NIST logo

Publications Portal

You searched on: Author: eric shirley

Displaying records 11 to 20 of 154 records.
Resort by: Date / Title


11. Exciton Spectroscopy of Hexagonal BN Using Non-Resonant X-Ray Raman Scattering
Published: 4/8/2008
Authors: Y Feng, J A Soininen, A L Ankudinov, J O Cross, G T Seidler, A T Macrander, J J Rehr, Eric L Shirley
Abstract: We report non-resonant x-ray Raman scattering (XRS) measurements from hexagonal BN for transferred momentum from 2 {Angstrom} ^u-1^ to 9 {Angstrom}^u-1^ along directions both in and out of the basal plane. A symmetry-based argument together with cal ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841759

12. Optical to UV spectra and birefringence of SiO2 and TiO2:  first-principles calculations with excitonic effects
Published: 1/1/2008
Authors: H M Lawler, J J Rehr, F Vila, SD Dalosto, Eric L Shirley, Zachary H Levine
Abstract: A first-principles approach is presented for calculations of optical to ultraviolet spectra including excitonic effects.  The approach is based on the Bethe-Salpeter equation calculations using the NBSE code combined with ABINIT.  The appro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842466

13. Two-Phonon Infrared Spectra of Si and Ge: Calculating and Assigning Features
Published: 8/16/2007
Authors: Eric L Shirley, Hadley Lawler
Abstract: Third-order density-functional perturbation theory yields the terahertz/far-infrared absorption spectra for silicon and germanium, including all two-phonon combination and difference features. Temperature-dependent spectra are compared to available ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841089

14. Ferroelectric Distortion in SrTiO3 Thin Films on Si(001) by X-Ray Absorption Fine Structure: Experiment and First-Principles Calculations
Published: 4/23/2007
Authors: Joseph C Woicik, Eric L Shirley, C S Hellberg, S Sambasivan, Daniel A Fischer, B D Chapman, E A Stern, P Ryan, D L Ederer, H Li
Abstract: Ti K and Ti L2,3 edge x-ray absorption fine-structure near-edge spectra of SrTiO3 thin films grown coherently on Si(001) reveal the presence of a ferroelectric (FE) distortion at room temperature. This unique phase is a direct consequence of the com ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851002

15. Higher-Order Boundary-Diffraction-Wave Formulation
Published: 3/11/2007
Author: Eric L Shirley
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841821

16. Ferroelectric distortion in SrTiO3 thin films on Si(001) by x-ray absorption fine structure spectroscopy: Experiment and first-principles calculation
Published: 1/1/2007
Authors: J C Woicik, Eric L Shirley, C S Hellberg, K E Andersen, S Sambasivan, D A Fischer, B D Chapman, E A Stern, P J Ryan, D L Ederer, H Li
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101778

17. Optical Diffraction in Close Proximity to Plane Apertures. IV. Test of a Pseudo-Vectorial Theory
Series: Journal of Research (NIST JRES)
Published: 4/1/2006
Authors: Klaus Mielenz, Eric L Shirley
Abstract: Rayleigh's pseudo-vectorial theory of the diffraction of polarized light by apertures which are small compared to the wavelength of light is analyzed with respect to its mathematical rigor and physical significance. It was found that the results pub ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841911

18. High index optical materials for 193 nm immersion lithography
Published: 1/1/2006
Authors: Simon Grant Kaplan, J H Burnett, Eric L Shirley, D Horowitz, W Clauss, A Grenville, C Van peski
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103909

19. Bethe-Salpeter Treatment of X-Rray Absorption Including Core-Hole Multiplet Effects
Published: 6/1/2005
Author: Eric L Shirley
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841812

20. Diffraction Effects in Radiometry
Published: 1/26/2005
Author: Eric L Shirley
Abstract: This is the draft submitted to be Chapter 10 of the book, Modern Radiometric Practice, edited by Albert C. Parr, Raju U. Datla, and James W. Gardner. This chapter is intended to discussion issues of diffraction effects on radiometric measurements.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841878



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series