abstract: Reflection high-energy electron diffraction (RHEED) oscillations are widely used in molecular beam epitaxy (MBE) as a technique to calibrate material growth rates. The growth rates are used to predict the composition of the following growth run. For
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30092
27.
Transfer Standard for the Spectral Density of Relative Intensity Noise of Optical Fiber Sources Near 1550 nm
Published: 6/1/2001
Authors: Gregory E. Obarski, Jolene D Splett
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14730
28.
NIST Measurement Services: Measurement Assurance Program for the Spectral Density of Relative Intensity Noise of Optical Fiber Sources Near 1550 nm
Series: Special Publication (NIST SP)
Report Number: 250-57
Published: 9/1/2000
Authors: Gregory E. Obarski, Jolene D Splett
Abstract: This paper provides the documentation to establish a measurement assurance program (MAP) for the spectral density of relative intensity noise (RIN) of optical sources. A standard is made available to industry for high-precision calibration of RIN me
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30285
29.
Robust Statistical Analysis of Vector Network Analyzer Intercomparisons
Published: 5/1/1999
Authors: Robert M. Judish, Jolene D Splett
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=28575
30.
Developing a NIST Coaxial Microwave Power Standard at 1 mW
Published: 8/1/1994
Authors: Fred R. Clague, Jolene D Splett
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=23836