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You searched on: Author: david seiler

Displaying records 31 to 40 of 74 records.
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31. Semiconductor Characterization: Present Status and Future Needs
Published: 1/3/1996
Authors: W M Bullis, David G Seiler, A C Diebold

32. Business and Manufacturing Motivations for the Development of Analytical Technology and Metrology for Semiconductors
Published: 12/31/1995
Authors: Thomas J. Shaffner, Alain C. Diebold, R. C. McDonald, David G Seiler, W M Bullis

33. Characterization of Two-Dimensional Dopant Profiles: Status and Review
Published: 12/31/1995
Authors: Alain C. Diebold, M. Kump, Joseph J Kopanski, David G Seiler

34. Electrical Characterization of Narrow Gap n-type Bulk HgCdTe Single Crystals by Variable-Magnetic-Field Hall Measurements and Reduced-Conductivity-Tensor Analyses
Published: 12/31/1995
Authors: Jin Soon Kim, David G Seiler, R. A. Lancaster, M. B. Reine

35. Mesoscopic Conductance Fluctuations in Large Devices
Published: 12/31/1995
Authors: Curt A Richter, David G Seiler, Joseph G. Pellegrino

36. Novel Magnetic Field Characterization Techniques for Compound Semiconductor Materials and Devices
Published: 12/31/1995
Authors: Curt A Richter, David G Seiler, Joseph G. Pellegrino, W. F. Tseng, W. Robert Thurber

37. Optical Characterization of Materials and Devices for the Semiconductor Industry: Trends and Needs
Published: 12/31/1995
Authors: S. Perkowitz, David G Seiler, W M Bullis

38. Semiconductor Measurement Technology: Survey of Optical Characterization Methods for Materials, Processing, and Manufacturing in the Semiconductor Industry
Series: Special Publication (NIST SP)
Published: 12/1/1995
Authors: W M Bullis, S. Perkowitz, David G Seiler

39. International Workshop on Semiconductor Characterization: Present Status and Future Needs
Series: Journal of Research (NIST JRES)
Published: 11/1/1995
Authors: David G Seiler, Thomas J. Shaffner

40. Characterization of Liquid-Phase Epitaxially Grown HgCdTe Films by Magnetoresistance Measurements
Published: 9/1/1995
Authors: Jin Soon Kim, David G Seiler, Luigi Colombo, M. C. Chen

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Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series