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Author: gordon shaw
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1. A New Microdevice for SI-Traceable Forces in Atomic Force Microscopy
Published: 6/2/2008
Authors: Gregory W Vogl, Jason John Gorman, Gordon Allan Shaw, Jon Robert Pratt
Abstract: A new self-excited micro-oscillator is proposed as a velocity standard for dissemination of nanoNewton-level forces that are traceable to the International System of Units (SI). The microfabricated oscillator is top-coated with magnetic thin films an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824627

2. A New Oscillator for SI-Traceable Measurements in Atomic Force Microscopy
Published: 5/29/2008
Authors: Gregory W Vogl, Jason John Gorman, Gordon Allan Shaw, Jon Robert Pratt
Abstract: See attached
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824439

3. A New Oscillator for SI-Traceable Measurements in Atomic Force Microscopy
Published: 6/1/2008
Authors: Gregory W Vogl, Jason John Gorman, Gordon Allan Shaw, Jon Robert Pratt
Abstract: See attached.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824441

4. A Piezoresistive Cantilever Force Sensor for Direct AFM Force Calibration
Published: 4/8/2007
Authors: Jon Robert Pratt, John A Kramar, Gordon Allan Shaw, Douglas T Smith, John M Moreland
Abstract: We describe the design, fabrication, and calibration testing of a new piezoresistive cantilever force sensor suitable for the force calibration of atomic force microscopes in a range between tens of nanonewtons to hundreds of micronewtons. The sens ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822731

5. Accurate Noncontact Calibration of Colloidal Probe Sensitivities in Atomic Force Microscopy
Published: 6/15/2009
Authors: Koo-Hyun Chung, Gordon Allan Shaw, Jon Robert Pratt
Abstract: The absolute force sensitivities of colloidal probes comprised of atomic force microscope, or AFM, cantilevers with microspheres attached to their distal ends are measured. The force sensitivities are calibrated through reference to accurate electros ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824677

6. Accurate Picoscale Forces for Insitu Calibration of AFM
Published: 9/3/2009
Authors: Koo-Hyun Chung, Gordon Allan Shaw, Jon Robert Pratt
Abstract: The force sensitivity of an atomic force microscope is calibrated directly using an in situ realization of primary electrostatic forces ranging from 320 pN to 3.3 nN with accuracy of a few percent. The absolute accuracy of a common atomic force micro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904011

7. Calibration of Microfabricated Cantilevers for SI-Traceable Small Force Measurement
Published: 1/1/2006
Authors: Gordon Allan Shaw, Jon Robert Pratt, John A Kramar
Abstract: A procedure is described by which the spring constant of a microfabricated cantilever beam can be calibrated for the measurement of small forces in an atomic force microscope (AFM) or other device. The procedure utilizes dynamic force instrumented i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821950

8. Calibration of dynamic sensors for noncontact-atomic force microscopy
Published: 8/12/2011
Authors: Gordon Allan Shaw, Jon Robert Pratt, Zeina Jabbour Kubarych
Abstract: Access to quantitative information on surface forces in noncontact-atomic force microscopy (NC-AFM) requires the accurate calibration of several key sensor parameters. This work outlines a dynamic method for calibrating the spring constant of tuning ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906206

9. Conceptual Process Planning - A Definition and Functional Decomposition
Published: 8/1/1999
Authors: Shaw C Feng, Gordon Allan Shaw, Yuyun Zhang
Abstract: Conceptual process planning is an activity for designers to evaluate manufacturability and the manufacturing cost in the early design stage for mechanical parts production. Since major manufacturing costs of a product are committed in product specifi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821981

10. Contactless Differential Conductivity Detection
Published: 10/12/2008
Authors: Gordon Allan Shaw, David J Ross, Steven Earl Fick, Wyatt N Vreeland
Abstract: We propose a new technique, contactless differential conductivity detection (CDCD,) to improve the detection limit of contactless conductivity detection for capillary and microchannel electrophoresis. By exploiting a 3-electrode differential configu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824689



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