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You searched on: Author: jun-feng song

Displaying records 91 to 100 of 130 records.
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91. A Fast Algorithm for Determining the Gaussian Filter Mean Line in Surface Metrology
Published: 1/1/2000
Authors: Y B Yuan, X F Qiang, Jun-Feng Song, Theodore Vincent Vorburger
Abstract: A fast algorithm for assessing the Gaussian filtered mean line was deduced using the central limit theorem and an approximation method. This algorithm only uses simple computer operations such as addition, subtraction and digit shifting, and avoids ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823110

92. A Fast Algorithm for Determining the Gaussian Filtered Mean Line in Surface Metrology
Published: 1/1/2000
Authors: Y B Yuan, X F Qiang, Jun-Feng Song, Theodore Vincent Vorburger
Abstract: A fast algorithm for assessing the Gaussian filtered mean line was deduced using the central limit theorem and an approximation method. This algorithm only uses simple computer operations such as addition, subtraction and digit shifting, and avoids c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820993

93. A Simplified Realization for the Gaussian Filter in Surface Metrology
Published: 1/1/2000
Authors: Y B Yuan, Theodore Vincent Vorburger, Jun-Feng Song, Thomas B Renegar
Abstract: A simplified realization for the Gaussian filter in surface metrology is presented in this paper. The sampling function sinu/u is used for simplifying the Gaussian function. According to the central limit theorem, when n approaches infinity, the f ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820991

94. An Overview of Nano-Micro-Meso Scale Manufacturing at NIST
Published: 1/1/2000
Authors: E Clayton Teague, Jun-Feng Song, Bradley N Damazo, John Evans, Matthew A. Davies, Nicholas G Dagalakis
Abstract: The Manufacturing Engineering Laboratory (MEL) has a unique mission of discrete part manufacturing technology within the National Institute of Standards and Technology''s (NIST) mission of measurement, standards, data and infrastructure technology. S ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821917

95. Experimental Test of Blind Tip Reconstruction for Scanning Probe Microscopy
Published: 1/1/2000
Authors: Samuel Dongmo, John S Villarrubia, Samuel N Jones, Thomas B Renegar, Michael T Postek, Jun-Feng Song
Abstract: Determination of the tip geometry is a prerequisite to converting the scanning probe microscope (SPM) from a simple imaging instrument to a tool that can perform width measurements accurately. Recently we developed blind reconstruction, a method to c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820960

96. NIST Random Profile Roughness Specimens and Standard Bullets
Published: 1/1/2000
Authors: Jun-Feng Song, Theodore Vincent Vorburger, Christopher J. Evans, Michael L McGlauflin, Eric Paul Whitenton, Robert A. Clary
Abstract: Based on the numerical controlled (NC) diamond turning process used previously for manufacturing random profile roughness specimens, two prototype standard bullets were developed at the National Institute of Standards and Technology (NIST). These sta ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822457

97. NIST Random Profile Roughness Specimens and Standard Bullets
Published: 1/1/2000
Authors: Jun-Feng Song, Theodore Vincent Vorburger, Robert A. Clary, Michael L McGlauflin, Eric Paul Whitenton, Christopher J. Evans
Abstract: Based on the numerical controlled (NC) diamond turning process used previously for manufacturing random profile roughness specimens, two prototype standard bullets were developed at the National Institute of Standards and Technology (NIST). These sta ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820982

98. Project Report (1998-99) of NIST Standard Bullets and Casings (National Institute of Standards and Technology, Gaithersburg, MD)
Published: 1/1/2000
Authors: Jun-Feng Song, Theodore Vincent Vorburger
Abstract: Abstract not available.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901995

99. Rockwell Hardness - A Method-Dependent Standard Reference Material
Published: 7/1/1999
Authors: Samuel Rea Low III, R J. Gettings, Walter S Liggett Jr, Jun-Feng Song
Abstract: Rockwell hardness is not a fundamental physical property of a material. It is a method-dependent measurement of the deformation of the material to an applied force. There are no alternative measurement systems to directly or independently measure R ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852924

100. Rockwell Hardness - A Method-Dependent Standards Reference Material
Published: 7/1/1999
Authors: Samuel Rea Low III, R Gettings, Walter S Liggett Jr, Jun-Feng Song
Abstract: Rockwell hardness is a method-dependent measurement of the deformation of a material in response to an applied force. It is not a fundamental physical property of a material. There are no alternative measurement systems to directly or independently m ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820937



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