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Author: jun-feng song

Displaying records 91 to 100 of 116 records.
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91. NIST Virtual/Physical Random Profile Roughness Calibration Standards
Published: 10/1/1998
Authors: Jun-Feng Song, Christopher J. Evans, Michael L McGlauflin, Eric P Whitenton, Theodore Vincent Vorburger, Y B Yuan
Abstract: The NIST (National Institute of Standards and Technology) virtual/physical surface roughness calibration standard consists of physical specimens whose surfaces are manufactured by a numerically controlled diamond-turning process using digitized profi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820910

92. Tip Characterization for Scanned Probe Microscope Width Metrology
Published: 3/1/1998
Authors: Samuel Dongmo, John S Villarrubia, Samuel N Jones, Thomas B Renegar, Michael T Postek, Jun-Feng Song
Abstract: Determination of the tip shape is an important prerequisite for converting the various scanning probe microscopies form imaging tools into dimensional metrology tools with sufficient accuracy to meet the critical dimension measurement requirements of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823092

93. Advances in NIST Standard Rockwell Diamond Indenters
Published: 1/1/1998
Authors: Jun-Feng Song, Samuel Rea Low III, David J Pitchure, Theodore Vincent Vorburger
Abstract: Recent developments in standard hardness machines and microform calibration techniques have made it possible to establish a worldwide unified Rockwell hardness scale with metrological traceability. This includes the establishments of the reference st ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820911

94. Measurement Traceability of NIST Standard Rockwell Diamond Indenters
Published: 1/1/1998
Authors: Jun-Feng Song, Samuel Rea Low III, Walter S Liggett Jr, David J Pitchure, Theodore Vincent Vorburger
Abstract: A metrology-based Rockwell hardness scale is established by a standard machine and a standard diamond indenter. Both must be established through force and dimensional metrology with acceptably small measurement uncertainties. In 1994, NIST develope ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823113

95. NIST Microform Calibration - How It Benefits U.S. Industry
Published: 1/1/1998
Authors: Jun-Feng Song, Theodore Vincent Vorburger
Abstract: In microform metrology, complex 3-D surface features in the micrometer range must be quantified for their space and size including dimensions, curves, angles, profile deviations, and alignment errors, as well as surface roughness with measure uncerta ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820912

96. Establishing a Common Rockwell Hardness Scale Using Geometrically Calibrated Standard Diamond Indenters
Published: 1/1/1997
Author: Jun-Feng Song
Abstract: Recently developed microform measurement techniques have reduced the measurement uncertainties in the geometry of Rockwell diamond indenters. In this paper, we describe several intercomparisons to determine if tightly controlled indenter geometry ca ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820874

97. Establishing a Worldwide Unified Rockwell Hardness Scale With Metrology Traceability
Published: 1/1/1997
Authors: Jun-Feng Song, Samuel Rea Low III, David J Pitchure, A Germak, S Desogus, T Polzin, H Yang, H Ishida, G Barbato
Abstract: Recently developed microform measurement techniques have reduced the measurement uncertainties in the geometry of Rockwell diamond indenters. It is now possible to establish standard grade Rockwell diamond indenters characterized by high geometry un ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820876

98. Measurement Comparison of Stylus Radii
Published: 1/1/1997
Authors: Jun-Feng Song, Theodore Vincent Vorburger
Abstract: Three methods were used for measuring the radii of the same stylus of our stylus instrument. The measurement results were compared and showed good agreement. Using razor blade tracing, the stylus radius was measured as r=1.60um with an expanded uncer ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820877

99. The Guidelines for Expressing Measurement Uncertainties and the 4:1 Test Uncertainty Ratio
Published: 1/1/1997
Author: Jun-Feng Song
Abstract: In 1988, MIL-STD-45662A adopted the 4:1 Test Uncertainty Ratio (TUR); this was later incorporated into the ANSI/NCSL Z540-1 standard in 1994. However, in 1992, the National Institute of Standards and Technology (NIST) began to adopt a new method for ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820875

100. Stylus-Laser Surface Calibration System
Published: 10/1/1996
Authors: Theodore Vincent Vorburger, Jun-Feng Song, T Giauque, Thomas B Renegar, Eric P Whitenton, M Croarkin
Abstract: A stylus-laser surface calibration system was developed to calibrate the NIST sinusoidal roughness Standard Reference Materials (SRM) 2071-2075. Step height standards are used to calibrate the stylus instrument in the vertical direction, and a laser ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820830