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Author: david seiler
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1. Bound Hole Excitations in p-Hg^d0.76^Cd^d0.24^Te
Published: 12/31/1990
Authors: Chris L. Littler, M. R. Loloee, W. Zawadzki, David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=11644

2. Business and Manufacturing Motivations for the Development of Analytical Technology and Metrology for Semiconductors
Published: 12/31/1995
Authors: Thomas J. Shaffner, Alain C. Diebold, R. C. McDonald, David G Seiler, W M Bullis
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=25370

3. Challenges of Metrology and Characterization Measurements for ULSI Technology
Published: 1/1/2001
Authors: David G Seiler, Thomas J. Shaffner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30333

4. Characterization and Metrology for ULSI Technology
Published: 11/1/1998
Authors: David G Seiler, Alain C. Diebold, W M Bullis, Thomas J. Shaffner, R. C. McDonald, E. J. Walters
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=1561

5. Characterization and Metrology for ULSI Technology: 2000
Published: 2/1/2001
Authors: David G Seiler, Alain C. Diebold, Thomas J. Shaffner, R. C. McDonald, W M Bullis, P. J. Smith, Erik M Secula
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=11480

6. Characterization and Metrology for ULSI Technology: 2003
Published: 9/30/2003
Authors: David G Seiler, Alain C. Diebold, Thomas J. Shaffner, Robert McDonald, Stefan Zollner, Rajinder P. Khosla, Erik M Secula
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31463

7. Characterization and Metrology for ULSI Technology: 2005
Published: 9/28/2005
Authors: David G Seiler, Alain C. Diebold, Robert McDonald, Caroline Ayre, Rajinder P. Khosla, Stefan Zollner, Erik M Secula
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32093

8. Characterization of LPE HgCdTe Films by Magnetoresistance
Published: 12/31/1994
Authors: Jin S. Kim, David G Seiler, Luigi Colombo
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=21841

9. Characterization of Liquid-Phase Epitaxially Grown HgCdTe Films by Magnetoresistance Measurements
Published: 9/1/1995
Authors: Jin S. Kim, David G Seiler, Luigi Colombo, M. C. Chen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27811

10. Characterization of Two-Dimensional Dopant Profiles: Status and Review
Published: 12/31/1995
Authors: Alain C. Diebold, M. Kump, Joseph J Kopanski, David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=24280