NIST logo

Publications Portal

You searched on:
Author: ping-shine shaw
Sorted by: date

Displaying records 1 to 10 of 65 records.
Resort by: Date / Title


1. Using a Tunable Ultraviolet Laser for the Inactivation of Water Pathogens
Published: 9/22/2013
Authors: Thomas C Larason, Keith R Lykke, Ping-Shine Shaw, Lin Chungsan
Abstract: Ultraviolet (UV) radiation effectively inactivates common pathogens found in ground and surface waters such as Cryptosporidium, Giardia, and most bacterial pathogens (e.g. E. coli). Water treatment facilities are now using UV radiation for disinfect ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914548

2. SURF III: A flexible Synchrotron Radiation Source for Radiometry and Research
Published: 9/1/2011
Authors: Uwe Arp, Charles W Clark, Lu Deng, Nadir Sabirovich Faradzhev, Alex P. Farrell, Mitchell L. Furst, Steven E Grantham, Edward Walter Hagley, Shannon Bradley Hill, Thomas B Lucatorto, Ping-Shine Shaw, Charles S Tarrio, Robert Edward Vest
Abstract: The calculability of synchrotron radiation (SR) makes electron storage rings wonderful light sources for radiometry. The broadband nature of SR allows coverage of the whole spectral region from the x-ray to the far-infrared. Compact low-energy storag ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906750

3. Metrologia
Published: 7/8/2011
Authors: Uwe Arp, Zhigang Li, Ping-Shine Shaw, Mathias Richter, Roman Klein, Wolfgang Paustian, Reiner Thornagel
Abstract: We report on a successful bilateral inter-comparison between the Physikalisch-Technische Bundesanstalt (PTB) and the National Institute of Standards and Technology (NIST). In both laboratories deuterium lamps were calibrated using the calculability o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907243

4. Bilateral NIST-PTB Comparison of Spectral Responsivity in the VUV
Published: 1/20/2011
Authors: Uwe Arp, Ping-Shine Shaw, Zhigang Li, Alexander Gottwald, Mathias Richter
Abstract: To compare the calibration capabilities for the spectral responsivity in the vacuum-ultraviolet spectral region between 135 nm and 250 nm, PTB and NIST agreed on a bilateral comparison. Calibrations of semiconductor photodiodes as transfer detectors ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905153

5. Long-Term Monitoring of the Ultraviolet Irradiance Scale at the Facility for Irradiance Calibration Using Synchrotrons
Published: 6/18/2010
Authors: Zhigang Li, Ping-Shine Shaw, Uwe Arp, Charles E Gibson, Howard W Yoon, Keith R Lykke
Abstract: In 2004, the National Institute of Standards and Technology (NIST) established the ultraviolet (UV) spectral irradiance scale from 200 nm to 400 nm using the calculable irradiance of the Synchrotron Ultraviolet Radiation Facility (SURF). Since the es ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904737

6. Internal quantum efficiency modeling of silicon photodiodes
Published: 4/1/2010
Authors: Thomas R Gentile, Steven W Brown, Keith R Lykke, Ping-Shine Shaw, John Taylor Woodward IV
Abstract: Results are presented for modeling of the internal quantum efficiency (IQE) of silicon photodiodes in the 400 nm to 900 nm wavelength range. The IQE data are based on measurements of the external quantum efficiencies of three transmission trap detec ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904680

7. Measurement of the ultraviolet-induced fluorescence yield from integrating spheres
Published: 6/2/2009
Authors: Ping-Shine Shaw, Uwe Arp, Keith R Lykke
Abstract: We report theory and measurements of a simple and absolute technique for the determination of the total emitted spectral fluorescence yield inside an integrating sphere from the sphere coating under irradiation with a monochromatic beam. This techniq ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842602

8. Ultraviolet Characterization of Integrating Spheres
Published: 7/9/2007
Authors: Ping-Shine Shaw, Zhigang Li, Uwe Arp, Keith R Lykke
Abstract: We have studied the performance of integrating spheres in the ultraviolet (UV) with wavelengths as short as 200 nm. Two techniques were used for this study; first, the spectral throughput of an integrating sphere irradiated by a deuterium lamp was an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841052

9. Synchrotron Radiation Based Irradiance Calibration From 200 nm to 400 nm at SURF III
Published: 1/1/2007
Authors: Uwe Arp, Charles E Gibson, Keith R Lykke, Albert C Parr, Robert D. Saunders, D J Shin, Ping-Shine Shaw, Zhigang Li, Howard W Yoon
Abstract: A new facility for measuring source irradiance was commissioned recently at the National Institute of Standards and Technology (NIST). The facility uses the calculable radiation from the Synchrotron Ultraviolet Radiation Facility (SURF III) as the pr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841022

10. Absolute Radiant Flux Measurement of the Angular Distribution of Synchrotron Radiation
Published: 7/11/2006
Authors: Ping-Shine Shaw, Uwe Arp, Keith R Lykke
Abstract: We have measured the absolute radiant flux of synchrotron radiation as a function of the angle above and below the orbital plane with high accuracy at the Synchrotron Ultraviolet Radiation Facility (SURF III) and the results were compared with theore ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840997



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series