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Author: craig schlenoff
Displaying records 91 to 100 of 102 records.
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91.
Second Process Specification Language (PSL) Roundtable
Series: Journal of Research (NIST JRES)
Published: 4/1/1999
Author: Craig I Schlenoff
Abstract: This report describes the Second Process Specification Language (PSL) Roundtable that was held at the University of Maryland, University College on January 13-14, 1999. The Roundtable brought together vendors, endusers, and researchers from different
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821492
92.
An Analysis of Existing Ontological Systems for Applications in Manufacturing and Healthcare
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6301
Published: 1/1/1999
Authors: Craig I Schlenoff, Robert W Ivester, Don E Libes, Peter O Denno, Simon Szykman
Abstract: The objective of the work described in this paper is to move closer to the ultimate goal of seamless system integration using the principle behind ontological engineering to unambiguously define domain-specific concepts. Current integration efforts a
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821496
93.
Process Specification Language (PSL): Results of the First Pilot Implementation
Published: 1/1/1999
Authors: Craig I Schlenoff, Michael Gruninger, Mihai Ciocoiu, Don E Libes
Abstract: In all types of communication, the ability to share information is often hindered because the meanig of information can be drastically affected by the context in which it is viewed and interpreted. This is especially true in manufacturi
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821501
94.
NIST Workshop on Process Information Technology: From Research to Industry
Series: Journal of Research (NIST JRES)
Published: 10/1/1998
Authors: Howard T Moncarz, Craig I Schlenoff, Michael Gruninger, M R Duffey, Amy Knutilla
Abstract: The primary objective of the workshop was to provide an open forum for researchers and industry representatives to discuss how current and future research efforts could further address the PIT needs of industry. Specific workshop goals were: To iden
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822128
95.
A Robust Ontology for Manufacturing Systems Integration
Published: 8/1/1998
Authors: Amy Knutilla, Craig I Schlenoff, Robert W Ivester
Abstract: In all types of communication, the ability to share information is often hindered because the meaning of information can be drastically affected by the context in which it is viewed and interpreted. This is especially true in manufacturing because o
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821235
96.
An Analysis of Requirements for Specifying Manufacturing Engineering and Business Processes
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6364
Published: 8/1/1998
Authors: Amy Knutilla, Craig I Schlenoff, Steven R. Ray
Abstract: A wide range of manufacturing software applications deal with the manipulation and expression of collections of activities. Examples include manufacturing process planning, production scheduling, simulation, project management, workflow managem
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821236
97.
Process Specification Language: An Analysis of Existing Representations
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6160
Published: 5/1/1998
Authors: Amy Knutilla, Craig I Schlenoff, Steven R. Ray, Stephen T Polyak, Austin Tate, S C Cheah, Richard C Anderson
Abstract: The goal of the National Institute of Standards and Technology (NIST) Process Specification Language (PSL) project is to investigate and arrive at a neutral, unifying representation of process information to enable sharing of process data among manuf
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821237
98.
Requirements for Modeling Manufacturing Process: A New Perspective
Published: 9/1/1997
Authors: Craig I Schlenoff, Amy Knutilla, Steven R. Ray
Abstract: A wide range of applications deal with the manipulation and expression of collections of activities. Each of these applications serves a specific audience and need, and focuses on particular aspects of a process. Nevertheless, much could be gain
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821497
99.
Using Process Requirements as the Basis for the Creation and Evaluation of Process Ontologies for Enterprise Modeling
Published: 9/1/1997
Authors: Michael Gruninger, Craig I Schlenoff, Amy Knutilla, Steven R. Ray
Abstract: This paper addresses the issue of process ontology integration using a complete set of process information requirements as its basis. The goals of the paper are: (1)to give an overview of the requirements necessary to represent manufacturing proces
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821369
100.
Proceedings of the First Process Specification Language (PSL) Roundtable
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6081
Published: 1/1/1997
Authors: Craig I Schlenoff, Amy Knutilla, Steven R. Ray
Abstract: On April, 1997, the Process Specification Language (PSL) Project held a Roundtable discussion at the National Institute of Standards and Technology (NIST). The goal of the Roundtable was to assemble key champions and stakeholders of various represen
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821498