NIST logo

Publications Portal

You searched on:
Author: ping-shine shaw

Displaying records 11 to 20 of 67 records.
Resort by: Date / Title


11. Ultraviolet Characterization of Integrating Spheres
Published: 7/9/2007
Authors: Ping-Shine Shaw, Zhigang Li, Uwe Arp, Keith R Lykke
Abstract: We have studied the performance of integrating spheres in the ultraviolet (UV) with wavelengths as short as 200 nm. Two techniques were used for this study; first, the spectral throughput of an integrating sphere irradiated by a deuterium lamp was an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841052

12. Synchrotron Radiation Based Irradiance Calibration From 200 nm to 400 nm at SURF III
Published: 1/1/2007
Authors: Uwe Arp, Charles E Gibson, Keith R Lykke, Albert C Parr, Robert D. Saunders, D J Shin, Ping-Shine Shaw, Zhigang Li, Howard W Yoon
Abstract: A new facility for measuring source irradiance was commissioned recently at the National Institute of Standards and Technology (NIST). The facility uses the calculable radiation from the Synchrotron Ultraviolet Radiation Facility (SURF III) as the pr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841022

13. Absolute Radiant Flux Measurement of the Angular Distribution of Synchrotron Radiation
Published: 7/11/2006
Authors: Ping-Shine Shaw, Uwe Arp, Keith R Lykke
Abstract: We have measured the absolute radiant flux of synchrotron radiation as a function of the angle above and below the orbital plane with high accuracy at the Synchrotron Ultraviolet Radiation Facility (SURF III) and the results were compared with theore ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840997

14. Absolute radiant flux measurement for the angular distribution of synchrotron radiation
Published: 1/1/2006
Authors: Ping-Shine Shaw, Uwe Arp, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104163

15. Absolute radiant flux measurement of the angular distribution of synchrotron radiation,
Published: 1/1/2006
Authors: Ping-Shine Shaw, Uwe Arp, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101711

16. NIST VUV Metrology Programs to Support Space Based Research,
Published: 1/1/2006
Authors: Robert Edward Vest, Yaniv Barad, Mitchell L. Furst, Steven E Grantham, Charles S Tarrio, Ping-Shine Shaw
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101784

17. NIST VUV metrology programs to support space-based research
Published: 1/1/2006
Authors: Robert Edward Vest, Yaniv Barad, Mitchell L. Furst, Steven E Grantham, Charles S Tarrio, Ping-Shine Shaw
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104243

18. UV and VUV radiometry programs at the Synchrotron Ultraviolet Radiation Facility (SURF III)
Published: 1/1/2006
Authors: Zhigang Li, Ping-Shine Shaw, Uwe Arp, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103972

19. Damage to Solid-State Photodiodes by Vacuum Ultraviolet Radiation
Published: 6/1/2005
Authors: Uwe Arp, Ping-Shine Shaw, R Gupta, Keith R Lykke
Abstract: We report experimental results on the stability of photodiodes obtained at three different wavelengths in the vacuum ultraviolet spectral region. Two of these experiments were based on radiation damage inflicted with excimer lasers at 193 nm and 157 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840194

20. Damage to solid-state photodiodes by vacuum ultraviolet radiation
Published: 1/1/2005
Authors: Uwe Arp, R Gupta, L R Lykke, Ping-Shine Shaw
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100986



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series