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Author: eric simmon

Displaying records 21 to 30 of 45 records.
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21. Data Modeling to Support Environmental Information Exchange Throughout the Supply Chain
Published: 8/11/2007
Authors: John V Messina, Eric D Simmon
Abstract: With an ever-increasing awareness of the environmental impact of manufacturing, more and more political organizations (countries, states, and unions) are enacting legislation designed to protect the environment. One category of this restrictive legis ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901689

22. RoHS Harmonization - Progress Toward a Single Global Standard?
Published: 7/13/2007
Author: Eric D Simmon
Abstract: The lack of global harmonization of RoHS initiatives has been a major headache for the electronics industry, to say the least. A number of organizations have been working very diligently to move standards closer together, with the hope that at some p ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32711

23. Data Modeling to Support Environmental Information Exchange Throughout the Supply Chain
Published: 7/1/2007
Authors: Eric D Simmon, John V Messina
Abstract: With an ever-increasing awareness of the environmental impact of manufacturing, more and more political organizations (countries, states, and unions) are enacting legislation designed to protect the environment. One category of this restrictive legis ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32621

24. Environmental Regulations Impose New Product Lifecycle Information Requirements
Published: 7/1/2007
Authors: John V Messina, Eric D Simmon, Matthew L Aronoff
Abstract: In a global response to increasing health and environmental concerns, there has been a trend towards governments enacting legislation to encourage sustainable manufacturing where industry creates products that minimize environmental impact. This legi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32620

25. North American Environmental Compliance Attitudes Towards Electronics
Published: 6/6/2007
Authors: Krista Botsford, John V Messina, Eric D Simmon
Abstract: More and more countries are beginning eco-compliance legislation for electronics products. Where does the USA stand? This paper will discuss the following areas and attitudes towards environmental compliance in the USA: levels of legislation, who is ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32693

26. Focus 3D Telemodeling Tool: GUI Design for Iteration 1
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 32470
Published: 9/28/2006
Authors: Matthew L Aronoff, John V Messina, Eric D Simmon
Abstract: The Focus 3D Telemodeling Tool was designed as a novel graphical interface to data modeling for standards development. This paper describes the design intent for the proposed Graphical User Interface (GUI) of Focus -- how users interact with the syst ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32470

27. Intricacies of Time: Demystifying Factory Clock Synchronization and Time Stamping for E-Manufacturing
Published: 9/1/2006
Authors: YaShian Li-Baboud, Harvey Wohlwend, Lance Rist, Eric D Simmon
Abstract: Accurate clock synchronization and time stamping will play an increasingly significant role in ensuring data quality as the semiconductor industry faces an imminent data explosion and increasing pressure for equipment effectiveness. Accurately time-s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32076

28. Sands of Time: An External Stopwatch for Measuring the Timing of Events in a Computer or Distributed Computing Environment
Published: 9/1/2006
Authors: Eric D Simmon, YaShian Li-Baboud, John V Messina
Abstract: Meeting the rising complexity challenges of Advaced Process Control in semiconductor manufacturing requires improvement in the performance of software and networks utilized within the factory. Information must flow expeditiously throughout the APC sy ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32077

29. An External Stopwatch for Measuring the Timing of Events in a Computer or Distributed Computing Environment
Published: 9/24/2005
Authors: Eric D Simmon, YaShian Li-Baboud, John V Messina
Abstract: The semiconductor industry continues to strive for improvements in the fabrication process. The Advanced Process Control (APC) systems supporting the fabrication process are steadily becoming more complex in order to deal with the high levels of auto ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32079

30. Simple UML Modeling to Improve the Development of Information Standards
Published: 9/24/2005
Authors: Eric D Simmon, John V Messina, Arthur Griesser
Abstract: Streamlining and Bulletproofing the Standards Development Process In the increasingly complex semiconductor fabrication environment capturing and transferring information throughout the product development cycle is critical. As the process of creatin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32080



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