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You searched on: Author: david seiler Sorted by: title

Displaying records 1 to 10 of 75 records.
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1. Advanced Experimental Methods for Low-Temperature Magnetotransport Measurement of Novel Materials
Published: 1/21/2016
Authors: Joseph A Hagmann, Son Truong Le, Curt A Richter, David G Seiler
Abstract: Novel electronic materials are often produced for the first time by synthesis processes that yield bulk crystals (in contrast to single crystal thin film synthesis) for the purpose of exploratory materials research. Certain materials pose a chall ...

2. Bound Hole Excitations in p-Hg^d0.76^Cd^d0.24^Te
Published: 12/31/1990
Authors: Chris L. Littler, M. R. Loloee, W. Zawadzki, David G Seiler

3. Business and Manufacturing Motivations for the Development of Analytical Technology and Metrology for Semiconductors
Published: 12/31/1995
Authors: Thomas J. Shaffner, Alain C. Diebold, R. C. McDonald, David G Seiler, W M Bullis

4. Challenges of Metrology and Characterization Measurements for ULSI Technology
Published: 1/1/2001
Authors: David G Seiler, Thomas J. Shaffner

5. Characterization and Metrology for ULSI Technology
Published: 11/1/1998
Authors: David G Seiler, Alain C. Diebold, W M Bullis, Thomas J. Shaffner, R. C. McDonald, E. J. Walters

6. Characterization and Metrology for ULSI Technology: 2000
Published: 2/1/2001
Authors: David G Seiler, Alain C. Diebold, Thomas J. Shaffner, R. C. McDonald, W M Bullis, P. J. Smith, Erik M Secula

7. Characterization and Metrology for ULSI Technology: 2003
Published: 9/30/2003
Authors: David G Seiler, Alain C. Diebold, Thomas J. Shaffner, Robert McDonald, Stefan Zollner, Rajinder P. Khosla, Erik M Secula

8. Characterization and Metrology for ULSI Technology: 2005
Published: 9/28/2005
Authors: David G Seiler, Alain C. Diebold, Robert McDonald, Caroline Ayre, Rajinder P. Khosla, Stefan Zollner, Erik M Secula

9. Characterization of LPE HgCdTe Films by Magnetoresistance
Published: 12/31/1994
Authors: Jin Soon Kim, David G Seiler, Luigi Colombo

10. Characterization of Liquid-Phase Epitaxially Grown HgCdTe Films by Magnetoresistance Measurements
Published: 9/1/1995
Authors: Jin Soon Kim, David G Seiler, Luigi Colombo, M. C. Chen

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  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
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  • SP 700-XX: Industrial Measurement Series
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  • SP 823-XX: Integrated Services Digital Network Series