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Displaying records 101 to 110 of 129 records.
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101. Measurement Traceability to NIST Standard Rockwell Diamond Indenters
Published: 6/1/1999
Author: Jun-Feng Song
Abstract: A metrology-based Rockwell hardness scale is established by a standard machine and a standard diamond indenter. Both must be established through force and dimensional metrology with acceptably small measurement uncertainties. In 1994, NIST developed ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820949

102. High Accuracy High Speed Gaussian Filter in Surface Metrology
Published: 5/31/1999
Authors: Y B Yuan, Jun-Feng Song, Theodore Vincent Vorburger
Abstract: Both (1+x^2)^(-n) and (sin x/x)^n functions are very close to the Gaussian distribution for large value of n. Based on these functions, two new algorithms are developed for designing high accuracy and high speed recursive type Gaussian digital filter ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820955

103. NIST Microform Calibration - How Does It Benefit U.S. Industry?
Published: 10/1/1998
Authors: Jun-Feng Song, Theodore Vincent Vorburger
Abstract: In microform metrology, complex 3-D surface features in the micrometer range must be quantified for their space and size including dimensions, curves, angles, profile deviations, and alignment errors, as well as surface roughness with measurement unc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823109

104. NIST Virtual/Physical Random Profile Roughness Calibration Standards
Published: 10/1/1998
Authors: Jun-Feng Song, Christopher J. Evans, Michael L McGlauflin, Eric Paul Whitenton, Theodore Vincent Vorburger, Y B Yuan
Abstract: The NIST (National Institute of Standards and Technology) virtual/physical surface roughness calibration standard consists of physical specimens whose surfaces are manufactured by a numerically controlled diamond-turning process using digitized profi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820910

105. Tip Characterization for Scanned Probe Microscope Width Metrology
Published: 3/1/1998
Authors: Samuel Dongmo, John S Villarrubia, Samuel N Jones, Thomas B Renegar, Michael T Postek, Jun-Feng Song
Abstract: Determination of the tip shape is an important prerequisite for converting the various scanning probe microscopies form imaging tools into dimensional metrology tools with sufficient accuracy to meet the critical dimension measurement requirements of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823092

106. Advances in NIST Standard Rockwell Diamond Indenters
Published: 1/1/1998
Authors: Jun-Feng Song, Samuel Rea Low III, David J Pitchure, Theodore Vincent Vorburger
Abstract: Recent developments in standard hardness machines and microform calibration techniques have made it possible to establish a worldwide unified Rockwell hardness scale with metrological traceability. This includes the establishments of the reference st ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820911

107. Measurement Traceability of NIST Standard Rockwell Diamond Indenters
Published: 1/1/1998
Authors: Jun-Feng Song, Samuel Rea Low III, Walter S Liggett Jr, David J Pitchure, Theodore Vincent Vorburger
Abstract: A metrology-based Rockwell hardness scale is established by a standard machine and a standard diamond indenter. Both must be established through force and dimensional metrology with acceptably small measurement uncertainties. In 1994, NIST develope ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823113

108. NIST Microform Calibration - How It Benefits U.S. Industry
Published: 1/1/1998
Authors: Jun-Feng Song, Theodore Vincent Vorburger
Abstract: In microform metrology, complex 3-D surface features in the micrometer range must be quantified for their space and size including dimensions, curves, angles, profile deviations, and alignment errors, as well as surface roughness with measure uncerta ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820912

109. Establishing a Common Rockwell Hardness Scale Using Geometrically Calibrated Standard Diamond Indenters
Published: 1/1/1997
Author: Jun-Feng Song
Abstract: Recently developed microform measurement techniques have reduced the measurement uncertainties in the geometry of Rockwell diamond indenters. In this paper, we describe several intercomparisons to determine if tightly controlled indenter geometry ca ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820874

110. Establishing a Worldwide Unified Rockwell Hardness Scale With Metrology Traceability
Published: 1/1/1997
Authors: Jun-Feng Song, Samuel Rea Low III, David J Pitchure, A Germak, S Desogus, T Polzin, H Yang, H Ishida, G Barbato
Abstract: Recently developed microform measurement techniques have reduced the measurement uncertainties in the geometry of Rockwell diamond indenters. It is now possible to establish standard grade Rockwell diamond indenters characterized by high geometry un ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820876



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