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1. Optomechanical Motion Sensors
Published: 7/8/2015
Authors: Felipe Guzman, Oliver Gerberding, John T. Melcher, Julian Stirling, Jon Robert Pratt, Gordon Allan Shaw, Jacob M Taylor
Abstract: Compact optical cavities can be combined with motion sensors to yield unprecedented resolution and SI-traceability in areas such as acceleration sensing and atomic force microscopy AFM, among others. We have incorporated Fabry-Perot fiber-optic m ...

2. Accurate Flexural Spring Constant Calibration of Colloid Probe Cantilevers using Scanning Laser Doppler Vibrometry
Published: 5/20/2015
Authors: Richard Swift Gates, William A Osborn, Gordon Allan Shaw
Abstract: Calibration of the flexural spring constant for atomic force microscope colloid probe cantilevers provides significant challenges. The presence of a large attached spherical added mass complicates many of the more common calibration techniques such ...

3. A self-calibrating optomechanical force sensor with femtonewton resolution
Published: 12/10/2014
Authors: John T. Melcher, Julian Stirling, Felipe Guzman, Jon Robert Pratt, Gordon Allan Shaw
Abstract: We report the development of an ultrasensitive optomechanical sensor designed to improve the accuracy and precision of force measurements with atomic force microscopy. The sensors achieve quality factors of 4.3x10^6 (a 100-fold improvement over qua ...

4. Progress toward Radiation-Pressure-Based Measurement of High-Power Laser Emission - Under Policy Review
Published: 10/6/2014
Authors: Paul A Williams, Joshua Aram Hadler, Daniel King, Robert Lee, Frank C. Maring, Gordon Allan Shaw, Nathan A Tomlin, John H Lehman, Marla L Dowell
Abstract: We present an overview of our efforts toward using optical radiation pressure as a means to measure optical power from high-power lasers. Early results with measurements ranging from tens of watts to 92 kW prove the concept, but validation uncertaint ...

5. Calibration of dynamic sensors for noncontact-atomic force microscopy
Published: 8/12/2011
Authors: Gordon Allan Shaw, Jon Robert Pratt, Zeina Jabbour Kubarych
Abstract: Access to quantitative information on surface forces in noncontact-atomic force microscopy (NC-AFM) requires the accurate calibration of several key sensor parameters. This work outlines a dynamic method for calibrating the spring constant of tuning ...

6. Nanomechanical standards based on the intrinsic mechanics of molecules and atoms
Published: 6/7/2010
Authors: Jon Robert Pratt, Gordon Allan Shaw, Douglas T Smith
Abstract: For more than a decade, instruments based on local probes have allowed us to touch objects at the nanoscale, making it possible for scientists and engineers to probe the electrical, chemical, and physical behaviors of matter at the level of individ ...

7. Small mass measurements for tuning fork-based force microscope cantilever spring constant calibration
Published: 6/7/2010
Authors: Gordon Allan Shaw, Jon Robert Pratt, Zeina Jabbour Kubarych
Abstract: Cutting edge mass sensors are capable of discriminating mass changes as small as several dozens of atoms, however the smallest mass commercially available from NIST with a calibration traceable to the International System of Units (SI) is 0.5 mg. To ...

8. Quantitative assessment of sample stiffness and sliding friction from force curves in atomic force microscopy
Published: 2/18/2010
Authors: Jon Robert Pratt, Gordon Allan Shaw, Lee Kumanchik, Nancy Burnham
Abstract: It has long been recognized that the angular deflection of a typical atomic force microscope (AFM) cantilever under normal loading conditions can be profoundly influenced by the friction between the tip and the surface. It is shown here, that a rem ...

9. Electrochemical Micromachining of Hastelloy B-2 with Ultrashort Voltage Pulses
Published: 9/8/2009
Authors: Gordon Allan Shaw, Joseph J. Maurer, Steven Earl Fick, Thomas P Moffat, J. J. Mallett, John L. Hudson
Abstract: Electrochemical micromachining (ECMM) with ultrashort voltage pulses, a maskless all-electrochemical micro and nanofabrication technique, has been used to fabricate microstructures on a corrosion resistant nickel-based superalloy, Hastelloy B-2. Beca ...

10. Accurate Picoscale Forces for Insitu Calibration of AFM
Published: 9/3/2009
Authors: Koo-Hyun Chung, Gordon Allan Shaw, Jon Robert Pratt
Abstract: The force sensitivity of an atomic force microscope is calibrated directly using an in situ realization of primary electrostatic forces ranging from 320 pN to 3.3 nN with accuracy of a few percent. The absolute accuracy of a common atomic force micro ...

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