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Author: erik secula
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Displaying records 1 to 10 of 17 records.
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1. Frontiers of Characterization and Metrology for Nanoelectronics: 2013
Published: 3/26/2013
Authors: Erik M Secula, David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913713

2. Frontiers of Characterization and Metrology for Nanoelectronics: 2011
Published: 12/28/2011
Authors: David G Seiler, Alain C. Diebold, Robert McDonald, Amal Chabli, Erik M Secula
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910545

3. Frontiers of Characterization and Metrology for Nanoelectronics: 2009
Published: 10/5/2009
Authors: David G Seiler, Alain C. Diebold, Robert McDonald, C. Michael Garner, Dan Herr, Rajinder P. Khosla, Erik M Secula
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904357

4. EEEL Technical Accomplishments
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7568
Published: 3/30/2009
Author: Erik M Secula
Abstract: This document describes the technical work of the Electronics and Electrical Engineering Laboratory. In this report, you will find that EEEL researchers are developing the world's most advanced sensors, providing advanced gamma ray imagers for astro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901701

5. Frontiers of Characterization and Metrology for Nanoelectronics: 2007
Published: 9/30/2007
Authors: David G Seiler, Alain C. Diebold, Robert McDonald, C M Garner, Dan Herr, Rajinder P. Khosla, Erik M Secula
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32757

6. Semiconductor Electronics Division: Programs, Activities, and Accomplishments
Series: NIST Interagency/Internal Report (NISTIR)
Published: 1/10/2007
Author: Erik M Secula
Abstract: This document represents the fiscal year 2006 production of the programs comprising the Semiconductor Electronics Division. Program goals, customer needs, technical strategies, accomplishments, and deliverables are all presented. Division-wide highli ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32509

7. Characterization and Metrology for ULSI Technology: 2005
Published: 9/28/2005
Authors: David G Seiler, Alain C. Diebold, Robert McDonald, Caroline Ayre, Rajinder P. Khosla, Stefan Zollner, Erik M Secula
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32093

8. Semiconductor Electronics Division: Programs, Activities, and Accomplishments
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7181
Published: 1/1/2005
Author: Erik M Secula
Abstract: This document represents the fiscal year 2004 production of the programs comprising the Semiconductor Electronics Division. Program goals, customer needs, technical strategies, accomplishments, and deliverables are all presented. Division-wide highli ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31835

9. Round Robin for Standardization of MEMS Length and Strain Measurements
Published: 7/12/2004
Authors: Janet M Cassard, Erik M Secula, J Huang
Abstract: A microelectromechanical systems (MEMS) Length and Strain Round Robin is underway to compare results of in-plane length measurements, residual strain measurements, and strain gradient measurements at a number of laboratories. The goal of this round r ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31687

10. Characterization and Metrology for ULSI Technology: 2003
Published: 9/30/2003
Authors: David G Seiler, Alain C. Diebold, Thomas J. Shaffner, Robert McDonald, Stefan Zollner, Rajinder P. Khosla, Erik M Secula
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31463



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