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Author: gordon shaw
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1. Calibration of dynamic sensors for noncontact-atomic force microscopy
Published: 8/12/2011
Authors: Gordon Allan Shaw, Jon Robert Pratt, Zeina Jabbour Kubarych
Abstract: Access to quantitative information on surface forces in noncontact-atomic force microscopy (NC-AFM) requires the accurate calibration of several key sensor parameters. This work outlines a dynamic method for calibrating the spring constant of tuning ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906206

2. Nanomechanical standards based on the intrinsic mechanics of molecules and atoms
Published: 6/7/2010
Authors: Jon Robert Pratt, Gordon Allan Shaw, Douglas T Smith
Abstract: For more than a decade, instruments based on local probes have allowed us to touch objects at the nanoscale, making it possible for scientists and engineers to probe the electrical, chemical, and physical behaviors of matter at the level of individ ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905416

3. Small mass measurements for tuning fork-based force microscope cantilever spring constant calibration
Published: 6/7/2010
Authors: Gordon Allan Shaw, Jon Robert Pratt, Zeina Jabbour Kubarych
Abstract: Cutting edge mass sensors are capable of discriminating mass changes as small as several dozens of atoms, however the smallest mass commercially available from NIST with a calibration traceable to the International System of Units (SI) is 0.5 mg. To ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905829

4. Quantitative assessment of sample stiffness and sliding friction from force curves in atomic force microscopy
Published: 2/18/2010
Authors: Jon Robert Pratt, Gordon Allan Shaw, Lee Kumanchik, Nancy Burnham
Abstract: It has long been recognized that the angular deflection of a typical atomic force microscope (AFM) cantilever under normal loading conditions can be profoundly influenced by the friction between the tip and the surface. It is shown here, that a rem ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903352

5. Electrochemical Micromachining of Hastelloy B-2 with Ultrashort Voltage Pulses
Published: 9/8/2009
Authors: Gordon Allan Shaw, Joseph J. Maurer, Steven Earl Fick, Thomas P Moffat, J. J. Mallett, John L. Hudson
Abstract: Electrochemical micromachining (ECMM) with ultrashort voltage pulses, a maskless all-electrochemical micro and nanofabrication technique, has been used to fabricate microstructures on a corrosion resistant nickel-based superalloy, Hastelloy B-2. Beca ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901052

6. Accurate Picoscale Forces for Insitu Calibration of AFM
Published: 9/3/2009
Authors: Koo-Hyun Chung, Gordon Allan Shaw, Jon Robert Pratt
Abstract: The force sensitivity of an atomic force microscope is calibrated directly using an in situ realization of primary electrostatic forces ranging from 320 pN to 3.3 nN with accuracy of a few percent. The absolute accuracy of a common atomic force micro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904011

7. Accurate Noncontact Calibration of Colloidal Probe Sensitivities in Atomic Force Microscopy
Published: 6/15/2009
Authors: Koo-Hyun Chung, Gordon Allan Shaw, Jon Robert Pratt
Abstract: The absolute force sensitivities of colloidal probes comprised of atomic force microscope, or AFM, cantilevers with microspheres attached to their distal ends are measured. The force sensitivities are calibrated through reference to accurate electros ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824677

8. Methods for transferring the SI unit of force from millinewtons to piconewtons
Published: 6/1/2009
Authors: Gordon Allan Shaw, Koo-Hyun Chung, Douglas T Smith, Jon Robert Pratt
Abstract: The establishment of standards for small force measurement requires a link to an absolute measurement of force traceable to the international system of units (SI). To this end, a host of different means are being employed by the NIST small force meas ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902346

9. Contactless Differential Conductivity Detection
Published: 10/12/2008
Authors: Gordon Allan Shaw, David J Ross, Steven Earl Fick, Wyatt N Vreeland
Abstract: We propose a new technique, contactless differential conductivity detection (CDCD,) to improve the detection limit of contactless conductivity detection for capillary and microchannel electrophoresis. By exploiting a 3-electrode differential configu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824689

10. SI traceable calibration of an instrumented indentation sensor spring constant using electrostatic force
Published: 9/22/2008
Authors: Koo-Hyun Chung, Stefan Scholz, Gordon Allan Shaw, John A Kramar, Jon Robert Pratt
Abstract: We present a measurement scheme for creating reference electrostatic forces that are traceable to the International System of Units (SI). This scheme yields references forces suitable for calibrating the force sensitivity of instrumented indentation ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823024



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