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You searched on: Author: john small

Displaying records 21 to 30 of 36 records.
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21. Improving the Accuracy of Particle Analysis
Published: 7/1/2000
Authors: John A Small, J R Michael, Dale E Newbury
Abstract: Historically the procedures for the quantitative X-ray analysis of particles in the electron probe have been similar to the methods used for bulk electron probe samples.The main difference was that corrections had to be made to the experimental k-rat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831177

22. Phase Identification of Individual Particles by Electron Backscatter Diffraction EBSD
Published: 12/1/1999
Authors: John A Small, J R Michael
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100663

23. Restrictor Plugging in Off-Line Supercritical Fluid Extraction of Environmental Samples Microscopic, Chemical, and Spectroscopic Evaluations
Published: 12/1/1999
Authors: S. H. Page, Bruce A Benner Jr, John A Small, Steven J Choquette
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100659

24. SRM 2806 (ISO Medium Test Dust in Hydraulic Oil): A Particle-Contamination Standard Reference Material for the Fluid Power Industry
Published: 8/1/1999
Authors: Robert A Fletcher, Jennifer R Verkouteren, Eric S Windsor, David Seymour Bright, Eric B Steel, John A Small, Walter S Liggett Jr
Abstract: Standard Reference material (SRM) 2806 is composed of ISO medium test dust (ISO 12103-A3), a mineral dust, suspended in MIL-H-5606 hydraulic oil. SRM 2806 is a traceable particle count standard and is certified for number of particles larger than ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831080

25. Restrictor Plugging in Off-Line Supercritical Fluid Extraction of Environmental Samples: Microscopic, Chemical, and Spectroscopic Evaluations
Published: 3/1/1999
Authors: S. H. Page, Bruce A Benner Jr, John A Small, Steven J Choquette
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100776

26. Heated Inlet Sampling System for Removing Carbonaceous Aersol
Published: 4/1/1998
Authors: Robert A Fletcher, John A Small, Douglas H. Blackburn
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901758

27. The Analysis of Particles with Energy Dispersive X-Ray Spectrometry (EDS)
Published: 2/18/1998
Authors: John A Small, J T. Armstrong, David Seymour Bright, Barbara B. Thorne
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901819

28. In-Situ Conductivity Characterization of Oxide Thin Film Growth Phenomena on Microhotplates
Published: 2/11/1998
Authors: F DiMeo, Richard E Cavicchi, Stephen Semancik, John S Suehle, N H Tea, John A Small, J T. Armstrong, J T Kelliher
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901686

29. Multivariate Statistical Analysis of Particle X-Ray Spectra
Published: 2/10/1998
Authors: Ian M. Anderson, John A Small
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901667

30. The Detection of Low Intensity Peaks in Energy Dispersive X-Ray Spectra From Particles
Published: 1/1/1998
Author: John A Small
Abstract: A critical step in the processing of energy dispersive EDS x-ray spectra from the automated scanning electron microscopy, [ASEM], analysis of particles is the detection and identification of elemental peaks. Since there are often several hundred to ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831046



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