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Author: daniel sawyer
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Displaying records 1 to 10 of 26 records.
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1. A Constrained Monte Carlo Simulation Method for the Calculation of CMM Measurement Uncertainty
Published: 1/1/1999
Authors: Steven David Phillips, Bruce R. Borchardt, Daniel S Sawyer, William Tyler Estler, K Eberhardt, M Levenson, Marjorie A McClain, Ted Hopp
Abstract: We describe a Monte Carlo simulation technique where known information about a metrology system is employed as a constraint to distinguish the errors associated with the instrument under consideration from the set of all possible instrument errors. T ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820941

2. A Laser Tracker Calibration System
Published: 1/1/2002
Authors: Daniel S Sawyer, Bruce R. Borchardt, Steven David Phillips, Charles Fronczek, William Tyler Estler
Abstract: We describe a laser tracker calibration system developed for frameless coordinate metrology systems. The system employs a laser rail to provide an 'in situ' calibrated length standard that is used to test a tracker in several different configurations ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821749

3. A Low Cost Fiducial Reference for Computed Tomography
Published: 11/11/2008
Authors: Zachary H Levine, Steven E Grantham, Daniel S Sawyer, Anthony P Reeves, David F Yankelevitz
Abstract: Rationale and Objectives. To detect the growth in lesions, it is necessary to ensure that the apparent changes in size are above the noise floor of the system. By introducing a fiducial reference, it may be possible to detect smaller changes in le ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842437

4. A Model for Geometry-Dependent Errors in Length Artifacts
Series: Journal of Research (NIST JRES)
Report Number: 117.013
Published: 9/27/2012
Authors: Daniel S Sawyer, Brian Parry, Christopher J Blackburn, Balasubramanian Muralikrishnan, Steven David Phillips
Abstract: We present a detailed model of dimensional changes in long length artifacts, such as step gauges and ball bars, due to bending under gravity. The comprehensive model is based on evaluation of the gauge points relative to the neutral bending surf ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910861

5. A Novel Artifact for Testing Large Coordinate Measuring Machines
Published: 1/1/2000
Authors: Steven David Phillips, Daniel S Sawyer, Bruce R. Borchardt, David E Ward, D E Beutel
Abstract: We present a high accuracy artifact useful for the evaluation of large CMMs. This artifact can be physically probed by the CMM in contrast to conventional techniques that use purely optical methods such as laser interferometers. The system can be use ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820971

6. A Novel Artifact for Testing Large Coordinate Measuring Machines
Published: 1/1/2001
Authors: Steven David Phillips, Daniel S Sawyer, Bruce R. Borchardt, D E Ward, D E Beutel
Abstract: We present a high accuracy artifact useful for the evaluation of large CMMs. This artifact can be physically probed by the CMM in contrast to conventional techniques that use purely optical methods such as laser interferometers. The system can be use ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824606

7. A Novel CMM Interim Testing Artifact
Published: 1/1/1994
Authors: Steven David Phillips, Bruce R. Borchardt, Gregory W Caskey, David E Ward, Bryon S. Faust, Daniel S Sawyer
Abstract: NIST is currently developing equipment and techniques to rapidly access the performance of Coordinate Measuring machines (CMMs). This will allow the frequent testing of CMMs to insure that they measure parts accurately. A novel interim testing artifa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820700

8. A Users' Guide to NIST SRM 2084: CMM Probe Performance Standards
Published: 6/1/1994
Authors: Gregory W Caskey, Steven David Phillips, Bruce R. Borchardt, David E Ward, Daniel S Sawyer
Abstract: Standard Reference Materials (SRMs) as defined by the National Institute of Standards and Technology (NIST) are well-characterized materials, produced in quantity and certified for one or more physical or chemical properties. They are used to assure ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820674

9. ASME B89.4.19 Performance Evaluation Tests and Geometric Misalignments in Laser Trackers
Published: 1/30/2009
Authors: Balasubramanian Muralikrishnan, Daniel S Sawyer, Christopher J Blackburn, Steven David Phillips, Bruce R. Borchardt, William Tyler Estler
Abstract: Small and unintended offsets, tilts, and eccentricity of the mechanical and optical components in laser trackers introduce systematic errors in the measured spherical coordinates (angles and range readings), and possibly in the calculated lengths of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824664

10. Assessing Ranging Errors as a Function of Azimuth in Laser Trackers and Tracers
Published: 4/18/2013
Authors: Balasubramanian Muralikrishnan, Vincent D Lee, Christopher J Blackburn, Daniel S Sawyer, Steven David Phillips, Wei Ren, Ben Hughes
Abstract: Tilt and radial error motion of a laser tracker head as it spins about the two axes results in small but measurable ranging and angle errors. The laser tracer, on the other hand, measures range with respect to the center of a high quality stationary ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913026



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