NIST logo

Publications Portal

You searched on:
Author: keana scott

Displaying records 11 to 13.
Resort by: Date / Title


11. 3D Imaging of Diatoms with Ion-abrasion Scanning Electron Microscopy
Published: 6/9/2009
Authors: Keana C K Scott, Mark Hildebrand, Sang Kim, Dan Shi, Sriram Subramaniam
Abstract: Ion-abrasion scanning electron microscopy (IASEM) takes advantage of focused ion beams to abrade thin sections from the surface of bulk specimens, coupled with SEM to image the surface of each section, enabling 3D reconstructions of subcellular archi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901169

12. Analysis of 3D elemental mapping artifacts in biological specimens using Monte Carlo simulation
Report Number: 832267
Published: 1/29/2009
Authors: Keana C K Scott, Nicholas W m Ritchie
Abstract: In this paper, we present the Monte Carlo simulation results demonstrating the feasibility of the focused ion beam based X-ray microanalysis technique (FIB-EDS) for the 3D elemental analysis of biological samples. We used a marine diatom Thalassiosi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=832267

13. Widefield Light Microscopy Method for High Resolution and Quantum Dot Spectral Studies
Published: 1/1/2007
Authors: Cynthia J Zeissler, Keana C K Scott, Richard D Holbrook, Peter E. Dr. Barker, Yan Xiao
Abstract: We are exploring methods to achieve 3D 200 nm resolution multispectral imaging with an ordinary inexpensive widefield microscope using incoherent white light sources and an electronically tunable filter. In this work, the capabilities were applied to ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902125



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series