NIST logo

Publications Portal

You searched on:
Author: johannes soons

Displaying records 11 to 20 of 43 records.
Resort by: Date / Title

11. Graphene Epitaxial Growth on SiC(0001) for Resistance Standards
Published: 6/1/2012
Authors: Mariano A. Real, Tian T. Shen, George R Jones, Randolph E Elmquist, Johannes A Soons, Albert Davydov
Abstract: Epitaxial growth of graphene layers on 6H-SiC(0001) substrates have been studied in order to improve graphene‰s performance for metrological applications. A face-to-face (FTF) sublimation method at 2000 °C and in Ar background atmosphere is used to i ...

12. Stylus Tip-Size Effect on the Calibration of Periodic Roughness Specimens with Rectangular Profiles
Published: 3/21/2012
Authors: Thomas B Renegar, Johannes A Soons, Balasubramanian Muralikrishnan, John S Villarrubia, Xiaoyu A Zheng, Theodore Vincent Vorburger, Jun-Feng Song
Abstract: Stylus instruments are widely used for surface characterization. It is well known that the size and shape of the stylus tip affects the measured surface geometry and parameters. In most cases, increasing the tip size decreases the measured Ra value b ...

13. Variability in the Geometric Accuracy of Additively Manufactured Test Parts
Published: 8/9/2010
Authors: April Lynne Cooke, Johannes A Soons
Abstract: Results of a study on the variability in the geometric accuracy of a metal test part manufactured by several service providers using either electron beam or laser based powder bed thermal fusion processes are described. The part was a circle-diamond- ...

14. Deformation-Free Form Error Measurements of Thin, Plane-Parallel Optics Floated on a Heavy Liquid
Published: 4/1/2010
Authors: JiYoung Chu, Ulf Griesmann, Quandou Wang, Johannes A Soons, Eric C Benck
Abstract: We describe a novel method for measuring the unconstrained flatness error of thin, plane parallel precision optics by floating them on high-density aqueous metatungstate solutions while measuring the flatness error with an interferometer. The supp ...

15. Development of a metrology frame to improve the positioning accuracy of micro/meso-scale machine tools
Published: 8/3/2009
Authors: Shawn P Moylan, Daehie Hong, Bradley N Damazo, Johannes A Soons, M Alkan Donmez
Abstract: The small size of the work volume of micro/meso-scale machine tools often presents problems for calibration and error compensation, but at the same time provides opportunity for solutions not practical on the traditional scale. Measuring tool positi ...

16. Impact of automation on precision
Published: 8/3/2009
Authors: M Alkan Donmez, Johannes A Soons
Abstract: Automation has significant impacts on the economy and the development and use of technology. In this section, the impacts of automation on precision, which directly influences science, technology, and the economy, are discussed. As automation enabl ...

17. Machining Process Measurements: A Titanium Machining Example
Published: 6/4/2009
Authors: Richard L. Rhorer, Eric Paul Whitenton, Timothy J Burns, Steven P Mates, Jarred C. Heigel, April Lynne Cooke, Johannes A Soons, Robert W Ivester
Abstract: NOTE: This is a two-page abstract for publication in the CD-ROM conference proceedings only. Oral presentation of the complete paper will be presented at the conference (SEM, June 1-4, 2009, Albuquerque). This paper discusses recent results of stud ...

18. Computer-Generated Hologram Cavity Interferometry Test for Large X-Ray Mandrels: Design
Published: 6/1/2009
Authors: Guangjun Gao, John P. Lehan, William W. Zhang, Ulf Griesmann, Johannes A Soons
Abstract: A glancing incidence interferometric test for large x-ray mirror mandrels, using two computer generated holograms (CGH s), is described. The two CGH s are used to form a double pass glancing incidence system. One layout of the CGH-cavity glancing in ...

19. Stationary and non-stationary deformations in three-flat tests
Published: 7/7/2008
Authors: Ulf Griesmann, Quandou Wang, Nicolas Laurenchet, Johannes A Soons
Abstract: Calibration procedures for optical reference flats of phase-shifting interferometers (three-flat tests) are critically important if flatness measurements with low uncertainty are desired. In these tests, all combinations of three flats with unknown f ...

20. Three-Flat Test Solutions Including Mounting-Induced Deformations
Published: 9/1/2007
Authors: Ulf Griesmann, Quandou Wang, Johannes A Soons
Abstract: We investigate three-flat calibration methods for circular flats, based on rotation symmetry and mirror symmetry, for absolute interferometric flatness measurements in the presence of deformations caused by the support mechanism for the flats, which ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series