NIST logo

Publications Portal

You searched on:
Author: jun-feng song

Displaying records 81 to 90 of 124 records.
Resort by: Date / Title


81. Capability in Rockwell C Scale Hardness
Published: 7/1/2000
Authors: Walter S Liggett Jr, Samuel Rea Low III, David J Pitchure, Jun-Feng Song
Abstract: A measurement system is capable if it produces measurements with uncertainties small enough for demonstration of compliance with product specifications. To establish the capability of a system for Rockwell C scale hardness, one must assess measuremen ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821003

82. Proposed Bullet Signature Comparisons Using Autocorrelation Functions
Published: 7/1/2000
Authors: Jun-Feng Song, Theodore Vincent Vorburger
Abstract: The National Institute of Standards and Technology (NIST) standard bullets and casings are intended as reference standards for crime laboratories to help verify that the computerized optical-imaging equipment in those laboratories is operating proper ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820981

83. An Overview of Nano-Micro-Meso Scale Manufacturing at the NIST
Published: 3/13/2000
Authors: E Amatucci, Nicholas G Dagalakis, Bradley N Damazo, Matthew A. Davies, John Evans, Jun-Feng Song, E Clayton Teague, Theodore Vincent Vorburger
Abstract: The future of nano-, micro- and meso-scale manufacturing operations will be strongly influenced by a new breed of assembly and manufacturing tools that will be intelligent, flexible, more precise, include in-process production technologies and make u ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822451

84. An Overview of Nano-Micro-Meso Scale Manufacturing at the National Institute of Standards and Technology (NIST)
Published: 3/1/2000
Authors: E Amatucci, Nicholas G Dagalakis, Bradley N Damazo, Matthew A. Davies, John Evans, Jun-Feng Song
Abstract: The future of Nano, Micro and Meso Scale manufacturing operations will be strongly influenced by a new breed of assembly and manufacturing tools that will be intelligent, flexible, more precise, include in-process production technologies and make ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820665

85. A Fast Algorithm for Determining the Gaussian Filter Mean Line in Surface Metrology
Published: 1/1/2000
Authors: Y B Yuan, X F Qiang, Jun-Feng Song, Theodore Vincent Vorburger
Abstract: A fast algorithm for assessing the Gaussian filtered mean line was deduced using the central limit theorem and an approximation method. This algorithm only uses simple computer operations such as addition, subtraction and digit shifting, and avoids ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823110

86. A Fast Algorithm for Determining the Gaussian Filtered Mean Line in Surface Metrology
Published: 1/1/2000
Authors: Y B Yuan, X F Qiang, Jun-Feng Song, Theodore Vincent Vorburger
Abstract: A fast algorithm for assessing the Gaussian filtered mean line was deduced using the central limit theorem and an approximation method. This algorithm only uses simple computer operations such as addition, subtraction and digit shifting, and avoids c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820993

87. A Simplified Realization for the Gaussian Filter in Surface Metrology
Published: 1/1/2000
Authors: Y B Yuan, Theodore Vincent Vorburger, Jun-Feng Song, Thomas B Renegar
Abstract: A simplified realization for the Gaussian filter in surface metrology is presented in this paper. The sampling function sinu/u is used for simplifying the Gaussian function. According to the central limit theorem, when n approaches infinity, the f ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820991

88. An Overview of Nano-Micro-Meso Scale Manufacturing at NIST
Published: 1/1/2000
Authors: E Clayton Teague, Jun-Feng Song, Bradley N Damazo, John Evans, Matthew A. Davies, Nicholas G Dagalakis
Abstract: The Manufacturing Engineering Laboratory (MEL) has a unique mission of discrete part manufacturing technology within the National Institute of Standards and Technology''s (NIST) mission of measurement, standards, data and infrastructure technology. S ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821917

89. Experimental Test of Blind Tip Reconstruction for Scanning Probe Microscopy
Published: 1/1/2000
Authors: Samuel Dongmo, John S Villarrubia, Samuel N Jones, Thomas B Renegar, Michael T Postek, Jun-Feng Song
Abstract: Determination of the tip geometry is a prerequisite to converting the scanning probe microscope (SPM) from a simple imaging instrument to a tool that can perform width measurements accurately. Recently we developed blind reconstruction, a method to c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820960

90. NIST Random Profile Roughness Specimens and Standard Bullets
Published: 1/1/2000
Authors: Jun-Feng Song, Theodore Vincent Vorburger, Christopher J. Evans, Michael L McGlauflin, Eric Paul Whitenton, Robert A. Clary
Abstract: Based on the numerical controlled (NC) diamond turning process used previously for manufacturing random profile roughness specimens, two prototype standard bullets were developed at the National Institute of Standards and Technology (NIST). These sta ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822457



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series