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You searched on: Author: jun-feng song

Displaying records 81 to 90 of 125 records.
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81. Capability in Rockwell C Scale Hardness
Series: Journal of Research (NIST JRES)
Published: 7/1/2000
Authors: Walter S Liggett Jr, Samuel Rea Low III, David J Pitchure, Jun-Feng Song
Abstract: To determine the capability of a system for Rockwell C scale hardness, one must make test measurements, which can be planned and interpreted as explained in this paper. Uncertainty, which is one part of capability, is treated specifically, and produ ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151752

82. Capability in Rockwell C Scale Hardness
Published: 7/1/2000
Authors: Walter S Liggett Jr, Samuel Rea Low III, David J Pitchure, Jun-Feng Song
Abstract: A measurement system is capable if it produces measurements with uncertainties small enough for demonstration of compliance with product specifications. To establish the capability of a system for Rockwell C scale hardness, one must assess measuremen ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821003

83. Proposed Bullet Signature Comparisons Using Autocorrelation Functions
Published: 7/1/2000
Authors: Jun-Feng Song, Theodore Vincent Vorburger
Abstract: The National Institute of Standards and Technology (NIST) standard bullets and casings are intended as reference standards for crime laboratories to help verify that the computerized optical-imaging equipment in those laboratories is operating proper ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820981

84. An Overview of Nano-Micro-Meso Scale Manufacturing at the NIST
Published: 3/13/2000
Authors: E Amatucci, Nicholas G Dagalakis, Bradley N Damazo, Matthew A. Davies, John Evans, Jun-Feng Song, E Clayton Teague, Theodore Vincent Vorburger
Abstract: The future of nano-, micro- and meso-scale manufacturing operations will be strongly influenced by a new breed of assembly and manufacturing tools that will be intelligent, flexible, more precise, include in-process production technologies and make u ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822451

85. An Overview of Nano-Micro-Meso Scale Manufacturing at the National Institute of Standards and Technology (NIST)
Published: 3/1/2000
Authors: E Amatucci, Nicholas G Dagalakis, Bradley N Damazo, Matthew A. Davies, John Evans, Jun-Feng Song
Abstract: The future of Nano, Micro and Meso Scale manufacturing operations will be strongly influenced by a new breed of assembly and manufacturing tools that will be intelligent, flexible, more precise, include in-process production technologies and make ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820665

86. A Fast Algorithm for Determining the Gaussian Filter Mean Line in Surface Metrology
Published: 1/1/2000
Authors: Y B Yuan, X F Qiang, Jun-Feng Song, Theodore Vincent Vorburger
Abstract: A fast algorithm for assessing the Gaussian filtered mean line was deduced using the central limit theorem and an approximation method. This algorithm only uses simple computer operations such as addition, subtraction and digit shifting, and avoids ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823110

87. A Fast Algorithm for Determining the Gaussian Filtered Mean Line in Surface Metrology
Published: 1/1/2000
Authors: Y B Yuan, X F Qiang, Jun-Feng Song, Theodore Vincent Vorburger
Abstract: A fast algorithm for assessing the Gaussian filtered mean line was deduced using the central limit theorem and an approximation method. This algorithm only uses simple computer operations such as addition, subtraction and digit shifting, and avoids c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820993

88. A Simplified Realization for the Gaussian Filter in Surface Metrology
Published: 1/1/2000
Authors: Y B Yuan, Theodore Vincent Vorburger, Jun-Feng Song, Thomas B Renegar
Abstract: A simplified realization for the Gaussian filter in surface metrology is presented in this paper. The sampling function sinu/u is used for simplifying the Gaussian function. According to the central limit theorem, when n approaches infinity, the f ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820991

89. An Overview of Nano-Micro-Meso Scale Manufacturing at NIST
Published: 1/1/2000
Authors: E Clayton Teague, Jun-Feng Song, Bradley N Damazo, John Evans, Matthew A. Davies, Nicholas G Dagalakis
Abstract: The Manufacturing Engineering Laboratory (MEL) has a unique mission of discrete part manufacturing technology within the National Institute of Standards and Technology''s (NIST) mission of measurement, standards, data and infrastructure technology. S ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821917

90. Experimental Test of Blind Tip Reconstruction for Scanning Probe Microscopy
Published: 1/1/2000
Authors: Samuel Dongmo, John S Villarrubia, Samuel N Jones, Thomas B Renegar, Michael T Postek, Jun-Feng Song
Abstract: Determination of the tip geometry is a prerequisite to converting the scanning probe microscope (SPM) from a simple imaging instrument to a tool that can perform width measurements accurately. Recently we developed blind reconstruction, a method to c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820960



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