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You searched on: Author: david seiler Sorted by: date

Displaying records 1 to 10 of 75 records.
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1. Advanced Experimental Methods for Low-Temperature Magnetotransport Measurement of Novel Materials
Published: 1/21/2016
Authors: Joseph A Hagmann, Son Truong Le, Curt A Richter, David G Seiler
Abstract: Novel electronic materials are often produced for the first time by synthesis processes that yield bulk crystals (in contrast to single crystal thin film synthesis) for the purpose of exploratory materials research. Certain materials pose a chall ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918445

2. Frontiers of Characterization and Metrology for Nanoelectronics: 2015
Published: 4/14/2015
Authors: Erik M Secula, David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918591

3. The MEMS 5-in-1 Test Chips (Reference Materials 8096 and 8097)
Published: 3/27/2013
Authors: Janet M Cassard, Jon C Geist, Craig Dyer McGray, Richard A Allen, Muhammad Yaqub Afridi, Brian Joseph Nablo, Michael Gaitan, David G Seiler
Abstract: This paper presents an overview of the Microelectromechanical Systems (MEMS) 5-in-1 Reference Material (RM), which is a single test chip with test structures from which material and dimensional properties are obtained using five documentary standard ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912229

4. Frontiers of Characterization and Metrology for Nanoelectronics: 2013
Published: 3/26/2013
Authors: Erik M Secula, David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913713

5. User's Guide for RM 8096 and 8097: The MEMS 5-in-1, 2013 Edition
Series: Special Publication (NIST SP)
Report Number: 260-177
Published: 2/15/2013
Authors: Janet M Cassard, Jon C Geist, Theodore Vincent Vorburger, David Thomas Read, Michael Gaitan, David G Seiler
Abstract: The Microelectromechanical Systems (MEMS) 5-in-1 is a reference device sold as a NIST Reference Material (RM) that contains MEMS test structures on a test chip. The two RM chips (8096 and 8097) provide for both dimensional and material property ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910746

6. The MEMS 5-in-1 Reference Materials (RM 8096 and 8097)
Published: 3/21/2012
Authors: Janet M Cassard, Jon C Geist, Michael Gaitan, David G Seiler
Abstract: The MEMS 5-in-1 Reference Material (RM) contains test structures for five standard test methods on one test chip, so companies can compare their in-house measurements taken on the RM with NIST measurements, thereby validating their use of the documen ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910317

7. Frontiers of Characterization and Metrology for Nanoelectronics: 2011
Published: 12/28/2011
Authors: David G Seiler, Alain C. Diebold, Robert McDonald, Amal Chabli, Erik M Secula
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910545

8. User's Guide for SRM 2494 and 2495: The MEMS 5-in-1, 2011 Edition
Series: Special Publication (NIST SP)
Report Number: 260-179
Published: 9/6/2011
Authors: Janet M Cassard, Jon C Geist, Theodore Vincent Vorburger, David Thomas Read, David G Seiler
Abstract: The Microelectromechanical Systems (MEMS) 5-in-1 is a standard reference device sold as a NIST Standard Reference Material (SRM) that contains MEMS test structures on a test chip. The two SRM chips (2494 and 2495) provide for both dimensional an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909186

9. Physics Careers in Government Agencies
Published: 3/14/2010
Author: David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905142

10. Optical Properties of Semiconductors
Published: 10/19/2009
Authors: David G Seiler, Stefan Zollner, Alain C. Diebold, Paul Amirtharaj
Abstract: Rapid advances in semiconductor manufacturing and associated technologies have increased the need for optical characterization techniques for materials analysis and in-situ monitoring/control applications. Optical measurements have many unique and at ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33124



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