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You searched on: Author: gordon shaw

Displaying records 21 to 30 of 35 records.
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21. Focused Ion Beam Manufacturing Methods for Nickel-Titanium Shape-Memory Alloy Thin Films
Published: 6/4/2007
Authors: Gordon Allan Shaw, Koo-Hyun Chung, Bin Ming, Andras Vladar
Abstract: Nickel-titanium shape-memory alloy is an interesting and technologically relevant material that can recover large amounts of mechanical strain through a thermally-activated phase transformation. Because of is unusual properties, it has been used wide ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824622

22. Traceable Micro-Force Sensor for Instrumented Indentation Calibration
Published: 4/10/2007
Authors: Douglas T Smith, Gordon Allan Shaw, R M Seugling, D Xiang, Jon Robert Pratt
Abstract: Instrumented indentation testing (IIT), commonly referred to as nanoindentation when small forces are used, is a popular technique for determining the mechanical properties of small volumes of material. Sample preparation is relatively easy, usuall ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824624

23. A Piezoresistive Cantilever Force Sensor for Direct AFM Force Calibration
Published: 4/8/2007
Authors: Jon Robert Pratt, John A Kramar, Gordon Allan Shaw, Douglas T Smith, John M Moreland
Abstract: We describe the design, fabrication, and calibration testing of a new piezoresistive cantilever force sensor suitable for the force calibration of atomic force microscopes in a range between tens of nanonewtons to hundreds of micronewtons. The sens ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822731

24. The Stiffness of Collagen Fibrils Influences Vascular Smooth Muscle Cell Phenotype
Published: 3/1/2007
Authors: Dennis P. McDaniel, Gordon Allan Shaw, John T Elliott, Kiran Bhadriraju, Curtis W Meuse, Koo-Hyun Chung, Anne L Plant
Abstract: Cells receive signals from the extracellular matrix through receptor-dependent interactions, but they are also influenced by the mechanical properties of the matrix. While bulk properties of substrates have been shown to effect cell behavior, we sho ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830514

25. Traceable Micro-Force Calibration for Instrumented Indentation Testing
Published: 2/13/2007
Authors: Douglas T Smith, Gordon Allan Shaw, Richard Seugling, Jon Robert Pratt, Dan Xiang
Abstract: We describe the development, performance and application of an accurate SI-traceable force calibration and verification system for potential use in the field calibration of commercial instrumented indentation testing (IIT) instruments. The system co ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854482

26. SI-Traceable Spring Constant Calibration of Microfabricated Cantilevers for Small Force Measurement
Published: 9/14/2006
Authors: Gordon Allan Shaw, John A Kramar, Jon Robert Pratt
Abstract: A variety of methods exist to measure the stiffness of microfabricated cantilever beams such as those used as mechanical sensors in atomic force microscopy (AFM). In order for AFM to be used as a quantitative small force measurement tool, these meth ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822356

27. New reference standards and artifacts for nanoscale physical property characterization
Published: 7/1/2006
Authors: Jon Robert Pratt, John A Kramar, Gordon Shaw, Richard Gates, Paul Rice, John M Moreland
Abstract: This paper provides an overview of calibration artifacts being developed at the National Institute of Standards and Technology (NIST) that are intended to aid the accurate determination of nanoscale physical properties across a broad range of applica ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32411

28. Calibration of Microfabricated Cantilevers for SI-Traceable Small Force Measurement
Published: 1/1/2006
Authors: Gordon Allan Shaw, Jon Robert Pratt, John A Kramar
Abstract: A procedure is described by which the spring constant of a microfabricated cantilever beam can be calibrated for the measurement of small forces in an atomic force microscope (AFM) or other device. The procedure utilizes dynamic force instrumented i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821950

29. Force Calibration Via Electrostatics
Published: 1/1/2006
Authors: Jon Robert Pratt, John A Kramar, Gordon Allan Shaw, Lee Kumanchik
Abstract: We describe the electrical and length measurements necessary to realize micronewton forces in a fashion consistent with the International System of Units (SI). We first discuss instrumentation and procedures required to accurately characterize an el ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822547

30. New Reference Standards and Artifacts for Nanoscale Physical Property Characterization
Published: 1/1/2006
Authors: Jon Robert Pratt, John A Kramar, Gordon Allan Shaw, Richard Swift Gates, Paul Rice, John M Moreland
Abstract: This paper provides an overview of calibration artifacts being developed at the National Institute of Standards and Technology (NIST) that are intended to aid the accurate determination of nanoscale physical properties across a broad range of applica ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822462



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  • SP 250-XX: Calibration Services
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