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Author: jun-feng song

Displaying records 111 to 120 of 124 records.
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111. Stylus Flight in Surface Profiling
Published: 1/1/1996
Authors: Jun-Feng Song, Theodore Vincent Vorburger
Abstract: In this paper, theoretical and experimental work on stylus flight is described. Experiments on the surfaces of different roughness specimens with sinusoidal, rectangular, triangular and random waveforms support the theoretical model, which predicts s ...

112. Uncertainty Procedure for NIST Surface Finish and Microform Calibration
Published: 1/1/1996
Authors: Jun-Feng Song, Theodore Vincent Vorburger
Abstract: An uncertainty procedure is used for reporting the NIST surface finish and microform calibration uncertainties. The combined standard uncertainty is a combination of the uncertainty from the geometric non-uniformity of the measured surface, and the u ...

113. Stylus Technique for Direct Verification of Rockwell Diamond Indenters
Published: 11/23/1995
Authors: Jun-Feng Song, F Rudder, Theodore Vincent Vorburger, J Smith
Abstract: Based on a stylus technique, a microform calibration system was developed at NIST for the direct verification of Rockwell diamond indenters. The least-squares radius and profile deviations, cone angle and cone flank straightness, and the holder axis ...

114. Microform Calibration Uncertainties of Rockwell Diamond Indenters
Published: 9/1/1995
Authors: Jun-Feng Song, F Rudder, Theodore Vincent Vorburger, J Smith
Abstract: National and international comparisons in Rockwell hardness tests show significant differences. Uncertainties in the geometry of the Rockwell diamond indenters are largely responsible for these differences. By using a stylus instrument, with a series ...

115. Microform Calibrations in Surface Metrology
Published: 2/1/1995
Authors: Jun-Feng Song, F Rudder, Theodore Vincent Vorburger, A Hartman, Brian R Scace, J Smith
Abstract: Microform calibrations include the measurement of complex profile forms and position errors of micrometer scale in combination with the measurement of deviations from a specified profile and surface texture of profile segments. Tolerances on the prof ...

116. A Metrology Approach to Unifying Rockwell C Hardness Scales
Published: 1/1/1995
Authors: Jun-Feng Song, J Smith, Theodore Vincent Vorburger
Abstract: Current Rockwell C hardness scales (HRC) are unified by performance comparisons. Unless a reliable metrology approach is used for the direct verification of standard hardness machines and diamond indenters, the unified hardness scale may exhibit a sy ...

117. Calibration Uncertainties for Microform of Rockwell Hardness Indenters
Published: 1/1/1995
Authors: F Rudder, Jun-Feng Song
Abstract: A microform calibration procedure has been developed at NIST to certify geometric conformity of Rockwell C hardness indenters. The interest in microform calibrations is to unify national and international comparisons of hardness tests. Using accepted ...

118. Development of Rockwell Hardness Standards: From Performance Comparisons to Fundamental Metrology
Published: 1/1/1995
Authors: J Smith, Jun-Feng Song, F Rudder, Theodore Vincent Vorburger
Abstract: Based on the Rockwell diamond indenter's microform calibrations recently developed at NIST, as well as a deadweight standardized Rockwell hardness machine, the NIST Rockwell hardness standard calibration has been established. Our approach makes i ...

119. Working and Check Standards for NIST Surface and Microform Measurements
Published: 1/1/1995
Authors: Jun-Feng Song, Theodore Vincent Vorburger
Abstract: Different working standards and check standards are used in the NIST surface and microform measurement laboratory for calibrating instruments, establishing measurement traceability and control measurement uncertainty. The basic requirements for these ...

120. Methods Divergence Between Measurements of Micrometer and Sub-Micrometer Surface Features
Published: 1/1/1994
Authors: T Mcwaid, Theodore Vincent Vorburger, Joseph Fu, Jun-Feng Song, Eric Paul Whitenton
Abstract: Measurements of micrometer and sub-micrometer surface features have been made using a stylus profiler, an STM, an AFM, and a phase-measuring interferometric microscope. The differences between measurements of the same surface feature as obtained with ...

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