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You searched on: Author: gordon shaw

Displaying records 11 to 20 of 32 records.
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11. SI traceable calibration of an instrumented indentation sensor spring constant using electrostatic force
Published: 9/22/2008
Authors: Koo-Hyun Chung, Stefan Scholz, Gordon Allan Shaw, John A Kramar, Jon Robert Pratt
Abstract: We present a measurement scheme for creating reference electrostatic forces that are traceable to the International System of Units (SI). This scheme yields references forces suitable for calibrating the force sensitivity of instrumented indentation ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823024

12. A New Microdevice for SI-Traceable Forces in Atomic Force Microscopy
Published: 6/2/2008
Authors: Gregory W Vogl, Jason John Gorman, Gordon Allan Shaw, Jon Robert Pratt
Abstract: A new self-excited micro-oscillator is proposed as a velocity standard for dissemination of nanoNewton-level forces that are traceable to the International System of Units (SI). The microfabricated oscillator is top-coated with magnetic thin films an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824627

13. Reducing Thermal Noise in Molecular Force Spectroscopy
Published: 6/2/2008
Author: Gordon Allan Shaw
Abstract: Molecular force spectroscopy is the practice of testing the mechanical properties of single molecules.  The precision determination of these properties requires an instrument capable of piconewton-level force measurement.  The atomic force ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824638

14. A New Oscillator for SI-Traceable Measurements in Atomic Force Microscopy
Published: 6/1/2008
Authors: Gregory W Vogl, Jason John Gorman, Gordon Allan Shaw, Jon Robert Pratt
Abstract: See attached.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824441

15. A New Oscillator for SI-Traceable Measurements in Atomic Force Microscopy
Published: 5/29/2008
Authors: Gregory W Vogl, Jason John Gorman, Gordon Allan Shaw, Jon Robert Pratt
Abstract: See attached
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824439

16. Spring constant calibration of AFM cantilevers with a piezosensor transfer standard
Published: 9/24/2007
Authors: Eric Langlois, Gordon Allan Shaw, John A Kramar, Jon Robert Pratt, Donna C. Hurley
Abstract: We describe a method to calibrate the spring constants of cantilevers for atomic force microscopy (AFM). The method makes use of a piezosensor comprised of a piezoresistive cantilever and  accompanying electronics. The piezosensor was calibrated ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824626

17. Direct  Electrostatic Calibration of Hybrid Sensors for Small Force Measurement
Published: 6/4/2007
Authors: Koo-Hyun Chung, Gordon Allan Shaw, Jon Robert Pratt
Abstract: The measurement of forces from piconewtons to millinewtons is an area of interest from both an applied and pure research standpoint, however creating a link between small forces and the International System of Units (SI) has been difficult. In this w ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822725

18. Focused Ion Beam Manufacturing Methods for Nickel-Titanium Shape-Memory Alloy Thin Films
Published: 6/4/2007
Authors: Gordon Allan Shaw, Koo-Hyun Chung, Bin Ming, Andras Vladar
Abstract: Nickel-titanium shape-memory alloy is an interesting and technologically relevant material that can recover large amounts of mechanical strain through a thermally-activated phase transformation. Because of is unusual properties, it has been used wide ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824622

19. Traceable Micro-Force Sensor for Instrumented Indentation Calibration
Published: 4/10/2007
Authors: Douglas T Smith, Gordon Allan Shaw, R M Seugling, D Xiang, Jon Robert Pratt
Abstract: Instrumented indentation testing (IIT), commonly referred to as nanoindentation when small forces are used, is a popular technique for determining the mechanical properties of small volumes of material. Sample preparation is relatively easy, usuall ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824624

20. A Piezoresistive Cantilever Force Sensor for Direct AFM Force Calibration
Published: 4/8/2007
Authors: Jon Robert Pratt, John A Kramar, Gordon Allan Shaw, Douglas T Smith, John M Moreland
Abstract: We describe the design, fabrication, and calibration testing of a new piezoresistive cantilever force sensor suitable for the force calibration of atomic force microscopes in a range between tens of nanonewtons to hundreds of micronewtons. The sens ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822731



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